CY7C1386D
CY7C1387D
18-Mbit (512 K × 36/1 M × 18) Pipelined
DCD Sync SRAM
Cypress Semiconductor Corporation • 198 Champion Court • San Jose,CA 95134-1709 • 408-943-2600
Document Number: 38-05545 Rev. *M Revised October 8, 2013
18-Mbit (512 K × 36/1 M × 18) Pipelined DCD Sync SRAM
Features
■Supports bus operation up to 200 MHz
■Available speed grades are 200, and 167 MHz
■Registered inputs and outputs for pipelined operation
■Optimal for performance (double-cycle deselect)
■Depth expansion without wait state
■3.3 V core power supply (VDD)
■2.5 V or 3.3 V I/O power supply (VDDQ)
■Fast clock-to-output times
❐3 ns (for 200 MHz device)
■Provides high performance 3-1-1-1 access rate
■User selectable burst counter supporting IntelPentium
Interleaved or linear burst sequences
■Separate processor and controller address strobes
■Synchronous self-timed writes
■Asynchronous output enable
■CY7C1386D available in JEDEC-standard Pb-free 100-pin
TQFP. CY7C1387D available in JEDEC-standard Pb-free
100-pin TQFP and non Pb-free 165-ball BGA package
■IEEE 1149.1 JTAG-compatible boundary scan
■ZZ sleep mode option
Functional Description
The CY7C1386D/CY7C1387D SRAM integrates
512 K × 36/1 M × 18 SRAM cells with advanced synchronous
peripheral circuitry and a two-bit counter for internal burst
operation. All synchronous inputs are gated by registers
controlled by a positive edge triggered clock input (CLK). The
synchronous inputs include all addresses, all data inputs,
address-pipelining chip enable (CE1), depth expansion chip
enables (CE2 and CE3), burst control inputs (ADSC, ADSP, and
ADV), write enables (BWX, and BWE), and global write (GW).
Asynchronous inputs include the output enable (OE) and the ZZ
pin.
Addresses and chip enables are registered at rising edge of
clock when either add ress strobe p rocessor (ADSP ) or address
strobe controller (ADSC) are active. Subsequent burst
addresses can be internally generated as controlled by the
advance pin (ADV).
Address, data inputs, and write controls are registered on-chip
to initiate a self timed write cycle.This part supports byte write
operations (see Pin Configurations on page 5 and T ruth T able on
page 11 for further details). Write cycles can be one to four bytes
wide as controlled by the byte write control inputs. GW active
LOW causes all bytes to be wri tten. This device incorporates an
additional pipelined en able register which delays turning off the
output buffers an additional cycle when a deselect is
executed.This feature allows depth expansion without penalizing
system performance.
The CY7C1386D/CY7C1387D operates from a +3.3 V core
power supply while all outp uts operate with a +3.3 V or +2.5 V
supply. All inputs and outputs are JEDEC-standard and
JESD8-5-compatible.
Selection Guide
Description 200 MHz 167 MHz Unit
Maximum access time 3.0 3.4 ns
Maximum operating current 300 275 mA
Maximum CMOS standby current 70 70 mA
Errata: For information on silicon errata, see “Errata” on page 32. Details include trigger conditions, devices af fected, and proposed wor ka r ound.
CY7C1386D
CY7C1387D
Document Number: 38-05545 Rev. *M Page 2 of 38
Logic Block Diagram – CY7C1386D
ADDRESS
REGISTER
ADV
CLK
BURST
COUNTER AND
LOGIC
CLR
Q1
Q0
ADSP
ADSC
MODE
BW D
BW C
BW B
BW A
BWE
GW
CE 1
CE 2
CE 3
OE
DQ D, DQP D
BYTE
WRITE REGISTER
DQ c,DQP C
BYTE
WRITE REGISTER
DQ B,DQP B
BYTE
WRITE REGISTER
DQ A, DQP A
BYTE
WRITE REGISTER
ENABLE
REGISTER PIPELINED
ENABLE
OUTPUT
REGISTERS
SENSE
AMPS
MEMORY
ARRAY OUTPUT
BUFFERS
DQ A, DQP A
BYTE
WRITE DRIVER
DQ B,DQP B
BYTE
WRITE DRIVER
DQ c,DQP C
BYTE
WRITE DRIVER
DQ D, DQP D
BYTE
WRITE DRIVER
INPUT
REGISTERS
A0,A1,A
A[1:0]
CONTROL
ZZ
E
2
DQs
DQP
A
DQP
B
DQP
C
DQP
D
CY7C1386D
CY7C1387D
Document Number: 38-05545 Rev. *M Page 3 of 38
Logic Block Diagram – CY7C1387D
ADDRESS
REGISTER
ADV
CLK
BURST
COUNTER AND
CLR
Q1
Q0
ADSC
BW
B
BW
A
CE 1
DQ B, DQP B
BYTE
WRITE REGISTER
DQ A , DQP
BYTE
WRITE REGISTER
ENABLE
REGISTER
OE
SENSE
AMPS
MEMORY
ARRAY
ADSP
2A[1:0]
MODE
CE 2
CE 3
BWE
PIPELINED
ENABLE
DQ s,
DQP A
DQP B
OUTPUT
REGISTERS
INPUT
REGISTERS
E
OUTPUT
BUFFERS
DQ B , DQP B
BYTE
DQ A, DQP
A
BYTE
SLEEP
CONTROL
A0, A1, A
CY7C1386D
CY7C1387D
Document Number: 38-05545 Rev. *M Page 4 of 38
Contents
Pin Configurations ...........................................................5
Pin Definitions ..................................................................7
Functional Overview .............. .............. .. ... .............. ... ... ...9
Single Read Accesses ...................... ... .......................9
Single Write Accesses Initiated by ADSP .......... ... ......9
Single Write Accesses Initiated by ADSC ................ ...9
Burst Sequences .........................................................9
Sleep Mode ...............................................................10
Interleaved Burst Address Table ...............................10
Linear Burst Address Table ....... ................. ...............10
ZZ Mode Electrical Characteristics ............................10
Truth Table ......................................................................11
Truth Table for Read/Write ............................................12
Truth Table for Read/Write ............................................12
IEEE 1149.1 Serial Boundary Scan (JTAG [13]) ........... 13
Disabling the JTAG Feature ......................................13
Test Access Port (TAP) .............................................13
PERFORMING A TAP RESET ..................................13
TAP REGISTERS ......................... .............. ... ............13
TAP Instruction Set ................... ................................14
TAP Controller State Diagram .......................................15
TAP Controller Block Diagram ......................................16
TAP Timing Diagram ......................................................16
TAP AC Switching Characteristics ...............................17
3.3 V TAP AC Test Conditions .......................................18
3.3 V TAP AC Output Load Equivalent .........................18
2.5 V TAP AC Test Conditions .......................................18
2.5 V TAP AC Output Load Equivalent .........................18
TAP DC Electrical Characteristics and
Operating Conditi ons ........................ .............. .............. .18
Identification Register Definitions ................................19
Scan Register Sizes .......................................................19
Identification Codes ........................ ... ... .............. ... ... .....19
Boundary Scan Order .......... ... .............. .............. ... ........20
Maximum Ratings ...........................................................21
Operating Range .............................................................21
Neutron Soft Error Immunity .........................................21
Electrical Characteristics ........... .............. ... .. .................21
Capacitance ....................................................................22
Thermal Resistance ........................................................22
AC Test Loads and Waveforms .....................................23
Switching Characteristics ..............................................24
Switching Waveforms ....................................................25
Ordering Information ......................................................29
Ordering Code Definitions .........................................29
Package Diagrams ..........................................................30
Acronyms ........................................................................ 31
Document Conventions ..................... ... ... .............. ... .....31
Units of Measure ............. ... ... .............. ... .. .............. ...31
Errata ...............................................................................32
Part Numbers Affected ..............................................32
Product Status ........... ... ... .............. ... .........................32
Ram9 Sync ZZ Pin & JTAG Issues
Errata Summary ...............................................................32
Document History Page ............. .. ............... .. .............. ...34
Sales, Solutions, and Legal Information ......................38
Worldwide Sales and Design Support .......................38
Products .................................................................... 38
PSoC® Solutions ......................................................38
Cypress Developer Community ...................... ... ........38
Technical Support .....................................................38
CY7C1386D
CY7C1387D
Document Number: 38-05545 Rev. *M Page 5 of 38
Pin Configurations Figure 1. 100-pin TQFP (14 × 20 × 1.4 mm) pinout (3 Chip Enable) [1]
A
A
A
A
A1
A0
NC/72M
NC/36M
VSS
VDD
A
A
A
A
A
A
A
A
DQPB
DQB
DQB
VDDQ
VSSQ
DQB
DQB
DQB
DQB
VSSQ
VDDQ
DQB
DQB
VSS
NC
VDD
ZZ
DQA
DQA
VDDQ
VSSQ
DQA
DQA
DQA
DQA
VSSQ
VDDQ
DQA
DQA
DQPA
DQPC
DQC
DQC
VDDQ
VSSQ
DQC
DQC
DQC
DQC
VSSQ
VDDQ
DQC
DQC
VDD
NC
VSS
DQD
DQD
VDDQ
VSSQ
DQD
DQD
DQD
DQD
VSSQ
VDDQ
DQD
DQD
DQPD
A
A
CE1
CE2
BWD
BWC
BWB
BWA
CE3
VDD
VSS
CLK
GW
BWE
OE
ADSC
ADSP
ADV
A
A
1
2
3
4
5
6
7
8
9
10
11
12
13
14
15
16
17
18
19
20
21
22
23
24
25
26
27
28
29
30
31
32
33
34
35
36
37
38
39
40
41
42
43
44
45
46
47
48
49
50
80
79
78
77
76
75
74
73
72
71
70
69
68
67
66
65
64
63
62
61
60
59
58
57
56
55
54
53
52
51
100
99
98
97
96
95
94
93
92
91
90
89
88
87
86
85
84
83
82
81
MODE
CY7C1386D
(512 K × 36)
NC
A
A
A
A
A1
A0
NC/72M
NC/36M
VSS
VDD
A
A
A
A
A
A
A
A
A
NC
NC
VDDQ
VSSQ
NC
DQPA
DQA
DQA
VSSQ
VDDQ
DQA
DQA
VSS
NC
VDD
ZZ
DQA
DQA
VDDQ
VSSQ
DQA
DQA
NC
NC
VSSQ
VDDQ
NC
NC
NC
NC
NC
NC
VDDQ
VSSQ
NC
NC
DQB
DQB
VSSQ
VDDQ
DQB
DQB
VDD
NC
VSS
DQB
DQB
VDDQ
VSSQ
DQB
DQB
DQPB
NC
VSSQ
VDDQ
NC
NC
NC
A
A
CE1
CE2
NC
NC
BWB
BWA
CE3
VDD
VSS
CLK
GW
BWE
OE
ADSC
ADSP
ADV
A
A
1
2
3
4
5
6
7
8
9
10
11
12
13
14
15
16
17
18
19
20
21
22
23
24
25
26
27
28
29
30
31
32
33
34
35
36
37
38
39
40
41
42
43
44
45
46
47
48
49
50
80
79
78
77
76
75
74
73
72
71
70
69
68
67
66
65
64
63
62
61
60
59
58
57
56
55
54
53
52
51
100
99
98
97
96
95
94
93
92
91
90
89
88
87
86
85
84
83
82
81
MODE
CY7C1387D
(1 M × 18)
NC
A
A
Note
1. Errata: The ZZ pin (Pin 64) needs to be externally connected to ground. Fo r more information, see “Errata” on page 32.
CY7C1386D
CY7C1387D
Document Number: 38-05545 Rev. *M Page 6 of 38
Figure 2. 165-ball FBGA (13 × 15 × 1.4 mm) pinout (3 Chip Enable) [2, 3]
Pin Configurations (continued)
CY7C1387D (1 M × 18)
2345671
A
B
C
D
E
F
G
H
J
K
L
M
N
P
R
TDO
NC/288M
NC/144M
NC
NC
DQPB
NC
DQB
ACE1NC CE3
BWBBWE
ACE2
NC
DQB
DQB
MODE
NC
DQB
DQB
NC
NC
NC
NC/36M
NC/72M
VDDQ
NC BWACLK GW
VSS VSS VSS VSS
VDDQ VSS
VDD VSS VSS
VSS
VSS
VSS
VSS
VSS
VDDQ
VDDQ
NC
VDDQ
VDDQ
VDDQ
VDDQ
A
A
VDD VSS
VDD VSS VSS
VDDQ VDD VSS
VDD VSS
VDD ‘VSS VSS
VSS
VDD
VDD VSS
VDD VSS VSS
NC
TCKA0
VSS TDI
A
A
DQBVSS
NC VSS
DQB
NC NC VSS VSS
VSS VSS
NC
VSS
A1
DQBNC
NC NC
VDDQ
VSS
TMS
891011
A
ADV A
ADSC A
OE ADSP ANC/576M
VSS VDDQ NC/1G DQPA
VDDQ
VDD NC DQA
DQA
NC
NC
NC
DQA
NC
VDD VDDQ
VDD VDDQ DQA
VDD NC
VDD NCVDD VDDQ DQA
VDDQ
VDD
VDD VDDQ
VDD VDDQ NC
VDDQ
AA
VSS A
A
A
DQA
NC
NC ZZ
DQANC
NC
DQA
A
VDDQ
A
A
Note
2. Errata: The ZZ ball (H 11) needs to be externally connected to ground. For more information, see “Errata” on page 32.
3. Errata: The JTAG testing should be performed with these devices in BYPASS mode as the JTAG functionality is not guaranteed. For more information, see “Errata”
on page 32.
CY7C1386D
CY7C1387D
Document Number: 38-05545 Rev. *M Page 7 of 38
Pin Definitions
Name I/O Description
A0, A1, A Input-
Synchronous Address inputs used to select one of the address locations. Sampled at the rising edge of the CLK
if ADSP or ADSC is active LOW , and CE1, CE2, and CE3 are sampled active. A1:A0 are fed to the two-bit
counter.
BWA, BWB,
BWC, BWDInput-
Synchronous Byte write select inputs, active LOW. Qualified with BWE to conduct byte writes to the SRAM. Sampled
on the rising edge of CLK.
GW Input-
Synchronous Global write enable input, active LOW. When asserted LOW on the rising edge of CLK, a global write
is conducted (all bytes are written, regardless of the values on BWX and BWE).
BWE Input-
Synchronous Byte write enable input, active LOW . Sampled on the rising edge of CLK. This signal must be asserted
LOW to conduct a byte write.
CLK Input-
Clock Clock input. Used to capture all synchronous inputs to the device. Also used to increment the burst
counter when ADV is asserted LOW, during a burst operation.
CE1Input-
Synchronous Chip enable 1 input, active LOW. Sampled on the ri sing edge of CLK. Used in conjun ction with CE2
and CE3 to select or deselect the device. ADSP is ignored if CE1 is HIGH. CE1 is sampled only when a
new external address is loaded.
CE2Input-
Synchronous Chip en able 2 inpu t, active HIGH . Sampled o n the rising edge of CLK. Used in con junctio n with CE1
and CE3 to select or deselect the device. CE2 is sampled only when a new external address is loaded.
CE3Input-
Synchronous Chip enable 3 input, active LOW. Sampled on the ri sing edge of CLK. Used in conjun ction with CE1
and CE2 to select or deselect the device. Not conn ected for BGA. Where referenced , CE3 is assumed
active throughout this document for BGA. CE3 is sampled only when a new external address is loaded.
OE Input-
Asynchronous Output enable, asynchronous input, active LOW. Controls the direction of the I/O pins. When LOW,
the I/O pins behave as outputs. When deasserted HIGH, DQ pins are tristated, and act as input data
pins. OE is masked during the first clock of a read cycle when emerging from a deselected state.
ADV Input-
Synchronous Advance input signal, sampled on the rising edge of CLK, active LOW. When asserted, it
automatically increments the address in a burst cycle.
ADSP Input-
Synchronous Address strobe from processor, sampled on the rising edge of CLK, active LOW. When asserted
LOW, addresses prese nted to the device are ca ptured i n the a ddress registers. A1 :A0 are a lso l oaded
into the burst counter. When ADSP and ADSC are both asserted, only ADSP is recognized. ASDP is
ignored when CE1 is deasserted HIGH.
ADSC Input-
Synchronous Address s trobe from co ntroller, sampled on the rising edge of CLK, active LOW. When asserted
LOW, addresses prese nted to the device are ca ptured i n the a ddress registers. A1 :A0 are a lso l oaded
into the burst counter. When ADSP and ADSC are both asserted, only ADSP is recognized.
ZZ [4] Input-
Asynchronous ZZ sleep input, active HIGH. When asserted HIGH places the device in a non-time critical sleep
condition with data integrity preserved. For normal operation, this pin has to be LOW. ZZ pin has an
internal pull down.
DQs,
DQPX
I/O-
Synchronous Bidire ctional data I/O lines. As i nputs, they feed into an on-ch ip data register that is triggered by the
rising edge of CLK. As outputs, they deliver the data contained in the memory location specified by the
addresses presented during the previous clock rise of the read cycle. The direction of the pins is
controlled by OE. When OE is asserted LOW , the pins behave as outputs. When HIGH, DQs and DQPX
are placed in a tristate condition.
VDD Power Supply Power supply inputs to the core of the device.
VSS Ground Ground for the core of the device.
VSSQ I/O Ground Ground for the I/O circuitry.
VDDQ I/O Power
Supply Power supply for the I/O circuitry.
Note
4. Errata: The ZZ pin needs to be externally connected to ground. For more informat ion, see “Errata” on page 32.
CY7C1386D
CY7C1387D
Document Number: 38-05545 Rev. *M Page 8 of 38
MODE Input-
Static Selects burst order. When tied to GND selects linear burst sequence. When tied to VDD or left floating
selects interleaved burst sequence. This is a strap pin and must remain static during devi ce ope rati on.
Mode pin has an internal pull up.
TDO [5] JTAG serial
output
Synchronous
Serial dat a-out to the JTAG circuit. Delivers data on the negative edge of TCK. If the JTAG feature is
not used, this pin must be disconnected. This pin is not available on TQFP packages.
TDI [5] JTAG serial
input
Synchronous
Serial data-in to the JTAG circuit. Sampled on the rising edge of TCK. If the JTAG feature is not used,
this pin can be disconnected or connected to VDD. This pin is not availabl e on TQFP packages.
TMS [5] JTAG serial
input
Synchronous
Serial data-in to the JTAG circuit. Sampled on the rising edge of TCK. If the JTAG feature is not used,
this pin can be disconnected or connected to VDD. This pin is not availabl e on TQFP packages.
TCK [5] JTAG-
Clock Clock input to the JTAG circuitry. If the JTAG feature is not used, this pin must be connected to VSS.
This pin is not available on TQFP packages.
NC – No Connects. Not internally connected to the die.
NC/(36 M,
72 M,
144 M,
288 M,
576 M, 1 G)
–These pins are not connected. They are used for expansion up to 36 M, 72 M, 144 M, 288 M, 576 M,
and 1G densities.
Pin Definitions (continued)
Name I/O Description
Note
5. Errata: The JTAG testing should be performed with these devices in BYPASS mode as the JTAG functionality is not guaranteed. For more information, see “Errata”
on page 32.
CY7C1386D
CY7C1387D
Document Number: 38-05545 Rev. *M Page 9 of 38
Functional Overview
All synchronous inputs pass through input registers controlled by
the rising edge of the clock. All data outputs pass through output
registers control l e d by the rising edge of the clock.
The CY7C1386D/CY7C1387D supports secondary cache in
systems using either a linear or interleaved burst sequence. The
interleaved burst order supports Pentium® and i486
processors. The linear burst sequence is suited for processors
that use a linear burst sequence. The burst order is user
selectable, and is determined by sampling the MODE input.
Accesses can be initiated with either the processor address
strobe (ADSP) or the controller address strobe (ADSC). Address
advancement through the burst sequence is controlled by the
ADV input. A two-bit on-chip wraparound burst counter captures
the first address in a burst sequence and automatically
increments the address for the rest of the burst access.
Byte write operations are qualified with the byte write enable
(BWE) and byte write select (BWX) inputs. A global write enable
(GW) overrides all byte write inputs and writes data to all four
bytes. All writes are simplified with on-chip synchronous self
timed write circuitry.
Synchronous chip selects CE1, CE2, CE3 and an asynchronous
output enable (OE ) provide for easy bank selection and output
tristate control. ADSP is ignored if CE1 is HIGH.
Single Read Accesses
This access is initiated when the following conditions are
satisfied at clock rise: (1) ADSP or ADSC is asserted LOW, (2)
chip selects are all asserted active, and (3) the write signals (GW ,
BWE) are all deasserted HIGH. ADSP is ignored if CE1 is HIGH.
The address presented to the address inputs is stored into the
address advancement logic and the address register while being
presented to the memory core. The corresponding data is
allowed to propagate to the input of the output regi sters. At the
rising edge of the next clock the data is allowed to propagate
through the output register and onto the data bus within tCO if OE
is active LOW. The only exception occurs when the SRAM is
emerging from a deselected state to a selected state, its outputs
are always tristated during the first cycle of the access. After the
first cycle of the access, the outputs are controlled by the OE
signal. Consecutive single read cycles are supported.
The CY7C1386D/CY7C1387D is a double cycle deselect part.
After the SRAM is deselected at clock rise by the chip select and
either ADSP or ADSC signals, its output tristates immediately
after th e ne xt cl ock rise .
Single Write Accesses Initiated by ADSP
This access is initiated when both of the following conditions are
satisfied at clock rise: (1) ADSP is asserted LOW and (2) chip
select is asserted active. The address presented is loaded into
the address register and the address advancement logic while
being delivered to the memory core. The write signals (GW,
BWE, and BWX) and ADV inputs are ignored during this first
cycle.
ADSP triggered write accesses require two clock cycles to
complete. If GW is asserted LOW on the second clock rise, the
data presented to the DQx inputs is written into the
corresponding address location in the memory core. If GW is
HIGH, the write operation is controlled by BWE and BWX signals.
The CY7C1386D/CY7C1387D provides byte write capability that
is described in the write cycle description table. Asserting the
byte write enable input (BWE) with the selected byte write input,
selectively writes to the desired bytes. Bytes not selected during
a byte write operation remains unaltered. A synchronous self
timed write mechanism has be en provided to simplify the write
operations.
The CY7C1386D/CY7C1387D is a common I/O device, the
output enable (OE) must be deasserted HIGH before presenting
data to the DQ inputs. This tristates the output drivers. As a
safety precaution, DQ are automatically tristated whenever a
write cycle is detected, regardless of the state of OE.
Single Write Accesses Initiated by ADSC
ADSC write accesses are initiated when the following conditions
are satisfied: (1) ADSC is asserted LOW , (2) ADSP is deasserted
HIGH, (3) chip select is asserted active, and (4) the ap propriate
combination of the write inputs (GW, BWE, and BWX) are
asserted active to conduct a write to the desired byte (s). ADSC
triggered write accesses require a single clock cycle to complete.
The address presented is loaded into the address registe r and
the address advancement logic while being delivered to the
memory core. The ADV input is ignored during this cycle. If a
global write is conducted, the data presented to the DQX is
written into the corresponding address location in the memory
core. If a byte write is conducted, only the selected bytes are
written. Bytes not selected during a byte write operation remains
unaltered. A synchronous self timed write mechanism has been
provided to simplify the write operations.
The CY7C1386D/CY7C1387D is a common I/O device, the
output enable (OE) must be deasserted HIGH before presenting
data to the DQX inputs. This tristates the output drivers. As a
safety precaution, DQX are automatically tristated whenever a
write cycle is detected, regardless of the state of OE.
Burst Sequences
The CY7C1386D/CY7C1387D provides a two-bit wraparound
counter, fed by A[1:0], that implements either an interleaved or
linear burst sequence. The interleaved burst sequence is
designed specifically to suppo rt Intel Pentium applications. The
linear burst sequence is designed to support processors that
follow a linear burst sequence. The burst sequence is user
selectable through the MODE input.
Asserting ADV LOW at clock rise automatically increments the
burst counter to the next address in the burst sequence. Both
read and write burst operations are supported.
CY7C1386D
CY7C1387D
Document Number: 38-05545 Rev. *M Page 10 of 38
Sleep Mode
The ZZ input pin is a n asynchronous input. Asserting ZZ places
the SRAM in a power conservation sleep mode. T wo clock cycles
are required to enter into o r exit from this sleep mode. While in
this mode, data integrity is guaranteed. Accesses pending when
entering the sleep mode are not considered valid nor is the
completion of the operation guaranteed. The device must be
deselected prior to entering the sleep mode. CEs, ADSP, and
ADSC must remain inactive for the duration of tZZREC after the
ZZ input returns LOW.
Interleaved Burst Address Table
(MODE = Floating or VDD)
First
Address
A1:A0
Second
Address
A1:A0
Third
Address
A1:A0
Fourth
Address
A1:A0
00 01 10 11
01 00 11 10
10 11 00 01
11 10 01 00
Linear Burst Address Table
(MODE = GND)
First
Address
A1:A0
Second
Address
A1:A0
Third
Address
A1:A0
Fourth
Address
A1:A0
00 01 10 11
01 10 11 00
10 11 00 01
11 00 01 10
ZZ Mode Electrical Characteristics
Parameter Description Test Conditions Min Max Unit
IDDZZ Sleep mode standby current ZZ > VDD– 0.2 V – 80 mA
tZZS Device operation to ZZ ZZ > VDD – 0.2 V – 2tCYC ns
tZZREC ZZ recovery time ZZ < 0.2 V 2tCYC –ns
tZZI ZZ Active to sleep current This parameter is sampled – 2tCYC ns
tRZZI ZZ Inactive to exit sleep current This parameter is sampled 0 – ns
CY7C1386D
CY7C1387D
Document Number: 38-05545 Rev. *M Page 11 of 38
Truth Table
The Truth Table for CY7C1386D and CY7C1387D follow. [6, 7, 8, 9, 10]
Operation Add. Used CE1CE2CE3ZZ ADSP ADSC ADV WRITE OE CLK DQ
Deselect cycle, power-down None H X X L X L X X X L–H Tristate
Deselect cycle, power-down None L L X L L X X X X L–H Tristate
Deselect cycle, power-down None L X H L L X X X X L–H Tristate
Deselect cycle, power-down None L L X L H L X X X L–H Tristate
Deselect cycle, power-down None L X H L H L X X X L–H Tristate
Sleep mode, power-down None X X X H X X X X X X Tristate
Read cycle, begin burst External L H L L L X X X L L–H Q
Read cycle, begin burst External L H L L L X X X H L–H Tristate
Write cycle, begin burst External L H L L H L X L X L–H D
Read cycle, begin burst External L H L L H L X H L L–H Q
Read cycle, begin burst External L H L L H L X H H L–H Tristate
Read cycle, continue burst Next X X X L H H L H L L–H Q
Read cycle, continue burst Next X X X L H H L H H L–H Tristate
Read cycle, continue burst Next H X X L X H L H L L–H Q
Read cycle, continue burst Next H X X L X H L H H L–H Tristate
Write cycle, continue burst Next X X X L H H L L X L–H D
Write cycle, continue burst Next H X X L X H L L X L–H D
Read cycle, suspend burst Current X X X L H H H H L L–H Q
Read cycle, suspend burst Current X X X L H HHHHL–HTristate
Read cycle, suspend burst Current H X X L X H H H L L–H Q
Read cycle, suspend burst Current H X X L X HHHHL–HTristate
Write cycle, suspend burst Current X X X L H H H L X L–H D
Write cycle, suspend burst Current H X X L X H H L X L–H D
CY7C1386D
CY7C1387D
Document Number: 38-05545 Rev. *M Page 12 of 38
Truth Table for Read/Write
The Truth Table for Read/Write for CY7C1386D follows. [11, 12]
Function (CY7C1386D) GW BWE BWDBWCBWBBWA
Read H H X X X X
Read HLHHHH
Write byte A – (DQA and DQPA)HLHHHL
Write byte B – (DQB and DQPB)HLHHLH
Write bytes B, A H L H H L L
Write byte C – (DQC and DQPC)HLHLHH
Write bytes C, A H L H L H L
Write bytes C, B H L H L L H
Write bytes C, B, A H L H L L L
Write byte D – (DQD and DQPD)HLLHHH
Write bytes D, A H L L H H L
Write bytes D, B H L L H L H
Write bytes D, B, A H L L H L L
Write bytes D, C H L L L H H
Write bytes D, C, A H L L L H L
Write bytes D, C, B H L L L L H
Write all bytes HLLLLL
Write all bytes L X X X X X
Truth Table for Read/Write
The Truth Table for Read/Write for CY7C1387D follows. [11, 12]
Function (CY7C1387D) GW BWE BWBBWA
Read H H X X
Read H L H H
Write byte A – (DQA and DQPA)HLHL
Write byte B – (DQB and DQPB)HLLH
Write all bytes H L L L
Write all bytes L X X X
CY7C1386D
CY7C1387D
Document Number: 38-05545 Rev. *M Page 13 of 38
IEEE 1149.1 Serial Boundary Scan (JTAG [13])
The CY7C1387D incorporates a serial boundary scan test
access port (TAP). This part is fully compliant with 11 49.1. The
TAP operates using JEDEC-standard 3.3 V or 2.5 V I/O logic
levels.
The CY7C1387D contains a TAP controller, instructi on register,
boundary scan register , bypass register, and ID register.
Disabling the JTAG Feature
It is possible to operate the SRAM without using the JTAG
feature. To disable the TAP controller, TCK must be tied LOW
(VSS) to prevent clocking of the device. TDI and TMS are
internally pulled up and may be unconnected. They may
alternately be connected to V DD through a pull up resisto r. TDO
can be left unconnected. Upon power-up, the devi ce comes up
in a reset state which does not interfere with the operation of the
device.
Test Access Po rt (TAP)
Test Clock (TCK)
The test clock is used only with the TAP controller. All inputs are
captured on the rising edge of TCK. All outputs are driven from
the falling edge of TCK.
Test Mode Select (TMS)
The TMS input is used to give commands to the TA P controller
and is sampled on the risi ng edge of TCK. This pin may be left
unconnected if the TAP is not used. The ball is pulled up
internally, resulting in a logic HIGH level.
Test Data-In (TDI)
The TDI ball is used to serially input information into the registers
and can be connected to the input of any of the registers. The
register between TDI and TD O is chosen by the i nstru ction th at
is loaded into the T AP instruction register . TDI is internally pulled
up and can be unconnected if the TAP is unused in an
application. TDI is connected to the most significant bit (MSB) of
any register.
Test Data-Out (TDO)
The TDO output ball is used to serially clock data out from the
registers. The output is active depending upon the current state
of the T AP state machine. The output changes on the falling edge
of TCK. TDO is connected to the least significant bit (LSB) of any
register.
Performing a TAP Reset
A Reset is performed by forcing TMS HIGH (VDD) for fiv e ris ing
edges of TCK. This Reset does not affect the operation of the
SRAM and may be performed while the SRAM is operating.
At power-up, the TAP is reset internally to ensure that TDO
comes up in a high Z state.
TAP Registers
Registers are connected between the TDI and TDO balls and
allow data to be scanned into and out of the SRAM test circuitry.
Only one register can be selected at a time through the
instruction register. Data is serially loaded into the TDI ball on the
rising edge of TCK. Data is output on the TDO ball on the falling
edge of TCK.
Instruction Register
Three-bit instructions can be seria lly loaded into the instruction
register. This register is loaded when it is placed between the TDI
and TDO balls as shown in the T AP Controller Block Diagram on
page 16. Upon power-up, the instruction registe r is loaded with
the IDCODE instruction. It is also loaded with the IDCODE
instruction if the controller is placed in a reset state as described
in the previous section.
When the TAP controller is in the Capture-IR state, the two least
significant bits are loaded w ith a binary ‘01’ pattern to allow for
fault isolation of the board-level serial test data path.
Bypass Register
To save time when serially shifting data through registers, it is
sometimes advantageous to skip certain chips. The bypass
register is a single-bit register that can be placed between the
TDI and TDO balls. This allows data to be shifted through the
SRAM with minimal delay . The bypass register is set LOW (VSS)
when the BYPASS instruction is executed.
Boundary Scan Register
The boundary scan register is connected to all the input and
bidirectional balls on the SRAM.
The boundary scan register is loaded with the contents of the
RAM input and output ring when the TAP controller is in the
Capture-DR state and is then placed between the TDI and TDO
balls when the controller is moved to the Shift-DR state. The
EXTEST, SAMPLE/PRELOAD, and SAMPLE Z instructions can
be used to capture the contents of the input and output ring.
The boundary scan order tables show the order in which the bits
are connected. Each bit corresponds to one of the bumps on the
SRAM package. The MSB of the register is connected to TDI,
and the LSB is connected to TDO.
Identification (ID) Register
The ID register is loaded with a vendor specific 32-bit code
during the Capture-DR state when the IDCODE command is
loaded in the instruction register . The IDCODE is hardwired into
the SRAM and can be shifted out when th e TAP controller is in
the Shift-DR state. The ID register has a vendor code and other
information described in the Identification Register Definitions on
page 19.
Note
13.Errata: The JTAG testing should be perfo rmed with these devices in BYPASS mode as the JTAG functionality is not guaranteed. For more information, see “Errata”
on page 32.
CY7C1386D
CY7C1387D
Document Number: 38-05545 Rev. *M Page 14 of 38
TAP Instruction Set
Overview
Eight different instructions are possible with the three bit
instruction register. All combinations are listed in Identification
Codes on page 19. Three of these instructions are listed as
RESERVED and must not be used. The other five instructions
are described in detail below.
Instructions are loaded into the T AP controller during the Shift-IR
state when the instruction register is placed between TDI and
TDO. During this state, instructions are shifted through the
instruction register through the TDI and TDO balls. To execute
the instruction after it is shifted in, the TAP controller needs to be
moved into the Update-IR state.
EXTEST
The EXTEST instruction enables the preloaded data to be driven
out through the system output pins. This instruction also selects
the boundary scan register to be connected for serial access
between the TDI and TDO in the Shift-DR controller state.
IDCODE
The IDCODE instruction causes a vendor specific 32-bit code to
be loaded into the instruction register. It also places the
instruction register between the TDI and TDO balls and allows
the IDCODE to be shifted out of the device when the TAP
controller enters the Shift-DR state.
The IDCODE instruction is loaded into the instruction register
upon power-up or whenever the TAP controller is given a test
logic reset state.
SAMPLE Z
The SAMPLE Z instruction causes the boundary scan register to
be connected between the TDI and TDO balls when the TAP
controller is in a Shift-DR state. The SAMPLE Z command places
all SRAM outputs into a high Z state.
SAMPLE/PRELOAD
SAMPLE/PRELOAD is a 1149.1 mandatory instruction. When
the SAMPLE/PRELOAD instructions are loaded into the
instruction register a nd the TAP controller is in the Capture-DR
state, a snapshot of data on the input and output pins is captured
in the boundary scan register.
The user must be aware that the TAP controll er clock can only
operate at a frequency up to 20 MHz, while the SRAM clock
operates more than an order of magnitude faster. As there is a
large difference in the clock frequencies, it is possible that during
the Capture-DR state, an input or output undergoes a transition.
The TAP may then try to capture a signal while in transition
(metastable state). This does not harm the device, but there is
no guarantee as to the value that is captured. Repeatable results
may not be possible.
To guarantee that the boundary scan register captures the
correct value of a signal, the SRAM signal must be stabilized
long enough to meet the T AP controller’s capture setup plus hold
times (tCS and tCH). The SRAM clock input might not be captured
correctly if there is no way in a design to stop (or slow) the clock
during a SAMPLE/PRELOAD instruction. If this is an issue, it is
still possible to capture all other signals and simply ignore the
value of the CK and CK captured in the boundary scan register.
After the data is captured, it is possible to shift out the data by
putting the T AP into the Shift-DR state. This places the boundary
scan register between the TDI and TDO pins.
PRELOAD allows an initial data pattern to be placed at the
latched parallel outputs of the boundary scan register cells prior
to the selection of another boundary scan test operation.
The shifting of data for the SAMPLE and PRELOAD phases can
occur concurrently when required; that is, while data captured is
shifted out, the preloaded data can be shifted in.
BYPASS
When the BYP ASS instruction is loaded in the instruction register
and the TAP is placed in a Shift-DR state, the bypass register is
placed between the TDI and TDO balls. The advantage of the
BYPASS instruction is that it shortens the boundary scan path
when multiple devices are connected together on a board.
EXTEST Output Bus Tristate
IEEE St andard 1149.1 mandates that the TAP controller be able
to put the output bus into a tristate mode.
The boundary scan register has a special bit located at bit #85
(for 119-ball BGA package) or bit #89 (for 165-ball FBGA
package). When this scan cell, called the “extest output bus
tristate,” is latched into the preload register during the
Update-DR state in the TAP controller, it directly controls the
state of the output (Q-bus) pins, when the EXTEST is entered as
the current instruction. When HIGH, it enables the output buffers
to drive the output bus. When LOW , this bit places the output bus
into a high Z condition.
This bit can be set by entering the SAMPLE/PRELOAD or
EXTEST command, and then shifting the desired bit into that cell,
during the Shift-DR state. During Update-DR, the value loaded
into that shift-register cell latches into the preload register . When
the EXTEST instruction is entered, this bit directly controls the
output Q-bus pins. Note that this bit is preset HIGH to enable the
output when the devi ce is powered-up, and also when the TAP
controller is in the Test-Logic-Reset state.
Reserved
These instructions are not implemented but are reserved for
future use. Do not use these instructions.
CY7C1386D
CY7C1387D
Document Number: 38-05545 Rev. *M Page 15 of 38
TAP Controller State Diagram
The 0 or 1 next to each state represents the value of TMS at the rising edge of TCK.
TEST-LOGIC
RESET
RUN-TEST/
IDLE
SELECT
DR-SCAN
SELECT
IR-SCAN
CAPTURE-DR
SHIFT-DR
CAPTURE-IR
SHIFT-IR
EXIT1-DR
PAUSE-DR
EXIT1-IR
PAUSE-IR
EXIT2-DR
UPDATE-DR
EXIT2-IR
UPDATE-IR
1
1
1
0
1 1
0 0
1 1
1
0
0
0
0 0
0
0
0 0
1
0
1
1
0
1
0
1
1
1
1 0
CY7C1386D
CY7C1387D
Document Number: 38-05545 Rev. *M Page 16 of 38
TAP Controller Block Diagram
TAP Timing Diagram
Bypass Register
0
Instruction Register
012
Identication Register
012293031 ...
Boundary Scan Register
012..x ...
Selection
Circuitry
TCK
TMS TAP CONTROLLER
TDI TDO
Selection
Circuitry
tTL
Test Clock
(TCK)
123456
Test Mode Select
(TMS)
tTH
Test Data-Out
(TDO)
tCYC
Test Data-In
(TDI)
tTMSH
tTMSS
tTDIH
tTDIS
tTDOX
tTDOV
DON’T CARE UNDEFINED
CY7C1386D
CY7C1387D
Document Number: 38-05545 Rev. *M Page 17 of 38
TAP AC Switching Characteristics
Over the Operating Range
Parameter [1 4, 15] Description Min Max Unit
Clock
tTCYC TCK clock cycle time 50 – ns
tTF TCK clock frequency – 20 MHz
tTH TCK clock HIGH time 20 – ns
tTL TCK clock LOW time 20 – ns
Output Times
tTDOV TCK clock LOW to TDO valid – 10 ns
tTDOX TCK Clock LOW to TDO invalid 0 – ns
Setup Times
tTMSS TMS setup to TCK clock rise 5 – ns
tTDIS TDI setup to TCK clock rise 5 – ns
tCS Capture setup to TCK rise 5 – ns
Hold Times
tTMSH TMS hold after TCK clock rise 5 – ns
tTDIH TDI hold after clock rise 5 – ns
tCH Capture hold after clock rise 5 – ns
Notes
14.tCS and tCH refer to the setup and hold time requirements of latching data from the boundary scan register.
15.Test conditions are specified using the load in TAP AC test conditions. tR/tF = 1 ns.
CY7C1386D
CY7C1387D
Document Number: 38-05545 Rev. *M Page 18 of 38
3.3 V TAP AC Test Conditions
Input pulse levels ...............................................VSS to 3.3 V
Input rise and fall times ...................................................1 ns
Input timing reference levels .........................................1.5 V
Output reference levels ................................................1.5 V
Test load termination supply voltage ............................1.5 V
3.3 V TAP AC Output Load Equivalent
2.5 V TAP AC Test Conditions
Input pulse levels ...............................................VSS to 2.5 V
Input rise and fall time ....................... ............................ .1 ns
Input timing reference levels .......................................1.25 V
Output reference levels ..............................................1.25 V
Test load termination supply voltage ..........................1.25 V
2.5 V TAP AC Output Load Equivalent
TDO
1.5V
20pF
Z = 50 Ω
O
50Ω
TDO
1.25V
20pF
Z = 50 Ω
O
50Ω
TAP DC Electrical Characteristics and Operating Conditions
(0 °C < TA < +70 °C; VDD = 3.3 V ± 0.165 V unless otherwise noted)
Parameter[16] Description Test Conditions Min Max Unit
VOH1 Output HIGH voltage IOH = –4.0 mA, VDDQ = 3.3 V 2.4 – V
IOH = –1.0 mA, VDDQ = 2.5 V 2.0 – V
VOH2 Output HIGH voltage IOH = –100 µA VDDQ = 3.3 V 2.9 – V
VDDQ = 2.5 V 2.1 – V
VOL1 Output LOW voltage IOL = 8.0 mA, VDDQ = 3.3 V – 0.4 V
IOL = 8.0 mA, VDDQ = 2.5 V – 0.4 V
VOL2 Output LOW voltage IOL = 100 µA VDDQ = 3.3 V – 0.2 V
VDDQ = 2.5 V – 0.2 V
VIH Input HIGH voltage VDDQ = 3.3 V 2.0 VDD + 0.3 V
VDDQ = 2.5 V 1.7 VDD + 0.3 V
VIL Input LOW voltag e VDDQ = 3.3 V –0.5 0.7 V
VDDQ = 2.5 V –0.3 0.7 V
IXInput load current GND < VIN < VDDQ –5 5 µA
Note
16.All voltages referenced to VSS (GND).
CY7C1386D
CY7C1387D
Document Number: 38-05545 Rev. *M Page 19 of 38
Identification Register Definitions
Instruction Field CY7C1387D (1 M × 18) Description
Revision Number (31:29) 000 Describes the version number
Device Depth (28:24) [17] 01011 Reserved for internal use.
Device Width (23:18) 165-ball FBGA 000110 Defines the memory type and architecture.
Cypress Device ID (17:12) 010101 Defines the width and density.
Cypress JEDEC ID Code (11:1) 00000110100 Allows unique identification of SRAM vendor .
ID Register Presence Indicator (0) 1 Indicates the presence of an ID register.
Scan Register Sizes
Register Name Bit Size (× 18)
Instruction 3
Bypass 1
ID 32
Boundary Scan Order (165-ball FBGA package) 89
Identification Codes
Instruction Code Description
EXTEST 000 Captures I/O ring contents. Places the boundary scan register between TDI and TDO. Forces
all SRAM outputs to high Z state.
IDCODE 001 Loads the ID register with the vendor ID code and places the register between TDI and TDO.
This operation does not affect SRAM operations.
SAMPLE Z 010 Captures I/O ring contents. Places the boundary scan register between TDI and TDO. Forces
all SRAM output drivers to a high Z state.
RESERVED 011 Do Not Use. This instruction is reserved for future use.
SAMPLE/PRELOAD 100 Captures I/O ring contents. Places the boundary scan register between TDI and TDO. Does
not affect SRAM operation.
RESERVED 101 Do Not Use. This instruction is reserved for future use.
RESERVED 110 Do Not Use. This instruction is reserved for future use.
BYPASS 111 Places the bypass register between TDI and TDO. This operation does not affect SRAM
operations.
Note
17.Bit #24 is 1 in the register definitions for both 2.5 V and 3.3 V versions of this device.
CY7C1386D
CY7C1387D
Document Number: 38-05545 Rev. *M Page 20 of 38
Boundary Scan Order
165-ball BGA [18, 19]
Bit # Ball ID Bit # Ball ID Bit # Ball ID
1 N6 31 D10 61 G1
2N7 32C11 62D2
3 N10 33 A11 63 E2
4P11 34B11 64F2
5P8 35A10 65G2
6R8 36B10 66H1
7R9 37A9 67H3
8P938B968J1
9 P10 39 C10 69 K1
10 R10 40 A8 70 L1
11 R11 41 B8 71 M1
12 H11 42 A7 72 J2
13 N11 43 B7 73 K2
14 M11 44 B6 74 L2
15 L11 45 A6 75 M2
16 K11 46 B5 76 N1
17 J11 47 A5 77 N2
18 M10 48 A4 78 P1
19 L10 49 B4 79 R1
20 K10 50 B3 80 R2
21 J10 51 A3 81 P3
22 H9 52 A2 82 R3
23 H10 53 B2 83 P2
24 G11 54 C2 84 R4
25 F11 55 B1 85 P4
26 E11 56 A1 86 N5
27 D11 57 C1 87 P6
28 G10 58 D1 88 R6
29 F10 59 E1 89 Internal
30 E10 60 F1
Notes
18.Balls that are NC (No Connect) are preset LOW.
19.Bit#89 is preset HIGH.
CY7C1386D
CY7C1387D
Document Number: 38-05545 Rev. *M Page 21 of 38
Maximum Ratings
Exceeding maximum ratings may shorten the useful life of the
device. User gui d el i ne s are not tested.
Storage temperature ................................ –65 °C to +150 °C
Ambient temperature
with power applied ................................... –55 °C to +125 °C
Supply voltage on VDD relative to GND .......–0.5 V to +4.6 V
Supply voltage on VDDQ relative to GND ...... –0.5 V to +VDD
DC voltage applied to outputs
in tristate .................. .........................–0.5 V to VDDQ + 0.5 V
DC input voltage .................................–0.5 V to VDD + 0.5 V
Current into outputs (LOW ) ................. ... ....................20 mA
Static discharge voltage
(per MIL-STD-883, Method 3015) ..........................> 2001 V
Latch-up current ....................................................> 200 mA
Operating Range
Range Ambient
Temperature VDD VDDQ
Commercial 0 °C to +70 °C 3.3 V– 5% /
+10% 2.5 V – 5% to
VDD
Industrial –40 °C to +85 °C
Neutron Soft Error Immunity
Parameter Description Test
Conditions Typ Max* Unit
LSBU Logical
single-bit
upsets
25 °C 361 394 FIT/
Mb
LMBU Logical
multi-bit
upsets
25 °C 00.01 FIT/
Mb
SEL Single event
latch-up 85 °C 00.1 FIT/
Dev
* No LMBU or SEL events occurred during testing; this column represents a
statistical 2, 95% confidence limit calculation. For more details refer to
Application Note AN54908 “Accelerated Neutron SER Testing and Calculation
of Terrestrial Failure Rates”.
Electrical Characteristics
Over the Operating Range
Parameter [2 0, 21] Description Test Conditions Min Max Unit
VDD Power supply voltage 3.135 3.6 V
VDDQ I/O supply voltage for 3.3 V I/O 3.135 VDD V
for 2.5 V I/O 2.375 2.625 V
VOH Output HIGH voltage for 3.3 V I/O, IOH = –4.0 mA 2.4 – V
for 2.5 V I/O, IOH = –1.0 mA 2.0 – V
VOL Output LOW voltage for 3.3 V I/O, IOL = 8.0 mA – 0.4 V
for 2.5 V I/O, IOL = 1.0 mA – 0.4 V
VIH Input HIGH voltage [20] for 3.3 V I/O 2.0 VDD + 0.3 V V
for 2.5 V I/O 1.7 VDD + 0.3 V V
VIL Input LOW voltage [20] for 3.3 V I/O –0.3 0.8 V
for 2.5 V I/O –0.3 0.7 V
IXInput leakage current except ZZ
and MODE GND VI VDDQ –5 5µA
Input curren t of MOD E Input = VSS –30 –µA
Input = VDD – 5 µA
Input curren t of ZZ Input = VSS –5 –µA
Input = VDD –30 µA
IOZ Output leakage current GND VI VDDQ, Output Disabled –5 5µA
Notes
20.Overshoot: VIH(AC) < VDD +1.5 V (pulse width less than tCYC/2), undershoot: VIL(AC) > –2 V (pulse width less than tCYC/2).
21.TPower-up: assumes a linear ramp from 0 V to VDD(min) within 200 ms. During this time VIH < VDD and VDDQ < VDD.
CY7C1386D
CY7C1387D
Document Number: 38-05545 Rev. *M Page 22 of 38
IDD VDD operating supply current VDD = Max.,
IOUT = 0 mA,
f = fMAX = 1/tCYC
5 ns cycle, 200 MHz –300 mA
6 ns cycle, 167 MHz –275 mA
ISB1 Automatic CE power-down
current – TTL inputs VDD = Max,
device deselected,
VIN VIH or VIN VIL
f = fMAX = 1/tCYC
5 ns cycle, 200 MHz –150 mA
6 ns cycle, 167 MHz –140 mA
ISB2 Automatic CE power-down
current – CMOS inputs VDD = Max,
device deselected,
VIN 0.3 V or
VIN > VDDQ – 0.3 V,
f = 0
All speeds –70 mA
ISB3 Automatic CE power-down
current – CMOS inputs VDD = Max,
device deselected, or
VIN 0.3 V or
VIN > VDDQ – 0.3 V
f = fMAX = 1/tCYC
5 ns cycle, 200 MHz –130 mA
6 ns cycle, 167 MHz –125 mA
ISB4 Automatic CE power-down
current – TTL inputs VDD = Max,
device deselected,
VIN VIH or VIN VIL,
f = 0
All speeds –80 mA
Capacitance
Parameter [22] Description Test Conditions 100-pin TQFP
Max 165-ball FBGA
Max Unit
CIN Input capacitance TA = 25 C, f = 1 MHz,
VDD = 3.3 V, VDDQ = 2.5 V 5 9 pF
CCLK Clock input capacitance 5 9 pF
CIO I/O capacit ance 5 9 pF
Electrical Characteristics (continued)
Over the Operating Range
Parameter [2 0, 21] Description Test Conditions Min Max Unit
Thermal Resist ance
Parameter [22] Description Test Conditions 100-pin TQFP
Package 165-ball FBGA
Package Unit
JA Thermal resistance
(junction to ambient) Test conditions follow standard test
methods and procedures for measuring
thermal impedance, in accordance with
EIA/JESD51.
28.66 20.7 °C/W
JC Thermal resistance
(junction to case) 4.08 4.0 °C/W
Note
22.Tested initia lly and after any design or process change that may affect these parameters.
CY7C1386D
CY7C1387D
Document Number: 38-05545 Rev. *M Page 23 of 38
AC Test Loads and Waveforms
Figure 3. AC Test Loads and Waveforms
OUTPUT
R = 317
R = 351
5pF
INCLUDING
JIG AND
SCOPE
(a) (b)
OUTPUT
RL= 50
Z0= 50
V
T
= 1.5 V
3.3 V ALL INPUT PULSES
VDDQ
GND
90%
10% 90%
10%
1 ns 1 ns
(c)
OUTPUT
R = 1667
R = 1538
5pF
INCLUDING
JIG AND
SCOPE
(a) (b)
OUTPUT
RL= 50
Z0= 50
VT = 1.25 V
2.5 V ALL INPUT PULSES
VDDQ
GND
90%
10% 90%
10%
1 ns 1 ns
(c)
3.3 V I/O Test Load
2.5 V I/O Test Load
CY7C1386D
CY7C1387D
Document Number: 38-05545 Rev. *M Page 24 of 38
Switching Characteristics
Over the Operating Range
Parameter [2 3, 24] Description -200 -167 Unit
Min Max Min Max
tPOWER VDD(typical) to the first access [25] 1–1–ms
Clock
tCYC Clock cycle time 5.0 –6.0–ns
tCH Clock HIGH 2.0 –2.2–ns
tCL Clock LOW 2.0 –2.2–ns
Output Times
tCO Data output valid after CLK rise –3.0 –3.4 ns
tDOH Data output hold after CLK rise 1.3 –1.3–ns
tCLZ Clock to low Z [26, 27, 28] 1.3 –1.3 –ns
tCHZ Clock to high Z [26, 27, 28] –3.0 –3.4 ns
tOEV OE LOW to output val id –3.0 –3.4 ns
tOELZ OE LOW to output lo w Z [26, 27, 28] 0 – 0 – ns
tOEHZ OE HIGH to output high Z [26, 27, 28] –3.0 –3.4 ns
Setup Times
tAS Address setup before CLK rise 1.4 –1.5–ns
tADS ADSC, ADSP setup before CLK rise 1.4 –1.5–ns
tADVS ADV setup before CLK rise 1.4 –1.5–ns
tWES GW, BWE, BWX setup before CLK rise 1.4 –1.5–ns
tDS Data input setup before CLK rise 1.4 –1.5–ns
tCES Chip enable setup before CLK rise 1.4 –1.5–ns
Hold Times
tAH Address hold after CLK rise 0.4 –0.5–ns
tADH ADSP, ADSC hold after CLK rise 0.4 –0.5–ns
tADVH ADV hold after CLK rise 0.4 –0.5–ns
tWEH GW, BWE, BWX hold after CLK rise 0.4 –0.5–ns
tDH Data input hold after CLK rise 0.4 –0.5–ns
tCEH Chip enable hold after CLK rise 0.4 –0.5–ns
CY7C1386D
CY7C1387D
Document Number: 38-05545 Rev. *M Page 25 of 38
Switching Waveforms Figure 4. Read Cycle Timing [29]
tCYC
tCL
CLK
ADSP
tADH
tADS
ADDRESS
tCH
OE
ADSC
CE
tAH
tAS
A1
tCEH
tCES
GW, BWE,BW
Data Out (DQ) High-Z
tDOH
tCO
ADV
tOEHZ
tCO
Single READ BURST READ
tOEV
tOELZ tCHZ
Burst wraps around
to its initial state
tADVH
tADVS
tWEH
tWES
tADH
tADS
Q(A2)
Q(A2 + 1)
Q(A2 + 2)
Q(A1) Q(A2)
Q(A2 + 1)
Q(A3)
Q(A2 + 3)
A2 A3
Deselect
cycle
Burst continued with
new base address
ADV suspends burst
DON’T CARE UNDEFINED
X
CLZ
t
Note
29.Full width write can be initiated by either GW LOW, or by GW HIGH, BWE LOW, and BWX LOW.
CY7C1386D
CY7C1387D
Document Number: 38-05545 Rev. *M Page 26 of 38
Figure 5. Write Cycle Timing [30]
Switching Waveforms (continued)
tCYC
tCL
CLK
ADSP
tADH
tADS
ADDRESS
tCH
OE
ADSC
CE
tAH
tAS
A1
tCEH
tCES
BWE,
BW X
ADV
BURST READ BURST WRITE
D(A2)
D(A2 + 1)
D(A3)
D(A3 + 1)
D(A2 + 3)
A2 A3
Extended BURST WRITE
Single WRITE
tADH
tADS
tADH
tADS
t
OEHZ
tADVH
tADVS
tWEH
tWES
t
DH
tDS
GW
tWEH
tWES
Byte write signals are ignored for first cycle when
ADSP initiates burst
ADSC extends burst
ADV suspends burst
DON’T CARE UNDEFINED
D(A1)
High-Z
Data in (D)
Data Out (Q)
Note
30.Full width write can be initiated by either GW LOW, or by GW HIGH, BWE LOW, and BWX LOW.
CY7C1386D
CY7C1387D
Document Number: 38-05545 Rev. *M Page 27 of 38
Figure 6. Read/Write Cycle Timing [31, 32, 33]
Switching Waveforms (continued)
tCYC
tCL
CLK
ADSP
tADH
tADS
ADDRESS
tCH
OE
ADSC
CE
tAH
tAS
A2
tCEH
tCES
Data Out (Q) High-Z
ADV
Single WRITE
D(A3)
A4 A5 A6
D(A5) D(A6)
Data In (D)
BURST READ
Back-to-Back READs
High-Z
Q(A2)Q(A1) Q(A4)
tWEH
tWES
Q(A4+3)
tOEHZ
tDH
tDS
tOELZ
tCLZ
tCO
Back-to-Back
WRITEs
A1
BWE, BW X
A3
DON’T CARE UNDEFINED
Notes
31.Full width write can be initiated by either GW LOW, or by GW HIGH, BWE LOW, and BWX LOW.
32.The data bus (Q) remains in high Z following a Write cycle, unless a new read access is initiated by ADSP or ADSC.
33.GW is HIGH.
CY7C1386D
CY7C1387D
Document Number: 38-05545 Rev. *M Page 28 of 38
Figure 7. ZZ Mode Timing [34, 35]
Switching Waveforms (continued)
tZZ
I
SUPPLY
CLK
ZZ
tZZREC
ALL INPUTS
(except ZZ)
DON’T CARE
IDDZZ
tZZI
tRZZI
Outputs (Q)
High-Z
DESELECT or READ Only
Notes
34.Device must be deselected when entering ZZ sleep mode. See cycle descriptions table for all possible signal conditions to deselect the device.
35.DQs are in high Z when exiting ZZ sleep mode.
CY7C1386D
CY7C1387D
Document Number: 38-05545 Rev. *M Page 29 of 38
Ordering Information
The table below contains only the parts that are currently available. If you do not see what you are looking for, please contact your
local sales representative. For more information, visit the Cypress website at www.cypress.com and refer to the product summary
page at http://www.cypress.com/products
Cypress maintains a worldwide network of offices, solution centers, manufacturer’s representatives and distributors. To find the office
closest to you, visit us at http://www.cypress.com/go/datasheet/offices.
Ordering Code Definitions
Speed
(MHz) Ordering Code Package
Diagram Part and Package Type Operating
Range
167 CY7C1386D-167AXC 51-85050 100-pin TQFP (14 × 20 × 1.4 mm) Pb-free Commercial
CY7C1387D-167AXC
CY7C1387D-167BZI 51-85180 165-ball FBGA (13 × 15 × 1.4 mm) Industrial
200 CY7C1386D-200AXC 51-85050 100-pin TQFP (14 × 20 × 1.4 mm) Pb-free Commercial
Temperature Range: I = Industria l;
C = Commercial;
X = Pb-free; X Absent = Leaded
Package Type: BZ = 165-pin FBGA
A = 100-pin TQFP
Sp eed Grade: XXX = 167 MHz / 200 MHz
Process Technology 90 nm
13XX = 1386 or 1387
1386 = DCD, 512 K × 36 (18 Mb)
1387 = DCD, 1 M × 18 (18 Mb)
Technology Code: C = CMOS
Marketing Code: 7 = SRAM
Company ID: CY = Cypress
13XX7 - XXX X XDCY XC
CY7C1386D
CY7C1387D
Document Number: 38-05545 Rev. *M Page 30 of 38
Package Diagrams
Figure 10. 100-pin TQFP (14 × 20 × 1.4 mm) A100RA Package Outline, 51-85050
Figure 8. 165-ball FBGA (13 × 15 × 1.4 mm) BB165D/BW165D (0.5 Ball Diameter) Package Outline, 51 -85180
51-85050 *D
51-85180 *F
CY7C1386D
CY7C1387D
Document Number: 38-05545 Rev. *M Page 31 of 38
Acronyms Document Conventions
Units of Measure
Acronym Description
BGA Ball Grid Array
CE Chip Enable
CMOS Complementary Metal Oxide Semiconductor
FBGA Fine-Pitch Ball Grid Array
I/O Input/Output
JTAG Joint Test Action Group
LMBU Logical Multiple-Bit Upsets
LSB Least Significant Bit
LSBU Logical Single-Bit Upsets
MSB Most Significant Bit
OE Output Enable
SEL Single Event Latch-Up
SRAM Static Random Access Memory
TAP Test Access Port
TCK Test Clock
TDI Test Data-In
TDO Test Data-Out
TMS Test Mode Select
TQFP T hin Quad Flat Pack
TTL Transistor-Transistor Logic
Symbol Unit of Measure
°C degree Celsius
kkilohm
MHz megahertz
µA microampere
µs microsecond
mA milliampere
mV millivolt
mm millimeter
ms millisecond
ns nanosecond
ohm
% percent
pF picofarad
ps picosecond
Vvolt
Wwatt
CY7C1386D
CY7C1387D
Document Number: 38-05545 Rev. *M Page 32 of 38
Errata
This section describes the Ram9 Sync ZZ pin and JTAG issues. Details include trigger conditions, the devices affected, proposed
workaround and silicon revision appl icability. Please contact your local Cypress sales representative if you have further questions.
Part Numbers Affected
Product S tatus
All of the devic es i n th e R am9 18 Mb Sync fa mi ly are qualified and available in pro duction quantities.
Ram9 Sync ZZ Pin & JTAG Issues Errata Summary
The following table defines the errata applicable to available Ram9 18Mb Sync family devices.
Density & Revision Package Type Operating Range
18Mb-Ram9 Synchronous SRAMs: CY7C138*D 100-pin TQFP Commercial
165-ball FBGA Industrial
Item Issues Description Device Fix Status
1. ZZ Pin When asserted HIGH, the ZZ pin places
device in a “sleep” condition with data integrity
preserved.The ZZ pin currently does not have
an internal pull-down resistor and hence
cannot be left floating externally by the user
during normal mode of operation.
18M-Ram9 (90nm) For the 18M Ram9 (90 nm)
devices, there is no plan to fix
this issue.
2. JTAG
Functionality During JTAG test mode, the Boundary scan
circuitry does not perform as described in the
datasheet.However, it is possib le to perform
the JT AG test with these devices in “BYP ASS
mode”.
18M-Ram9 (90nm) This issue will be fixed in the
new revision, which use the
65 nm technology. Please
contact your local sales rep for
availability.
CY7C1386D
CY7C1387D
Document Number: 38-05545 Rev. *M Page 33 of 38
1. ZZ Pin Issue
■PROBLEM DEFINITION
The problem occurs onl y when the device is op erated in the normal mod e with ZZ pin left floating. The ZZ pi n on the SRAM
device does not have an internal pull-down resistor. Switching noise in the system may cause the SRAM to recognize a HIGH
on the ZZ input, which may cause the SRAM to enter sleep mode. This could result in incorrect or undesirable operation of the
SRAM.
■TRIGGER CONDITIONS
Device operated with ZZ pin left floating.
■SCOPE OF IMPACT
When the ZZ pin is left floating, the device delivers incorrect data.
■WORKAROUND
Tie the ZZ pin externally to ground.
■FIX STATUS
For the 18M Ram9 (90 nm) devi ce s, th ere is no pl a n to fix th i s issu e.
2. JTAG Functionality
■PROBLEM DEFINITION
The problem occurs only when the device is operated in the JTAG test mode.During this mode, the JTAG circuitry can perform
incorrectly by delivering the incorrect data or the incorrect scan chain length.
■TRIGGER CONDITIONS
Several conditions can trigger this failure mode.
1. The device can deliver an incorrect length scan chain when operating in JTAG mode.
2. Some Byte Write inputs only recognize a logic HIGH level when in JTAG mode.
3. Incorrect JTAG data can be read from the device when the ZZ input is tied HIGH during JTAG operation .
■SCOPE OF IMPACT
The device fails for JTAG test. This does not impact the normal functionality of the device.
■WORKAROUND
1.Perform JTAG testing with these devices in “BYPASS mode”.
2.Do not use JTAG test.
■FIX STATUS
This issue will be fixed in the new revision, which use the 65 nm technology . Please contact your local sales rep for availability.
CY7C1386D
CY7C1387D
Document Number: 38-05545 Rev. *M Page 34 of 38
Document History Page
Document Title: CY7C1386D/CY7C1387D, 18-Mbit (512 K × 36/1 M × 18) Pipelined DCD Sync SRAM
Document Number: 38-05545
Revision ECN Orig. of
Change Submission
Date Description of Change
** 254550 RKF See ECN New data sheet.
*A 288531 SYT See ECN Updated Features (Removed 225 MHz speed bin information).
Updated Selection Guide (Removed 225 MHz speed bin information).
Updated IEEE 1149.1 Serial Boundary Scan (JTAG [13]) (Edited description
for non-compliance with 1149.1).
Updated Electrical Characteristics (Removed 225 MHz speed bin information).
Updated Switching Characteristics (Removed 225 MHz speed bin information).
Updated Ordering Information (Updated part numbers (Added Pb-free
information for 100-pin TQFP, 1 19-ball BGA and 165-ball FBGA Packages) and
added comment of ‘Pb-free BG packages availability’ below the Ordering
Information).
*B 326078 PCI See ECN Updated Pin Configurations (Modified Address Expansion pins/balls in the
pinouts for all packages as per JEDEC standards)
Updated IEEE 1149.1 Serial Boundary Scan (JTAG [13]) (Updated TAP
Instruction Set (Updated OVERVIEW, updated EXTEST, added EXTEST
Output Bus Tristate)).
Updated Identifi cation Regi ster Defini ti ons (Splitted Device Width (23:18) into
two rows, one row for 119-bal l BGA and another row for 165-ball FBGA and
updated the values).
Updated Electrical Characteristics (Updated te st conditions for VOH and VOL
parameters).
Updated Thermal Resistance (Changed values of JA and JC parameters for
100-pin TQFP Package from 31 and 6 C/W to 28.66 and 4.08 C/W
respectively, changed values of JA and JC parameters for 119-ball BGA
Package from 45 and 7 C/W to 23.8 and 6.2 C/W respectively, changed
values of JA and JC parameters for 165-ball FBGA Package from 46 and
3C/W to 20.7 and 4.0 C/W respectively).
Updated Ordering Information (updated part numbers and removed comment
of “Pb-free BG packages availability” below the Ordering Information).
*C 418125 NXR See ECN Changed status from Preliminary to Final.
Changed address of Cypress Semiconductor Corporation on Page# 1 from
“3901 North First Street” to “198 Champion Court”.
Updated Electrical Characteristics (Changed the description of IX parameter
from Input Load Current to Input Leakage Current, changed minimum and
maximum values of IX paramete r for Input Current of MODE from –5 A and
30 A to –30 A and 5 A, changed minimum and maximum values of IX
parameter for Input Current of ZZ from –30 A and 5 A to –5 A and 30 A,
updated Note 21 (changed VIH < VDD to VIH < VDD)).
Updated Orderi ng Information (updated part numbers and replaced Package
Name column with Package Diagram in the Ordering Information table).
*D 475009 VKN See ECN Updated TAP AC Switching Characteristics (Ch ang ed minimum val ues o f tTH
and tTL parameters from 25 ns to 20 ns, changed maximum value of tTDOV
parameter from 5 ns to 10 ns).
Updated Maximum Ratings (Added the Maximum Rating for Supply Voltage
on VDDQ Relative to GND).
Updated Ordering Information (updated part numbers).
CY7C1386D
CY7C1387D
Document Number: 38-05545 Rev. *M Page 35 of 38
*E 793579 VKN See ECN Added Part numbers CY7C1386F and CY7C1387F
Updated Features (Included all information related to CY7C1386F and
CY7C1387F).
Updated Functional Description (Included all information related to
CY7C1386F and CY7C1387F).
Updated Logic Block Diagram and added a note regarding Chip Enable
“CY7C1386F and CY7C1387F have only 1 Chip Enable (CE1).”.
Updated Pin Configurations (Included all information related to CY7C1386F
and CY7C1387F).
Updated Functional Overview (Included all information related to CY7C1386F
and CY7C1387F).
Updated Truth Table (Included all information related to CY7C1386F and
CY7C1387F).
Updated Truth Table for Read/Write (Included all information related to
CY7C1386F and CY7C1387F).
Updated Truth Table for Read/Write (Included all information related to
CY7C1386F and CY7C1387F).
Updated IEEE 1149.1 Serial Boundary Scan (JTAG [13]) (Included all
information related to CY7C1386F and CY7C1387F).
Updated Ide ntifi cati on Register Definitio ns (Included all information related to
CY7C1386F and CY7C1387F).
Updated Ordering Information (updated part numbers).
*F 2756940 VKN 08/27/2009 Added Neutron Soft Error Immunity.
Modified Ordering Information (by including parts that are available) and
modified th e di scl a i mer for the Ordering Information.
*G 3006369 NJY 08/12/10 Added Ordering Code Definitions.
Added Acronyms.
Updated in new template.
*H 3309506 OSN 07/12/2011 Updated Package Diagrams.
Added Units of Measure.
Updated in new template.
Document History Page (continued)
Document Title: CY7C1386D/CY7C1387D, 18-Mbit (512 K × 36/1 M × 18) Pipelined DCD Sync SRAM
Document Number: 38-05545
Revision ECN Orig. of
Change Submission
Date Description of Change
CY7C1386D
CY7C1387D
Document Number: 38-05545 Rev. *M Page 36 of 38
*I 3541411 PRIT 03/03/2012 Updated Features (Removed all information related to CY7C1386F and
CY7C1387F).
Updated Functional Description (Removed all information related to
CY7C1386F and CY7C1387F, removed the notes “For best practices or
recommendations, please refer to the Cypress application note AN1064,
SRAM System Design Guidelines on www.cypress.com.” and “CE3 and CE2
are for 100-pin TQFP and 165-ball FBGA packages only. 119-ball BGA is
offered only in Single Chip Enable.”).
Updated Selection Guide (Removed 250 MHz speed bin information).
Updated Logic Block Diagram – CY7C1386D (Removed all information related
to CY7C1386F and CY7C1387F).
Updated Logic Block Diagram – CY7C1387D (Removed all information related
to CY7C1386F and CY7C1387F).
Updated Pin Configura tions (Removed all information relate d to CY7C1386F
and CY7C1387F).
Updated Pin Definitions (Removed the note “CE3 and CE2 are for 100-pin
TQFP and 165-ball FBGA packages only . 119-ball BGA is offered only in Single
Chip Enable.” and its references in the same section).
Updated Functional Overview (Removed all information related to CY7C1386F
and CY7C1387F, removed the n ote “CE3 and CE2 are fo r 100-pin TQ FP and
165-ball FBGA packages only. 119-ball BGA is offered only in Single Chip
Enable.” and its references in the same section).
Updated Truth Table (Removed all information related to CY7C1386F and
CY7C1387F).
Updated Truth Table for Read/Write (Removed all information related to
CY7C1386F and CY7C1387F).
Updated Truth Table for Read/Write (Removed all information related to
CY7C1386F and CY7C1387F).
Updated IEEE 1149.1 Serial Boundary Scan (JTAG [13]) (Removed all
information related to CY7C1386F and CY7C1387F).
Updated Identification Register Definitions (Removed all information related to
CY7C1386F and CY7C1387F).
Updated Scan Register Sizes (Removed Bit Size (× 36) information).
Updated Boundary Scan Order (Removed all 119-ball BGA information).
Updated Electrical Characteristics (Removed 250 MHz speed bin information).
Updated Capacitance (Removed all 119-ball BGA information).
Updated Thermal Resistance (Removed all 119-ball BGA information).
Updated Switching Characteristics (Removed 250 MHz speed bin information).
Updated Ordering Info rmatio n (upda ted part numbers) and upda ted Ordering
Code Definitions.
Updated Package Diagrams.
*J 3690005 PRIT 07/24/2012 No technica l changes. Completing sunset review .
*K 3990993 PRIT 05/04/2013 Updated Package Diagrams:
spec 51-85180 – Changed revision from *E to *F.
Added Errata.
Document History Page (continued)
Document Title: CY7C1386D/CY7C1387D, 18-Mbit (512 K × 36/1 M × 18) Pipelined DCD Sync SRAM
Document Number: 38-05545
Revision ECN Orig. of
Change Submission
Date Description of Change
CY7C1386D
CY7C1387D
Document Number: 38-05545 Rev. *M Page 37 of 38
*L 4068739 PRIT 07/20/2013 Added Errata footnotes (Note 1, 2, 3, 4, 5, 13).
Updated Pin Configurations:
Added Note 1 and referred the same note in Figure 1.
Added Note 2, 3 and referred the same note in Figure 2.
Updated Pin Defini tions:
Added Note 4 and referred the same note in ZZ pin.
Added Note 5 and referred the same note in TDO, TDI, TMS, TCK pins.
Updated IEEE 1149.1 Serial Boundary Scan (JTAG [13]):
Added Note 13 and referred the same note in JTAG in the heading.
Updated Errata.
Updated in new template.
*M 4150971 PRIT 10/08/2013 Updated Errata.
Document History Page (continued)
Document Title: CY7C1386D/CY7C1387D, 18-Mbit (512 K × 36/1 M × 18) Pipelined DCD Sync SRAM
Document Number: 38-05545
Revision ECN Orig. of
Change Submission
Date Description of Change
Document Number: 38-05545 Rev. *M Revised October 8, 2013 Page 38 of 38
Intel and Penti u m ar e reg i ster ed tra de m ar ks, and i486 is a trademar k of In tel Cor po ra ti on . P ower PC i s a tra de ma r k of IBM Co r por ation. All product s and com pany names ment io ne d i n thi s do cum en t
may be the trademarks of their respective holders.
CY7C1386D
CY7C1387D
© Cypress Semicondu ctor Corpor ation, 2004-2013. The informatio n contai ned herei n is subject to chan ge without no tice. Cypress Semiconductor Corporation assumes no responsibility for the use of
any circuitry other than circuitry embodied in a Cypress product. Nor does it convey or imply any license under patent or other rights. Cypre ss prod uc ts are n ot war r ant ed no r inte nd ed to be used fo r
medical, life supp or t, l if e savin g, cr it ical control or saf ety ap pl ic at io ns, unless pursuant to a n express written ag re em en t with Cypress. Furthermor e, Cyp ress doe s not author iz e its products for use as
critical components in life-support systems where a malfunction or failure may reasonably be expected to result in significant injury to the user. The inclusion of Cypress pr oducts in life -support systems
application implies that the manufacturer assumes all risk of such use and in doing so indemnifies Cypress against all charges.
Any Source Code (software and/or firmware) is owned by Cypress Semiconductor Corporation (Cypress) and is protected by and subject to worldwide patent protec tion (Unit ed States and fore ign),
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and compile the Cypress Source Code and derivative works for the sole purpose of creating custom software and or firmware in support of licensee product to be used on ly in conjunction with a C ypress
integrated circui t as specified in the applicab le agreement. Any r eproduction, mod ification, translati on, compilatio n, or represent ation of this Sour ce Code except as specified above is prohibited wi thout
the express written permission of Cypress.
Disclaimer: CYPRESS MAKES NO WARRANTY OF ANY KIND, EXPRESS OR IMPLIED, WITH REGARD TO THIS MATERIAL, INCLUDING, BUT NOT LIMITED TO, THE IMPLIED WARRANTIES
OF MERCHANTABILITY AND FITNESS FOR A PARTICULAR PURPOSE. Cypress reserves the right to make changes without further notice to the materials describ ed herein. Cyp ress does not
assume any liabil ity ar ising ou t of the a pplic ation or use o f any pr oduct or circ uit descri bed herein . Cypr ess does n ot author ize its p roducts fo r use as critical componen ts in life-su pport systems whe re
a malfunction or failure may reasonably be expected to result in significant injury to the user. The inclusion of Cypress’ product in a life-support systems application implies that the manufacturer
assumes all risk of such use and in doing so indemnifies Cypress against all charges.
Use may be limited by and subject to the applicable Cypress software license agreement.
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