DATA SH EET
Product data sheet
Supersedes data of 1999 Apr 22 2002 May 28
DISCRETE SEMICONDUCTORS
BAT254
Schottky barrier diode
db
ook, halfpage
M3D154
2002 May 28 2
NXP Semiconductors Product data sheet
Schottky barrier diode BAT254
FEATURES
Low forward vo lta ge
Guard ring protected
Very small ceramic SMD package.
APPLICATIONS
Ultra high-speed switching
Voltage clamping
Protection circuits
Blocking diodes.
DESCRIPTION
Planar Schottky barrier diode encapsulated in a SOD 110 very small ceramic
SMD package.
handbook, 4 columns
MAM214
ka
cathode mark
top viewside viewbottom view
ak
Fig.1 Simplified outline (SOD110) and symbol.
Marking code: L4.
LIMITING VALUES
In accordance with the A bsolute Maxi mum Rating Sys tem (IEC 60134).
SYMBOL PARAMETER CONDITIONS MIN. MAX. UNIT
VRcontinuous revers e voltage 30 V
IFcontinuous forward current 200 mA
IFRM repetitive peak forward current tp 1 s; δ 0.5 300 mA
IFSM non-repetitive peak forward current tp < 10 ms 600 mA
Tstg storage temperatur e 65 +150 °C
Tjjunction temperature 125 °C
Tamb operating ambient temperature 65 +125 °C
2002 May 28 3
NXP Semiconductors Pr oduct dat a shee t
Schottky barrier diode BAT254
ELECTRICAL CHARACTERISTIC S
Tamb = 25 °C unless otherwise specified.
Note
1. Pulse test: tp = 300 μs; δ = 0.02.
THERMAL CHARACTE RISTICS
Note
1. Refer to SOD110 standard mounting conditions.
SYMBOL PARAMETER CONDITIONS MAX. UNIT
VFforward voltage see Fig.2
IF = 0.1 mA 240 mV
IF = 1 mA 320 mV
IF = 10 mA 400 mV
IF = 30 mA 500 mV
IF = 100 mA 800 mV
IRreverse current VR = 25 V ; note 1; see Fig.3 2μA
trr reverse recove ry time when switched from IF = 10 mA to
IR = 10 mA; RL = 100 Ω; measured at
IR = 1 mA; see Fig.5
5ns
Cddiode capacit an ce f = 1 MHz; VR = 1 V; see Fig.4 10 pF
SYMBOL PARAMETER CONDITIONS VALUE UNIT
Rth j-a thermal resistance from junction to
ambient note 1 315 K/W
2002 May 28 4
NXP Semiconductors Pr oduct dat a shee t
Schottky barrier diode BAT254
GRAPHICAL DATA
handbook, halfpage
10
IF
VF (V)
3
10
(mA)
2
10
1
10
1
1.20.80.40
MSA892
(3)(2)(1)
(3)(2)(1)
(1) Tamb = 125 °C.
(2) Tamb = 85 °C.
(3) Tamb = 25 °C.
Fig.2 Forward current as a function of forward
voltage; typical values.
0102030
V (V)
R
10
3
IR
(μA)
10
2
10
1
10
1
(1)
(2)
(3)
MSA893
(1) Tamb = 125 °C.
(2) Tamb = 85 °C.
(3) Tamb = 25 °C.
Fig.3 Reverse current as a function of rev erse
voltage; typical values.
h
andbook, halfpage
0102030
0
5
10
15
VR (V)
Cd
(pF)
MSA891
f = 1 MHz; Tamb = 25 °C.
Fig.4 Diode capacitance as a function of reverse
voltage; typical values. Fig.5 Reverse recovery definitions.
ha
ndbook, halfpage
90%
10%
tf
Q
dI
dt
t
IF
IRMRC129 - 1
F
r
2002 May 28 5
NXP Semiconductors Pr oduct data sheet
Schottky barrier diode BAT254
PACKAGE OUTLINE
UNIT A
max.
REFERENCES
OUTLINE
VERSION EUROPEAN
PROJECTION ISSUE DATE
IEC JEDEC EIAJ
mm 1.6
D
2.10
1.90
y
0.1
E
1.40
1.10
DIMENSIONS (mm are the original dimensions)
SOD110 97-04-14
Very small ceramic rectangular surface mounted package SOD110
cathode
identifier
A
21
D
y
E
0 0.5 1 mm
scale
2002 May 28 6
NXP Semiconductors Pr oduct data sheet
Schottky barrier diode BAT254
DATA SHEET STATUS
Notes
1. Please consult the most recently issued document before initiating or completing a design.
2. The product s ta tus of device(s) described in this document may have changed since this docu ment was published
and may differ in case of multiple devices. The latest product status information is available on the Internet at
URL http://www.nxp.com.
DOCUMENT
STATUS(1) PRODUCT
STATUS(2) DEFINITION
Objective data sheet Development This document contains data from the objective specification for pro duct
development.
Preliminary data sheet Qualification This document contains data from the preliminary specification.
Product data sheet Production T his document contains the product specification.
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Applications Applications that are described herein for
any of these products are for illustrative purposes only.
NXP Semiconductors makes no representation or
warranty that such applications will be suitable for the
specified use witho ut fu rth e r testing or modification.
Limiting values Stress above one or more limiting
values (as defined in the Absolute Maximum Ratings
System of IEC 60134) may cause permanent damage to
the device. Limiting values are stress ratin gs only and
operation of the device at these or any other conditions
above those given in the Characteristics sections of this
document is not implied. Exposure to limiting values for
extended periods may affect device reliability.
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Quick refer ence data The Quick reference data is an
extract of th e product data given in the Limiting values and
Characteristics sections of this document, and as such is
not complete, exhaus tive or legally binding.
NXP Semiconductors
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© NXP B.V. 2009
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Customer notification
This data sheet was changed to reflect the new company name NXP Semicon ductors. No change s were
made to the content, except for the legal definitions and disclaimer s.
Printed in The Netherlands 613514/03/pp7 Date of release: 2002 May 28 Document orde r number: 9397 750 09733