CY62148ESL MoBL®
4-Mbit (512 K × 8) St atic RAM
Cypress Semiconductor Corporation 198 Champion Court San Jose,CA 95134-1709 408-943-2600
Document #: 001-50045 Rev. *C Revised August 23, 2010
4-Mbit (512 K × 8) Stat ic RAM
Features
Higher speed up to 55 ns
Wide voltage range: 2.2 V to 3.6 V and 4.5 V to 5.5 V
Ultra low standby power
Typical standby current: 1 µA
Maximum standby current: 7 µA
Ultra low active power
Typical acti ve current: 2 mA at f = 1 MHz
Easy memory expansion with CE and OE features
Automatic power-down when deselected
Complementary metal oxide semiconductor (CMOS) for
optimum speed and power
Available in Pb-free 32-Pin shrunk thin small outline package
(STSOP) package
Functional Description
The CY62148ESL is a high performance CMOS static RAM
organized as 512 K words by 8-bits. This device features
advanced circuit design to provide ultra low active current. This
is ideal for providing More Battery Life™ (MoBL®) in portable
applications such as cellular telephones. The device also has an
automatic power-down feature that significantly reduces power
consumption. Placing the device in standby mode reduces
power consumption by more than 99 percen t when deselected
(CE HIGH). The eight input and output pins (I/O0 through I/O7)
are placed in a high impedance state when the device is
deselected (CE HIGH), the outputs are disabled (OE HIGH), or
during a write operation (CE LOW and WE LOW).
To write to the device, take Chip Enable (CE) and Write Enable
(WE) inputs LOW. Data on the eight I/O pins (I/O0 through I/O7)
is then written into the location specified on the address pins (A0
through A18).
To read from the device, take Chip Enable (CE) and Output
Enable (OE) LOW while forcing Write Enable (WE) HIGH. Under
these conditions, the contents of the memory location specified
by the address pins appear on the I/O pins.
For best practice recommendations, refer to the Cypress
application note AN1064, SRAM System Guidelines.
A0IO0
IO7
IO1
IO2
IO3
IO4
IO5
IO6
A1
A2
A3
A4
A5
A6
A7
A8
A9
SENSE AMPS
POWER
DOWN
CE
WE
OE
A13
A14
A15
A16
A17
ROW DECODER
COLUMN DECODER
512K x 8
ARRAY
INPUT BUFFER
A10
A11
A12
A18
Logic Block Diagram
I/O0
I/O1
I/O2
I/O3
I/O4
I/O5
I/O6
I/O7
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Contents
4-Mbit (512 K × 8) Static RAM ..........................................1
Features .............................................................................1
Functional Description ................... ... .............. ... .. ............1
Pin Configuration .............................................................3
Product Portfolio ..............................................................3
Maximum Ratings .............................................................4
Operating Range ..................... .. ............................ ... .........4
Electrical Characteristics .................................................4
Capacitance ......................................................................5
Thermal Resistance ..........................................................5
Data Retention Characteristics .......................................6
Switching Characteristics ...................... ... .......................7
Switching Waveforms .............. ............................ ............8
Truth Table ........................................................................9
Ordering Information ......................................................10
Ordering Code Definitions .............................................10
Package Diagram ............................................................11
Acronyms ........................................................................11
Document Conventions .................. ... ............................11
Units of Measure ............. ............................ ... ... ........11
Document History Page ............. ............................ ... .....12
Sales, Solutions, and Legal Information ......................13
Worldwide Sales and Design Support .......................13
Products .................................................................... 13
PSoC Solutions .........................................................13
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Pin Configuration
Figure 1. 32-Pin STSOP (Top View)
25
26
27
28
29
30
31
32
1
2
3
4
5
6
7
8
A11
A9
A8
A13
A17
A15
A18
A16
A14
A12
A7
A6
A5
A4
WE
VCC
24
23
22
21
20
19
18
17
16
15
14
13
12
11
10
9
A0
A1
A2
A3
A10
OE
CE
I/O0
I/O1
I/O2
I/O3
I/O4
I/O5
I/O6
I/O7
GND
STSOP
Top View
(not to scale)
Product Portfolio
Product Range VCC Range (V)[1] Speed
(ns)
Power Dissipation
Operating ICC, (mA) Standby, ISB2
(µA)
f = 1 MHz f = fmax
Typ[2] Max Typ[2] Max Typ[2] Max
CY62148ESL Industrial/
Automotive-A 2.2 V to 3.6 V and 4.5 V to 5.5 V 55 2 2.5 15 20 1 7
Notes
1. Datasheet specifications are not guaranteed for VCC in the range of 3.6 V to 4.5 V.
2. Typical values are included for reference only and are not guaranteed or tested. Typical values are measured at VCC = VCC(typ), TA = 25 °C.
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Maximum Ratings
Exceeding m aximu m ratings may shorten the useful life of the
device. User guidelines are not tested.
Storage temperature.................................–65 °C to +150 °C
Ambient temperature with pow er applied ....55 °C to +125 °C
Supply voltage to ground potential................. –0.5 V to 6.0 V
DC voltage applied to outputs
in high Z state [3, 4].........................................–0.5 V to 6.0 V
DC input voltage [3, 4].....................................–0.5 V to 6.0 V
Output current into outputs (low)..................................20 mA
Static discharge voltage.......................................... > 2001 V
(MIL-STD-883, Method 3015)
Latch-up current......................................................> 200 mA
Operating Range
Device Range Ambient
Temperature VCC[5]
CY62148ESL Industrial/
Automotive-A –40 °C to +85 °C 2.2 V to 3.6 V,
and 4.5 V to
5.5 V
Electrical Characteristics
Over the operating range
Parameter Description Test Co nditions 55 ns (Industrial/Automotive-A) Unit
Min Typ[6] Max
VOH Output HIGH voltage 2.2 < VCC < 2.7 IOH = –0.1 mA 2.0 V
2.7 < VCC < 3.6 IOH = –1.0 mA 2.4
4.5 < VCC < 5.5 IOH = –1.0 mA 2.4
VOL Output LOW voltage 2.2 < VCC < 2.7 IOL = 0.1 mA 0.4 V
2.7 < VCC < 3.6 IOL = 2.1 mA 0.4
4.5 < VCC < 5.5 IOL = 2.1 mA 0.4
VIH Input HIGH voltage 2.2 < VCC < 2.7 1.8 VCC + 0.3 V
2.7 < VCC < 3.6 2.2 VCC + 0.3
4.5 < VCC < 5.5 2.2 VCC + 0.5
VIL [7] Input LOW voltage 2.2 < VCC < 2.7 –0.3 0.4 V
2.7 < VCC < 3.6 –0.3 0.6
4.5 < VCC < 5.5 –0.5 0.6
IIX Input leakage current GND < VI < VCC –1 +1 µA
IOZ Output leakage current GND < VO < VCC, output disabled –1 + 1 µA
ICC VCC operating supply
current f = fmax = 1/tRC VCC = VCCmax
IOUT = 0 mA, CMOS levels –15 20mA
f = 1 MHz 2 2.5
ISB1[8] Automatic CE
power-down current —
CMOS inputs
CE > VCC 0.2 V, VIN > VCC – 0.2 V or VIN < 0.2 V,
f = fmax (address and data only), f = 0 (OE and WE),
VCC = VCC(max)
–1 7µA
ISB2[8] Automatic CE
power-down current —
CMOS inputs
CE > VCC 0.2 V, VIN > VCC – 0.2 V or VIN < 0.2 V,
f = 0, VCC = VCC(max) –1 7µA
Notes
3. VIL(min) = –2.0 V for pulse durations less than 20 ns.
4. VIH(max) = VCC + 0.75 V for pulse durations less than 20 ns.
5. Full device AC operation assu mes a minimum of 100 µs ramp time from 0 to VCC (min) and 200 µs wait time after VCC stabilization.
6. Typical values are included for reference and are not guaranteed or tested. Typical values are measured at VCC = VCC(typ), TA = 25 °C.
7. Under DC conditions the device meets a VIL of 0.8 V (for VCC range of 2.7 V to 3. 6 V and 4.5 V to 5.5 V) and 0.6 V (for VCC range of 2.2 V to 2.7 V). However, in
dynamic conditions Input LOW voltage applied to the device must not be higher than 0.6 V and 0.4 V for the above ranges. Refer to AN13470 for de tails.
8. Chip enable (CE) must be HIGH at CMOS level to meet the ISB1 / ISB2 / ICCDR spec. Other inputs can be left floating.
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Capacitance
Parameter [9] Description Test Conditions Max Unit
CIN Input capacitance TA = 25 °C, f = 1 MHz,
VCC = VCC(Typ) 10 pF
COUT Output capacitance 10 pF
Thermal Resist ance
Parameter [9] Description Test Conditions STSOP Unit
ΘJA Thermal resistance
(junction to ambient) Still air, soldered on a 3 × 4.5 inch, two-laye r pri nted
circuit board 49.02 °C/W
ΘJC Thermal resistance
(junction to case) 14.07 °C/W
Figure 2. AC Test Loads and Waveforms
VCC
VCC
OUTPUT
R2
30 pF
INCLUDING
JIG AND
SCOPE
GND 90%
10% 90%
10%
Rise Time = 1 V/ns Fall Time = 1 V/ns
OUTPUT V
Equivalentto: THEVENIN EQUIVALENT
ALL INPUT PULSES
RTH
R1
Parameter 2.5 V 3.0 V 5.0 V Unit
R1 16667 1103 1800 Ω
R2 15385 1554 990 Ω
RTH 8000 645 639 Ω
VTH 1.20 1.75 1.77 V
Notes
9. Tested initially and after any design or process changes that may aff ect these parameters.
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Data Retention Characteristics
Over the operating range
Parameter Description Conditions Min Typ[10] Max Unit
VDR VCC for data retention 1.5 V
ICCDR [11] Data retention current CE > VCC – 0.2 V, VIN > VCC – 0.2 V or
VIN < 0.2 V, VCC = 1.5 V Industrial/
Automotive-A –17µA
tCDR Chip deselect to data
retention time 0––ns
tR [12] Operation recovery time 55 ns
Figure 3. Data Retention Waveform
VCC(min)
VCC(min)
tCDR
VDR >1.5 V
DATA RETENTION MODE
tR
VCC
CE
Notes
10.Typical values are included for reference only and are not guaranteed or tested. Typical values are measured at VCC = VCC(typ), TA = 25 °C.
11. Chip enable (CE) must be HIGH at CMOS level to meet the ISB1 / ISB2 / ICCDR spec. Other inputs can be left floating.
12.Full device operation requires linear VCC ramp from VDR to VCC(min) > 100 µs or stable at VCC(min) > 100 µs.
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Switching Characteristics
Over the operating range
Parameter [13] Description 55 ns (Industri a l/Automotive-A) Unit
Min Max
Read Cycle
tRC Read cycle time 55 ns
tAA Address to data valid 55 ns
tOHA Data hold from address change 10 ns
tACE CE LOW to data valid 55 ns
tDOE OE LOW to data valid 25 ns
tLZOE OE LOW to low Z [14] 5–ns
tHZOE OE HIGH to high Z [14, 15] –20ns
tLZCE CE LOW to low Z [14] 10 ns
tHZCE CE HIGH to high Z [14, 15] –20ns
tPU CE LOW to power-up 0 ns
tPD CE HIGH to power-up 55 ns
Write Cycle [16]
tWC Write cycle time 55 ns
tSCE CE LOW to write end 40 ns
tAW Address setup to write end 40 ns
tHA Address hold from write end 0 ns
tSA Address setup to write start 0 ns
tPWE WE pulse width 40 ns
tSD Data setup to write end 25 ns
tHD Data hold from write end 0 ns
tHZWE WE LOW to high Z [14, 15] –20ns
tLZWE WE HIGH to low Z [14] 10 ns
Notes
13.Test conditions for all para meters other than tri-st ate pa rameters assume signal transition ti me of 3 ns or less (1 V/ns), timing refer ence levels of VCC(typ)/2, input p ulse
levels of 0 to VCC(typ), and out put loading of the specified IOL/IOH as shown in A C Test Loads and Waveforms on page 5.
14.At any temperature and voltage condition, tHZCE is less than tLZCE, tHZOE is less than tLZOE, and tHZWE is less than tLZWE for any device.
15.tHZOE, tHZCE, and tHZWE transitions are measured when the outpu t enter a high impedance state.
16.The internal write time of the memory is defi ned by th e overlap of WE , CE = VIL. All sig nals must be ACTIVE to initiat e a write and an y of these signals ca n te rminate
a write by going INACTIVE. The data input setup and hold timing must be referenced to the edge of the signal that terminates the write.
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Switching Waveforms
Figure 4. Read Cycle No. 1 (Address Transition Controlled) [17, 18]
Figure 5. Read Cycle No. 2 (OE Controlled) [18, 19]
Figure 6. Write Cycle No. 1 (WE Controlled, OE HIGH During Write) [20, 21]
PREVIOUS DATA VALID DATA VALID
RC
tAA
tOHA
tRC
ADDRESS
DATA OUT
50%
50%
DATA VALID
tRC
tACE
tDOE
tLZOE
tLZCE
tPU
HIGH IMPEDANCE
tHZOE tHZCE
tPD
IMPEDANCE
ICC
ISB
HIGH
ADDRESS
CE
DATA OUT
VCC
SUPPLY
CURRENT
OE
DATA VALID
tHD
tSD
tPWE
tSA
tHA
tAW
tSCE
tWC
tHZOE
ADDRESS
CE
WE
DATA I/O
OE
NOTE
22
Notes
17.Device is continuously selected. OE, CE = VIL.
18.WE is HIGH for read cycles.
19.Address valid before or similar to CE transition LOW.
20.Data I/O is high impedance if OE = VIH.
21.If CE goes HIGH simultaneously with WE HIGH, the output remains in high impedance state.
22.During this period, the I/Os are in output state. Do not apply input signals.
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Figure 7. Write Cycle No. 2 (CE Controlled) [23, 24]
Figure 8. Write Cycle No. 3 (WE Controlled, OE LOW) [24]
Truth Table
CE WE OE I/O Mode Power
H[26] X X High Z Deselect/power-down Standby (ISB)
L H L Data out Read Active (ICC)
L H H High Z Output disabled Active (ICC)
L L X Data in Write Active (ICC)
Switching Waveforms (continued)
tWC
DATA VAL ID
tAW
tSA
tPWE
tHA
tHD
tSD
tSCE
ADDRESS
CE
DATA I/O
WE
DATA VALID
tHD
tSD
tLZWE
tPWE
tSA
tHA
tAW
tSCE
tWC
tHZWE
ADDRESS
CE
WE
DATA I/O
NOTE
25
Notes
23.Data I/O is high impedance if OE = VIH.
24.If CE goes HIGH simultaneously with WE HIGH, the output remains in high impedance state.
25.During this period, the I/Os are in output state. Do not apply input signals.
26.Chip enable (CE) must be HIGH at CMOS level to meet the ISB2 / ICCDR spec. Other inputs can be left floating.
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Ordering Information
Table 1 lists the CY62148 ESL MoBL key package features and ordering codes. The table co ntains only the parts that are currently
available. If you do not see what you are looking for, contact your local sales representative. For more information, visit the Cypress
website at www.cypress.com and refer to the product summary page at http://www.cypress.com/products.
Ordering Code Definitions
Tab le 1. Key features and Ordering Information
Speed
(ns) Ordering Code Package
Diagram Package Type Operating
Range
55 CY62148ESL-55ZAXI 51-85094 32-Pin STSOP (Pb-free) Industrial
CY62148ESL-55ZAXA 51-85094 32-Pin STSOP (Pb-free) Automotive -A
CY
Family: Low power SR A M
621 4 8
Dens ity = 4 Mbit
Company ID: CY = Cypress
E
Bus Width = x8
Process technology: 90-nm
SL
SL = Low power
55
Speed grade (55 ns)
ZAX
32-Pin STSOP (Pb-free)
I/A Temperature grad es:
I = Industrial
A = Automotive-A
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Acronyms Document Conventions
Units of Measure
Package Diagram
Figure 9. 32-Pin Shrunk Thin Small Outline Package (8 mm × 13.4 mm), 51-85094
51-85094-*E
Acronym Description
CMOS complementary metal oxide semiconductor
I/O input/output
MoBL more battery life
SRAM static random access memory
STSOP shrunk thin small outline package
Symbol Unit of Measure
ns nano seconds
Vvolts
µA micro ampe re s
mA milli amperes
pF pico Farad
°C degree Celsius
Wwatts
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Document History Page
Document Title: CY62148ESL MoBL® 4-Mbit (512 K × 8) Static RAM
Document Number: 001-50045
Revision ECN Orig. of
Change Submission
Date Description of Change
** 2612938 VKN/PYRS 01/21/09 New datasheet
*A 2800124 VKN 11/06/2009 Included Automotive-A information
*B 2947039 VKN 06/10/2010 Added footnote related to chip enable in Truth Table
Added footnote for the ISB2 parameter in Electrical Characteristics
Updated Package Diagram
Updated links in Sales, Solutions, and Legal Informatio n
*C 3006318 AJU 08/23/10 Template update.
Updated table of contents.
Added acronyms, units of measure and ordering code definitions.
Added reference to note 8 to parameter ISB1on page 4 under Electrical
characterisitics table.
Added reference to note 1 1 to parameter ICCDR on page 6 under data retention
characteristics table.
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Document #: 001-50045 Rev. *C Revised August 23, 2010 Page 13 of 13
MoBL is the re gistered tradema rk, and More Batte ry Life is the tr ademark of Cypress S emiconductor C orporation. All ot her product and co mpany names mentioned in th is document are the trademarks
of their respective holders.
CY62148ESL MoBL®
© Cypress Semicondu ctor Corpor ation, 2009-2010. The informatio n contai ned herei n is subject to chan ge without no tice. Cypress Semiconductor Corporation assumes no responsibility for the use of
any circuitry other than circuitry embodied in a Cypress product. Nor does it convey or imply any license under patent or other rights. Cypre ss pro duc ts are n ot war ran ted no r int end ed to be us ed for
medical, life supp or t, l if e savin g, cr it ical control or saf ety ap pl i cat ions, unless pursuant to an express writte n agreement with Cypress. Furthermore, Cyp ress doe s not author i ze its products for use as
critical components in life-support systems where a malfunction or failure may reasonably be expected to result in significant injury to the user. The inclusion of Cypress products in life-support systems
application implies that the manufacturer assumes all risk of such use and in doing so indemnifies Cypress against all charges.
Any Source Code (software and/or firmware) is owned by Cypress Semiconductor Corporation (Cypress) and is protected by and subject to worldwide patent protec tion (Unit ed States and fore ign),
United S t ates copyright laws and international treaty provis ions. Cyp ress he reby gr ant s to l icense e a pers onal, no n-excl usive , non-tr ansfer able license to copy, use, modify, create derivative works of,
and compile the Cypress Source Code and derivative works for the sole purpose of creating custom software and or firmware in support of licensee prod uct to be used only in conj unction with a Cypre ss
integrated circui t as specified in the applicab le agreement. Any r eproduction, mod ification, translati on, compilatio n, or represent ation of this Sour ce Code except a s specified abo ve is prohibit ed without
the express written permission of Cypress.
Disclaimer: CYPRESS MAKES NO WARRANTY OF ANY KIND, EXPRESS OR IMPLIED, WITH REGARD TO THIS MATERIAL, INCLUDING, BUT NOT LIMITED TO, THE IMPLIED WARRANTIES
OF MERCHANTABILITY AND FITNESS FOR A PARTICULAR PURPOS E. Cypress reserves the right to make changes without further notice to the materials de scribed herei n. Cypress doe s not
assume any liabil ity ar ising ou t of the a pplic ation or use o f any pr oduct or circ uit descri bed herein . Cypress d oes not a uthor ize its p roducts fo r use as critical componen ts in life-su pport systems whe re
a malfuncti on or failure may reason ably be expected to res ult in significant injury to the user. The inclusion of Cypress’ product in a life-support systems application implies that the manufacturer
assumes all risk of such use and in doing so indemnifies Cypress against all charges.
Use may be limited by and subject to the applicable Cypress software license agreement.
Sales, Solutions, and Legal Information
Worldwide Sales and Design Support
Cypress maintains a worldwide network of offices, solution centers, manufacturer’s representatives, and distributors. To find the office
closest to you, visit us at Cypress Locations.
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