BSL214N OptiMOSTM2 Small-Signal-Transistor Product Summary Features VDS * Dual N-channel RDS(on),max * Enhancement mode * Super Logic level (2.5V rated) 20 V VGS=4.5 V 140 mW VGS=2.5 V 250 ID 1.5 A * Avalanche rated * Qualified according to AEC Q101 PG-TSOP6 * 100% lead-free; RoHS compliant 6 * Halogen free according to IEC61249-2-21 1 5 4 2 3 Type Package Tape and Reel Information Marking Lead Free Packing BSL214N TSOP6 H6327: 3000 pcs/ reel sPM Yes Non dry Maximum ratings, at T j=25 C, unless otherwise specified Parameter 1) Symbol Conditions Continuous drain current ID Value T A=25 C 1.5 T A=70 C 1.2 6 Pulsed drain current I D,pulse T A=25 C Avalanche energy, single pulse E AS I D=1.5A, R GS=25 W 3.7 Reverse diode dv /dt dv /dt I D=1.5 A, V DS=16 V, di /dt =200 A/s, T j,max=150 C 6 Gate source voltage V GS Power dissipation P tot Operating and storage temperature T j, T stg ESD Class T A=25 C JESD22-A114 -HBM Soldering Temperature A mJ kV/s 12 V 0.5 W -55 ... 150 C 0 (<250V) 260 C IEC climatic category; DIN IEC 68-1 1) Unit 55/150/56 Remark: one of both transistors in operation Rev 2.3 page 1 2013-11-06 BSL214N Parameter Values Symbol Conditions Unit min. typ. max. - - 250 Thermal characteristics Thermal resistance, junction - ambient R thJA minimal footprint 2) K/W Electrical characteristics, at T j=25 C, unless otherwise specified Static characteristics Drain-source breakdown voltage V (BR)DSS V GS= 0 V, I D= 250 A 20 - - Gate threshold voltage V GS(th) V DS=VGS, I D=3.7 A 0.7 0.95 1.2 Drain-source leakage current I DSS V DS=20 V, V GS=0 V, T j=25 C - - 1 V DS=20 V, V GS=0 V, T j=150 C - - 100 V mA Gate-source leakage current I GSS V GS=12 V, V DS=0 V - - 100 nA Drain-source on-state resistance R DS(on) V GS=2.5 V, I D=0.7 A - 173 250 mW V GS=4.5 V, I D=1.5 A - 108 140 4 - Transconductance g fs |V DS|>2|I D|R DS(on)max, I D=1.2 A S 2) Performed on 40mm2 FR4 PCB. The traces are 1mm wide, 70m thick and 20mm long; they are present on both both sides of the PCB. Rev 2.3 page 2 2013-11-06 BSL214N Parameter Values Symbol Conditions Unit min. typ. max. - 107 143 - 46 62 Dynamic characteristics Input capacitance C iss Output capacitance C oss Reverse transfer capacitance Crss - 6 9 Turn-on delay time t d(on) - 4.1 - Rise time tr - 7.6 - Turn-off delay time t d(off) - 6.8 - Fall time tf - 1.4 - Gate to source charge Q gs - 0.24 - Gate to drain charge Q gd - 0.2 - Gate charge total Qg - 0.8 - Gate plateau voltage V plateau - 2.2 - V - - 0.5 A - - 6 - 0.8 1.1 V - 8.4 - ns - 1.7 - nC V GS=0 V, V DS=10 V, f =1 MHz V DD=10 V, V GS=4.5 V, I D=1.5 A, R G,ext=6 W pF ns Gate Charge Characteristics V DD=10 V, I D=1.5 A, V GS=0 to 5 V nC Reverse Diode Diode continous forward current IS Diode pulse current I S,pulse Diode forward voltage V SD Reverse recovery time t rr Reverse recovery charge Q rr Rev 2.3 T A=25 C V GS=0 V, I F=1.5 A, T j=25 C V R=10 V, I F=1.5 A, di F/dt =100 A/s page 3 2013-11-06 BSL214N 1 Power dissipation 2 Drain current P tot=f(T A) I D=f(T A); V GS4.5 V 0.5 1.5 0.375 ID [A] Ptot [W] 1 0.25 0.5 0.125 0 0 0 40 80 120 0 20 40 TA [C] 60 80 100 120 140 TA [C] 3 Safe operating area 4 Max. transient thermal impedance I D=f(V DS); T A=25 C; D =0 Z thJA=f(t p) parameter: t p parameter: D =t p/T 101 103 1 s 10 s 100 s 1 ms 0.5 10 ms 100 102 0.2 ZthJA [K/W] ID [A] 0.1 10-1 DC 0.05 0.02 101 0.01 single pulse 10-2 100 10-3 10-1 10-2 10-1 100 101 102 VDS [V] Rev 2.3 10-5 10-4 10-3 10-2 10-1 100 101 102 tp [s] page 4 2013-11-06 BSL214N 5 Typ. output characteristics 6 Typ. drain-source on resistance I D=f(V DS); T j=25 C R DS(on)=f(I D); T j=25 C parameter: V GS parameter: V GS 8 280 2.5 V 3.5 V 2.2 V 240 4.5 V 3V 3V 6 RDS(on) [mW] ID [A] 200 4 160 3.5 V 120 4.5 V 2.5 V 6V 80 2 2.3 V 40 2V 1.8 V 0 0 0 1 2 3 0 2 VDS [V] 4 6 8 ID [A] 7 Typ. transfer characteristics 8 Typ. forward transconductance I D=f(V GS); |V DS|>2|I D|R DS(on)max g fs=f(I D); T j=25 C 1.5 10 8 1 ID [A] gfs [S] 6 25 C 4 0.5 150 C 2 0 0 0 1 2 3 VGS [V] Rev 2.3 0 2 4 6 8 ID [A] page 5 2013-11-06 BSL214N 9 Drain-source on-state resistance 10 Typ. gate threshold voltage R DS(on)=f(T j); I D=1.5 A; V GS=4.5 V V GS(th)=f(T j); V DS=VGS; I D=3.7 A parameter: I D 240 1.6 200 1.2 98 % VGS(th) [V] RDS(on) [mW] 160 98 % 120 typ typ 0.8 2% 80 0.4 40 0 0 -60 -20 20 60 100 140 -60 -20 20 Tj [C] 60 100 140 Tj [C] 11 Typ. capacitances 12 Forward characteristics of reverse diode C =f(V DS); V GS=0 V; f =1 MHz; Tj=25C I F=f(V SD) parameter: T j 103 101 25 C 100 Ciss 102 IF [A] C [pF] Coss 10-1 150 C 101 150 C, 98% Crss 10-2 25 C, 98% 100 10-3 0 5 10 15 20 VDS [V] Rev 2.3 0 0.4 0.8 1.2 1.6 VSD [V] page 6 2013-11-06 BSL214N 13 Avalanche characteristics 14 Typ. gate charge I AS=f(t AV); R GS=25 W V GS=f(Q gate); I D=1.5 A pulsed parameter: T j(start) parameter: V DD 101 6 5 4V 10 V 16 V VGS [V] IAV [A] 4 25 C 100 100 C 125 C 3 2 1 10-1 0 100 101 102 0 103 0.25 tAV [s] 0.5 0.75 1 Qgate [nC] 15 Drain-source breakdown voltage 16 Gate charge waveforms V BR(DSS)=f(T j); I D=250 A 25 V GS 24 Qg 23 VBR(DSS) [V] 22 21 20 V gs(th) 19 18 Q g(th) 17 Q sw Q gs 16 -60 -20 20 60 100 Q gate Q gd 140 Tj [C] Rev 2.3 page 7 2013-11-06 BSL214N Package Outline: TSOP6 Footprint: Packaging: Dimensions in mm Rev 2.3 page 8 2013-11-06 BSL214N Published by Infineon Technologies AG 81726 Munich, Germany (c) 2008 Infineon Technologies AG All Rights Reserved. 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Infineon Technologies components may be used in life-support devices or systems only with the express written approval of Infineon Technologies, if a failure of such components can reasonably be expected to cause the failure of that life-support device or system or to affect the safety or effectiveness of that device or system. Life support devices or systems are intended to be implanted in the human body or to support and/or maintain and sustain and/or protect human life. If they fail, it is reasonable to assume that the health of the user or other persons may be endangered. Rev 2.3 page 9 2013-11-06