Freescale Semiconductor
Data Sheet: Technical Data
Document Number: MCF52223
Rev. 3, 3/2011
© Freescale Semiconductor, Inc., 2011. All rights reserved.
Freescale reserves the right to change the detail specifications as may be required to permit
improvements in the design of its products.
MCF52223
LQFP–64
10 mm x 10 mm
MAPBGA–81
10 mm x 10 mm
LQFP–100
14 mm x 14 mm
The MCF52223 microcontroller family is a member of the
ColdFire® family of reduced instruction set computing
(RISC) microprocessors.
This document provides an overview of the 32-bit MCF52223
microcontroller, focusing on its highly integrated and diverse
feature set.
This 32-bit device is based on the Version 2 ColdFire core
operating at a frequency up to 80 MHz, offering high
performance and low power consumption. On-chip memories
connected tightly to the processor core include up to
256 Kbytes of flash memory and 32 Kbytes of static random
access memory (SRAM). On-chip modules include:
V2 ColdFire core delivering 76 MIPS (Dhrystone 2.1) at
80 MHz running from internal flash memory with Multiply
Accumulate (MAC) Unit and hardware divider
Universal Serial Bus On-The-Go (USBOTG)
USB Transceiver
Three universal asynchronous/synchronous
receiver/transmitters (UARTs)
Inter-integrated circuit (I2C™) bus interface module
Queued serial peripheral interface (QSPI) module
Eight-channel 12-bit fast analog-to-digital converter
(ADC)
Four-channel direct memory access (DMA) controller
Four 32-bit input capture/output compare timers with
DMA support (DTIM)
Four-channel general-purpose timer (GPT) capable of
input capture/output compare, pulse width modulation
(PWM), and pulse accumulation
Eight-channel/Four-channel, 8-bit/16-bit pulse width
modulation timer
Two 16-bit periodic interrupt timers (PITs)
Real-time clock (RTC) module
Programmable software watchdog timer
Interrupt controller capable of handling 57 sources
Clock module with 8 MHz on-chip relaxation oscillator
and integrated phase-locked loop (PLL)
Test access/debug port (JTAG, BDM)
MCF52223 ColdFire
Microcontroller
Supports MCF52223 and
MCF52221
MCF52223 ColdFire Microcontroller, Rev. 3
Freescale Semiconductor2
Table of Contents
1 Family Configurations . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .3
1.1 Block Diagram. . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .4
1.2 Features . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .5
1.3 Reset Signals . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .21
1.4 PLL and Clock Signals . . . . . . . . . . . . . . . . . . . . . . . . .21
1.5 Mode Selection . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .21
1.6 External Interrupt Signals . . . . . . . . . . . . . . . . . . . . . . .22
1.7 Queued Serial Peripheral Interface (QSPI). . . . . . . . . .22
1.8 USB On-the-Go. . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .22
1.9 I2C I/O Signals . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .22
1.10 UART Module Signals. . . . . . . . . . . . . . . . . . . . . . . . . .23
1.11 DMA Timer Signals . . . . . . . . . . . . . . . . . . . . . . . . . . . .23
1.12 ADC Signals . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .23
1.13 General Purpose Timer Signals . . . . . . . . . . . . . . . . . .24
1.14 Pulse Width Modulator Signals . . . . . . . . . . . . . . . . . . .24
1.15 Debug Support Signals. . . . . . . . . . . . . . . . . . . . . . . . .24
1.16 EzPort Signal Descriptions . . . . . . . . . . . . . . . . . . . . . .25
1.17 Power and Ground Pins . . . . . . . . . . . . . . . . . . . . . . . .26
2 Electrical Characteristics . . . . . . . . . . . . . . . . . . . . . . . . . . . .27
2.1 Maximum Ratings . . . . . . . . . . . . . . . . . . . . . . . . . . . . .27
2.2 Current Consumption . . . . . . . . . . . . . . . . . . . . . . . . . .28
2.3 Thermal Characteristics. . . . . . . . . . . . . . . . . . . . . . . . 30
2.4 Flash Memory Characteristics. . . . . . . . . . . . . . . . . . . 31
2.5 EzPort Electrical Specifications . . . . . . . . . . . . . . . . . . 32
2.6 ESD Protection . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 32
2.7 DC Electrical Specifications. . . . . . . . . . . . . . . . . . . . . 33
2.8 Clock Source Electrical Specifications . . . . . . . . . . . . 34
2.9 General Purpose I/O Timing . . . . . . . . . . . . . . . . . . . . 35
2.10 Reset Timing . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 35
2.11 I2C Input/Output Timing Specifications . . . . . . . . . . . . 36
2.12 Analog-to-Digital Converter (ADC) Parameters. . . . . . 37
2.13 Equivalent Circuit for ADC Inputs . . . . . . . . . . . . . . . . 38
2.14 DMA Timers Timing Specifications . . . . . . . . . . . . . . . 39
2.15 QSPI Electrical Specifications . . . . . . . . . . . . . . . . . . . 39
2.16 JTAG and Boundary Scan Timing . . . . . . . . . . . . . . . . 40
2.17 Debug AC Timing Specifications . . . . . . . . . . . . . . . . . 42
3 Mechanical Outline Drawings . . . . . . . . . . . . . . . . . . . . . . . . 43
3.1 64-pin LQFP Package . . . . . . . . . . . . . . . . . . . . . . . . . 44
3.2 81 MAPBGA Package . . . . . . . . . . . . . . . . . . . . . . . . . 50
3.3 100-pin LQFP Package . . . . . . . . . . . . . . . . . . . . . . . . 52
4 Revision History . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 54
MCF52223 ColdFire Microcontroller, Rev. 3
Family Configurations
Freescale Semiconductor3
1 Family Configurations
Table 1. MCF52223 Family Configurations
Module 52221 52223
ColdFire Version 2 Core with MAC (Multiply-Accumulate Unit) 
System Clock 66, 80 MHz
Performance (Dhrystone 2.1 MIPS) up to 76
Flash / Static RAM (SRAM) 128/16 Kbytes 256/32 Kbytes
Interrupt Controller (INTC) 
Fast Analog-to-Digital Converter (ADC) 
USB On-The-Go (USB OTG) 
Four-channel Direct-Memory Access (DMA) 
Software Watchdog Timer (WDT) 
Programmable Interrupt Timer 2 2
Four-Channel General Purpose Timer 
32-bit DMA Timers 4 4
QSPI 
UART(s) 3 3
I2C
Eight/Four-channel 8/16-bit PWM Timer 
General Purpose I/O Module (GPIO) 
Chip Configuration and Reset Controller Module 
Background Debug Mode (BDM) 
JTAG - IEEE 1149.1 Test Access Port1
1The full debug/trace interface is available only on the 100-pin packages. A reduced debug interface is
bonded on smaller packages.

Package 64 LQFP
81 MAPBGA
100 LQFP
81 MAPBGA
100 LQFP
Family Configurations
MCF52223 ColdFire Microcontroller, Rev. 3
Freescale Semiconductor 4
1.1 Block Diagram
Figure 1 shows a top-level block diagram of the device. Package options for this family are described later in this document.
Figure 1. Block Diagram
Arbiter Interrupt
Controller
UART
0QSPI
UART
1
UART
2I2C
DTIM
0
DTIM
1
DTIM
2
DTIM
3
V2 ColdFire CPU
IFP OEP MAC
4 CH DMA
MUX
JTAG
TAP
To/From PADI
32 Kbytes
SRAM
(4K16)4
256 Kbytes
Flash
(32K16)4
PORTS
(GPIO) CIM RSTI
RSTO
UTXDn
URXDn
URTSn
DTINn/DTOUTn
JTAG_EN
ADCAN[7:0]
VRH VRL
PLL OCO
CLKGEN
Edge
Port
USB OTG
EXTAL XTAL CLKOUT
PIT0 PIT1 GPT PWM
To/From Interrupt Controller
UCTSn
PMM
VSTBY
PADI – Pin Muxing
EzPort EzPCS
CLKMOD0 CLKMOD1
QSPI_CLK,
QSPI_CSn
PWMn
QSPI_DIN,
QSPI_DOUT
GPTn
EzPCK
EzPD
EzPQ
SWT
MCF52223 ColdFire Microcontroller, Rev. 3
Family Configurations
Freescale Semiconductor5
1.2 Features
1.2.1 Feature Overview
The MCF52223 family includes the following features:
Version 2 ColdFire variable-length RISC processor core
Static operation
32-bit address and data paths on-chip
Up to 80 MHz processor core frequency
Sixteen general-purpose, 32-bit data and address registers
Implements ColdFire ISA_A with extensions to support the user stack pointer register and four new instructions
for improved bit processing (ISA_A+)
Multiply-Accumulate (MAC) unit with 32-bit accumulator to support 1616 32 or 3232 32 operations
Illegal instruction decode that allows for 68-Kbyte emulation support
System debug support
Real-time trace for determining dynamic execution path
Background debug mode (BDM) for in-circuit debugging (DEBUG_B+)
Real-time debug support, with six hardware breakpoints (4 PC, 1 address and 1 data) configurable into a 1- or
2-level trigger
On-chip memories
32-Kbyte dual-ported SRAM on CPU internal bus, supporting core and DMA access with standby power supply
support
256 Kbytes of interleaved flash memory supporting 2-1-1-1 accesses
Power management
Fully static operation with processor sleep and whole chip stop modes
Rapid response to interrupts from the low-power sleep mode (wake-up feature)
Clock enable/disable for each peripheral when not used
Software controlled disable of external clock output for low-power consumption
Universal Serial Bus On-The-Go (USB OTG) dual-mode host and device controller
Full-speed / low-speed host controller
USB 1.1 and 2.0 compliant full-speed / low speed device controller
16 bidirectional end points
DMA or FIFO data stream interfaces
Low power consumption
OTG protocol logic
Three universal asynchronous/synchronous receiver transmitters (UARTs)
16-bit divider for clock generation
Interrupt control logic with maskable interrupts
DMA support
Data formats can be 5, 6, 7 or 8 bits with even, odd, or no parity
Up to two stop bits in 1/16 increments
Error-detection capabilities
Modem support includes request-to-send (RTS) and clear-to-send (CTS) lines for two UARTs
Transmit and receive FIFO buffers
•I
2C module
Family Configurations
MCF52223 ColdFire Microcontroller, Rev. 3
Freescale Semiconductor 6
Interchip bus interface for EEPROMs, LCD controllers, A/D converters, and keypads
Fully compatible with industry-standard I2C bus
Master and slave modes support multiple masters
Automatic interrupt generation with programmable level
Queued serial peripheral interface (QSPI)
Full-duplex, three-wire synchronous transfers
Up to four chip selects available
Master mode operation only
Programmable bit rates up to half the CPU clock frequency
Up to 16 pre-programmed transfers
Fast analog-to-digital converter (ADC)
Eight analog input channels
12-bit resolution
Minimum 1.125 s conversion time
Simultaneous sampling of two channels for motor control applications
Single-scan or continuous operation
Optional interrupts on conversion complete, zero crossing (sign change), or under/over low/high limit
Unused analog channels can be used as digital I/O
Four 32-bit timers with DMA support
12.5 ns resolution at 80 MHz
Programmable sources for clock input, including an external clock option
Programmable prescaler
Input capture capability with programmable trigger edge on input pin
Output compare with programmable mode for the output pin
Free run and restart modes
Maskable interrupts on input capture or output compare
DMA trigger capability on input capture or output compare
Four-channel general purpose timer
16-bit architecture
Programmable prescaler
Output pulse-widths variable from microseconds to seconds
Single 16-bit input pulse accumulator
Toggle-on-overflow feature for pulse-width modulator (PWM) generation
One dual-mode pulse accumulation channel
Pulse-width modulation timer
Operates as eight channels with 8-bit resolution or four channels with 16-bit resolution
Programmable period and duty cycle
Programmable enable/disable for each channel
Software selectable polarity for each channel
Period and duty cycle are double buffered. Change takes effect when the end of the current period is reached
(PWM counter reaches zero) or when the channel is disabled.
Programmable center or left aligned outputs on individual channels
Four clock sources (A, B, SA, and SB) provide for a wide range of frequencies
Emergency shutdown
Two periodic interrupt timers (PITs)
MCF52223 ColdFire Microcontroller, Rev. 3
Family Configurations
Freescale Semiconductor7
16-bit counter
Selectable as free running or count down
Real-Time Clock (RTC)
Maintains system time-of-day clock
Provides stopwatch and alarm interrupt functions
Software watchdog timer
32-bit counter
Low-power mode support
Clock generation features
Crystal, on-chip trimmed relaxation oscillator, or external oscillator reference options
Trimmed relaxation oscillator
Pre-divider capable of dividing the clock source frequency into the PLL reference frequency range
System can be clocked from PLL or directly from crystal oscillator or relaxation oscillator
Low power modes supported
—2
n (0 n15) low-power divider for extremely low frequency operation
Interrupt controller
Uniquely programmable vectors for all interrupt sources
Fully programmable level and priority for all peripheral interrupt sources
Seven external interrupt signals with fixed level and priority
Unique vector number for each interrupt source
Ability to mask any individual interrupt source or all interrupt sources (global mask-all)
Support for hardware and software interrupt acknowledge (IACK) cycles
Combinatorial path to provide wake-up from low-power modes
DMA controller
Four fully programmable channels
Dual-address transfer support with 8-, 16-, and 32-bit data capability, along with support for 16-byte (432-bit)
burst transfers
Source/destination address pointers that can increment or remain constant
24-bit byte transfer counter per channel
Auto-alignment transfers supported for efficient block movement
Bursting and cycle-steal support
Software-programmable DMA requests for the UARTs (3) and 32-bit timers (4)
Reset
Separate reset in and reset out signals
Seven sources of reset:
Power-on reset (POR)
External
–Software
Watchdog
Loss of clock
Loss of lock
Low-voltage detection (LVD)
Status flag indication of source of last reset
Chip configuration module (CCM)
System configuration during reset
Family Configurations
MCF52223 ColdFire Microcontroller, Rev. 3
Freescale Semiconductor 8
Selects one of six clock modes
Configures output pad drive strength
Unique part identification number and part revision number
General purpose I/O interface
Up to 56 bits of general purpose I/O
Bit manipulation supported via set/clear functions
Programmable drive strengths
Unused peripheral pins may be used as extra GPIO
JTAG support for system level board testing
1.2.2 V2 Core Overview
The version 2 ColdFire processor core is comprised of two separate pipelines decoupled by an instruction buffer. The two-stage
instruction fetch pipeline (IFP) is responsible for instruction-address generation and instruction fetch. The instruction buffer is
a first-in-first-out (FIFO) buffer that holds prefetched instructions awaiting execution in the operand execution pipeline (OEP).
The OEP includes two pipeline stages. The first stage decodes instructions and selects operands (DSOC); the second stage
(AGEX) performs instruction execution and calculates operand effective addresses, if needed.
The V2 core implements the ColdFire instruction set architecture revision A+ with support for a separate user stack pointer
register and four new instructions to assist in bit processing. Additionally, the core includes the multiply-accumulate (MAC)
unit for improved signal processing capabilities. The MAC implements a three-stage arithmetic pipeline, optimized for 16x16
bit operations, with support for one 32-bit accumulator. Supported operands include 16- and 32-bit signed and unsigned
integers, signed fractional operands, and a complete set of instructions to process these data types. The MAC provides support
for execution of DSP operations within the context of a single processor at a minimal hardware cost.
1.2.3 Integrated Debug Module
The ColdFire processor core debug interface is provided to support system debugging with low-cost debug and emulator
development tools. Through a standard debug interface, access to debug information and real-time tracing capability is provided
on 100-lead packages. This allows the processor and system to be debugged at full speed without the need for costly in-circuit
emulators.
The on-chip breakpoint resources include a total of nine programmable 32-bit registers: an address and an address mask register,
a data and a data mask register, four PC registers, and one PC mask register. These registers can be accessed through the
dedicated debug serial communication channel or from the processors supervisor mode programming model. The breakpoint
registers can be configured to generate triggers by combining the address, data, and PC conditions in a variety of single- or
dual-level definitions. The trigger event can be programmed to generate a processor halt or initiate a debug interrupt exception.
This device implements revision B+ of the ColdFire Debug Architecture.
The processors interrupt servicing options during emulator mode allow real-time critical interrupt service routines to be
serviced while processing a debug interrupt event. This ensures the system continues to operate even during debugging.
To support program trace, the V2 debug module provides processor status (PST[3:0]) and debug data (DDATA[3:0]) ports.
These buses and the PSTCLK output provide execution status, captured operand data, and branch target addresses defining
processor activity at the CPU’s clock rate. The device includes a new debug signal, ALLPST. This signal is the logical AND of
the processor status (PST[3:0]) signals and is useful for detecting when the processor is in a halted state (PST[3:0] = 1111).
The full debug/trace interface is available only on the 100-pin packages. However, every product features the dedicated debug
serial communication channel (DSI, DSO, DSCLK) and the ALLPST signal.
MCF52223 ColdFire Microcontroller, Rev. 3
Family Configurations
Freescale Semiconductor9
1.2.4 JTAG
The processor supports circuit board test strategies based on the Test Technology Committee of IEEE and the Joint Test Action
Group (JTAG). The test logic includes a test access port (TAP) consisting of a 16-state controller, an instruction register, and
three test registers (a 1-bit bypass register, a 112-bit boundary-scan register, and a 32-bit ID register). The boundary scan register
links the device’s pins into one shift register. Test logic, implemented using static logic design, is independent of the device
system logic.
The device implementation can:
Perform boundary-scan operations to test circuit board electrical continuity
Sample system pins during operation and transparently shift out the result in the boundary scan register
Bypass the device for a given circuit board test by effectively reducing the boundary-scan register to a single bit
Disable the output drive to pins during circuit-board testing
Drive output pins to stable levels
1.2.5 On-Chip Memories
1.2.5.1 SRAM
The dual-ported SRAM module provides a general-purpose 32-Kbyte memory block that the ColdFire core can access in a
single cycle. The location of the memory block can be set to any 32-Kbyte boundary within the 4-Gbyte address space. This
memory is ideal for storing critical code or data structures and for use as the system stack. Because the SRAM module is
physically connected to the processor's high-speed local bus, it can quickly service core-initiated accesses or
memory-referencing commands from the debug module.
The SRAM module is also accessible by the DMA. The dual-ported nature of the SRAM makes it ideal for implementing
applications with double-buffer schemes, where the processor and a DMA device operate in alternate regions of the SRAM to
maximize system performance.
1.2.5.2 Flash Memory
The ColdFire flash module (CFM) is a non-volatile memory (NVM) module that connects to the processors high-speed local
bus. The CFM is constructed with four banks of 32-Kbyte16-bit flash memory arrays to generate 256 Kbytes of 32-bit flash
memory. These electrically erasable and programmable arrays serve as non-volatile program and data memory. The flash
memory is ideal for program and data storage for single-chip applications, allowing for field reprogramming without requiring
an external high voltage source. The CFM interfaces to the ColdFire core through an optimized read-only memory controller
that supports interleaved accesses from the 2-cycle flash memory arrays. A backdoor mapping of the flash memory is used for
all program, erase, and verify operations, as well as providing a read datapath for the DMA. Flash memory may also be
programmed via the EzPort, which is a serial flash memory programming interface that allows the flash memory to be read,
erased and programmed by an external controller in a format compatible with most SPI bus flash memory chips.
1.2.6 Power Management
The device incorporates several low-power modes of operation entered under program control and exited by several external
trigger events. An integrated power-on reset (POR) circuit monitors the input supply and forces an MCU reset as the supply
voltage rises. The low voltage detector (LVD) monitors the supply voltage and is configurable to force a reset or interrupt
condition if it falls below the LVD trip point. The RAM standby switch provides power to RAM when the supply voltage to the
chip falls below the standby battery voltage.
Family Configurations
MCF52223 ColdFire Microcontroller, Rev. 3
Freescale Semiconductor 10
1.2.7 USB On-The-Go Controller
The device includes a Universal Serial Bus On-The-Go (USB OTG) dual-mode controller. USB is a popular standard for
connecting peripherals and portable consumer electronic devices such as digital cameras and handheld computers to host PCs.
The OTG supplement to the USB specification extends USB to peer-to-peer application, enabling devices to connect directly
to each other without the need for a PC. The dual-mode controller on the device can act as a USB OTG host and as a USB
device. It also supports full-speed and low-speed modes.
1.2.8 UARTs
The device has three full-duplex UARTs that function independently. The three UARTs can be clocked by the system bus clock,
eliminating the need for an external clock source. On smaller packages, the third UART is multiplexed with other digital I/O
functions.
1.2.9 I2C Bus
The I2C bus is an industry-standard, two-wire, bidirectional serial bus that provides a simple, efficient method of data exchange
and minimizes the interconnection between devices. This bus is suitable for applications requiring occasional communications
over a short distance between many devices.
1.2.10 QSPI
The queued serial peripheral interface (QSPI) provides a synchronous serial peripheral interface with queued transfer capability.
It allows up to 16 transfers to be queued at once, minimizing the need for CPU intervention between transfers.
1.2.11 Fast ADC
The fast ADC consists of an eight-channel input select multiplexer and two independent sample and hold (S/H) circuits feeding
separate 12-bit ADCs. The two separate converters store their results in accessible buffers for further processing.
The ADC can be configured to perform a single scan and halt, a scan when triggered, or a programmed scan sequence repeatedly
until manually stopped.
The ADC can be configured for sequential or simultaneous conversion. When configured for sequential conversions, up to eight
channels can be sampled and stored in any order specified by the channel list register. Both ADCs may be required during a
scan, depending on the inputs to be sampled.
During a simultaneous conversion, both S/H circuits are used to capture two different channels at the same time. This
configuration requires that a single channel may not be sampled by both S/H circuits simultaneously.
Optional interrupts can be generated at the end of the scan sequence if a channel is out of range (measures below the low
threshold limit or above the high threshold limit set in the limit registers) or at several different zero crossing conditions.
1.2.12 DMA Timers (DTIM0–DTIM3)
There are four independent, DMA transfer capable 32-bit timers (DTIM0, DTIM1, DTIM2, and DTIM3) on the device. Each
module incorporates a 32-bit timer with a separate register set for configuration and control. The timers can be configured to
operate from the system clock or from an external clock source using one of the DTINn signals. If the system clock is selected,
it can be divided by 16 or 1. The input clock is further divided by a user-programmable 8-bit prescaler that clocks the actual
timer counter register (TCRn). Each of these timers can be configured for input capture or reference (output) compare mode.
Timer events may optionally cause interrupt requests or DMA transfers.
MCF52223 ColdFire Microcontroller, Rev. 3
Family Configurations
Freescale Semiconductor11
1.2.13 General Purpose Timer (GPT)
The general purpose timer (GPT) is a four-channel timer module consisting of a 16-bit programmable counter driven by a
seven-stage programmable prescaler. Each of the four channels can be configured for input capture or output compare.
Additionally, channel three, can be configured as a pulse accumulator.
A timer overflow function allows software to extend the timing capability of the system beyond the 16-bit range of the counter.
The input capture and output compare functions allow simultaneous input waveform measurements and output waveform
generation. The input capture function can capture the time of a selected transition edge. The output compare function can
generate output waveforms and timer software delays. The 16-bit pulse accumulator can operate as a simple event counter or a
gated time accumulator.
1.2.14 Periodic Interrupt Timers (PIT0 and PIT1)
The two periodic interrupt timers (PIT0 and PIT1) are 16-bit timers that provide interrupts at regular intervals with minimal
processor intervention. Each timer can count down from the value written in its PIT modulus register or it can be a free-running
down-counter.
1.2.15 Real-Time Clock (RTC)
The Real-Time Clock (RTC) module maintains the system (time-of-day) clock and provides stopwatch, alarm, and interrupt
functions. It includes full clock features: seconds, minutes, hours, days and supports a host of time-of-day interrupt functions
along with an alarm interrupt.
1.2.16 Pulse-Width Modulation (PWM) Timers
The device has an 8-channel, 8-bit PWM timer. Each channel has a programmable period and duty cycle as well as a dedicated
counter. Each of the modulators can create independent continuous waveforms with software-selectable duty rates from 0% to
100%. The PWM outputs have programmable polarity, and can be programmed as left aligned outputs or center aligned outputs.
For higher period and duty cycle resolution, each pair of adjacent channels ([7:6], [5:4], [3:2], and [1:0]) can be concatenated
to form a single 16-bit channel. The module can, therefore, be configured to support 8/0, 6/1, 4/2, 2/3, or 0/4 8-/16-bit channels.
1.2.17 Software Watchdog Timer
The watchdog timer is a 32-bit timer that facilitates recovery from runaway code. The watchdog counter is a free-running
down-counter that generates a reset on underflow. To prevent a reset, software must periodically restart the countdown.
1.2.18 Phase-Locked Loop (PLL)
The clock module contains a crystal oscillator, 8 MHz on-chip relaxation oscillator (OCO), phase-locked loop (PLL), reduced
frequency divider (RFD), low-power divider status/control registers, and control logic. To improve noise immunity, the PLL,
crystal oscillator, and relaxation oscillator have their own power supply inputs: VDDPLL and VSSPLL. All other circuits are
powered by the normal supply pins, VDD and VSS.
1.2.19 Interrupt Controller (INTC)
The device has a single interrupt controller that supports up to 63 interrupt sources. There are 56 programmable sources, 49 of
which are assigned to unique peripheral interrupt requests. The remaining seven sources are unassigned and may be used for
software interrupt requests.
Family Configurations
MCF52223 ColdFire Microcontroller, Rev. 3
Freescale Semiconductor 12
1.2.20 DMA Controller
The direct memory access (DMA) controller provides an efficient way to move blocks of data with minimal processor
intervention. It has four channels that allow byte, word, longword, or 16-byte burst line transfers. These transfers are triggered
by software explicitly setting a DCRn[START] bit or by the occurrence of certain UART or DMA timer events.
1.2.21 Reset
The reset controller determines the source of reset, asserts the appropriate reset signals to the system, and keeps track of what
caused the last reset. There are seven sources of reset:
External reset input
Power-on reset (POR)
Watchdog timer
Phase locked-loop (PLL) loss of lock
PLL loss of clock
•Software
Low-voltage detector (LVD)
Control of the LVD and its associated reset and interrupt are managed by the reset controller. Other registers provide status flags
indicating the last source of reset and a control bit for software assertion of the RSTO pin.
1.2.22 GPIO
Nearly all pins on the device have general purpose I/O capability and are grouped into 8-bit ports. Some ports do not use all
eight bits. Each port has registers that configure, monitor, and control the port pin.
1.2.23 Part Numbers and Packaging
This product is RoHS-compliant. Refer to the product page at freescale.com or contact your sales office for up-to-date RoHS
information.
Table 3. Orderable Part Number Summary
Freescale Part
Number Description Speed
(MHz)
Flash/SRAM
(Kbytes) Package Temp range
(C)
MCF52221CAE66 MCF52221 Microcontroller 66 128/16 64 LQFP -40 to +85
MCF52221CVM66 MCF52221 Microcontroller 66 128/16 81 MAPBGA -40 to +85
MCF52221CAF66 MCF52221 Microcontroller 66 128/16 100 LQFP -40 to +85
MCF52221CVM80 MCF52221 Microcontroller 80 128/16 81 MAPBGA -40 to +85
MCF52221CAF80 MCF52221 Microcontroller 80 128/16 100 LQFP -40 to +85
MCF52223CVM66 MCF52223 Microcontroller 66 128/16 81 MAPBGA -40 to +85
MCF52223CAF66 MCF52223 Microcontroller 66 128/16 100 LQFP -40 to +85
MCF52223CVM80 MCF52223 Microcontroller 80 128/16 81 MAPBGA -40 to +85
MCF52223CAF80 MCF52223 Microcontroller 80 128/16 100 LQFP -40 to +85
MCF52223 ColdFire Microcontroller, Rev. 3
Family Configurations
Freescale Semiconductor13
Figure 5 shows the pinout configuration for the 100 LQFP.
Figure 2. 100 LQFP Pin Assignments
AN5
1
2
3
4
5
6
7
8
9
10
11
12
13
14
15
16
17
18
19
20
21
22
23
24
25
VDD
VDD
VSS
URTS1
TEST
UCTS0
UTXD0
URTS0
SCL
SDA
QSPI_CS3
QSPI_CS2
VDD
VSS
QSPI-DIN
QSPI_DOUT
QSPI_CLK
QSPI_CS1
QSPI_CS0
RCON
VDD
VDD
VSS
100 LQFP
75
74
73
72
71
70
69
68
67
66
65
64
63
62
61
60
59
58
57
56
55
54
53
52
51
VSS
VDDPLL
EXTAL
XTAL
VSSPLL
PST3
PST2
VDD
VSS
PST1
PST0
PSTCLK
GPT3
VDDUSB
USB_DM
USB_DP
VSSUSB
GPT2
VDD
VSS
VSTBY
AN6
AN7
100
99
98
97
96
95
94
93
92
91
90
89
88
87
86
85
84
83
82
81
80
79
78
77
76
URXD1
UTXD1
UCTS1
RSTO
RSTI
IRQ7
IRQ6
VDD
VSS
IRQ5
IRQ4
IRQ3
IRQ2
IRQ1
ALLPST
DDATA3
DDATA2
VSS
VDD
DSO
DSI
DDATA1
DDATA0
BKPT
26
27
28
29
30
31
32
33
34
35
36
37
38
39
40
41
42
43
44
45
46
47
48
49
50
JTAG_EN
UCTS2
URXD2
UTXD2
URTS2
DTIN2
DTIN3
GPT1
VDD
VSS
DTIN0
DTIN1
GPT0
CLKMOD1
CLKMOD0
VDD
VSS
AN0
AN1
AN2
AN3
VSSA
VRL
VRH
VDDA
VSS
URXD0
AN4
DSCLK
Family Configurations
MCF52223 ColdFire Microcontroller, Rev. 3
Freescale Semiconductor 14
Figure 4 shows the pinout configuration for the 81 MAPBGA.
Figure 3. 81 MAPBGA Pin Assignments
V
SS
UTXD1 RSTI IRQ5 IRQ3 ALLPST TDO TMS V
SS
A
123456789
URTS1 URXD1 RSTO IRQ6 IRQ2 TRST TDI V
DD
PLL EXTALB
UCTS0 TEST UCTS1 IRQ7 IRQ4 IRQ1 TCLK V
SS
PLL XTALC
URXD0 UTXD0 URTS0 V
SS
V
DD
V
SS
PWM7 GPT3 GPT2D
SCL SDA V
DD
V
DD
V
DD
V
DD
V
DD
PWM5 GPT1E
QSPI_CS3 QSPI_CS2 QSPI_DIN V
SS
V
DD
V
SS
GPT0 V
STBY
AN4F
QSPI_DOUT QSPI_CLK RCON DTIN1 CLKMOD0 AN2 AN3 AN5 AN6G
QSPI_CS0 QSPI_CS1 DTIN3 DTIN0 CLKMOD1 AN1 V
SSA
V
DDA
AN7H
V
SS
JTAG_EN DTIN2 PWM3 PWM1 AN0 V
RL
V
RH
V
SSA
J
MCF52223 ColdFire Microcontroller, Rev. 3
Family Configurations
Freescale Semiconductor15
Figure 4. 81 MAPBGA Pin Assignments
V
SS
UTXD1 RSTI IRQ5 IRQ3 ALLPST TDO TMS V
SS
A
123456789
URTS1 URXD1 RSTO IRQ6 IRQ2 TRST TDI V
DD
PLL EXTALB
UCTS0 TEST UCTS1 IRQ7 IRQ4 IRQ1 TCLK V
SS
PLL XTALC
URXD0 UTXD0 URTS0 V
SS
V
DD
V
SS
GPT3 V
DD
USB USB_DMD
SCL SDA V
DD
V
DD
V
DD
V
DD
V
DD
GPT2 USB_DPE
QSPI_CS3 QSPI_CS2 QSPI_DIN V
SS
V
DD
V
SS
V
SS
USB V
STBY
AN4F
QSPI_DOUT QSPI_CLK RCON DTIN1 CLKMOD0 AN2 AN3 AN5 AN6G
QSPI_CS0 QSPI_CS1 DTIN3 DTIN0 CLKMOD1 AN1 V
SSA
V
DDA
AN7H
V
SS
JTAG_EN DTIN2 GPT1 GPT0 AN0 V
RL
V
RH
V
SSA
J
Family Configurations
MCF52223 ColdFire Microcontroller, Rev. 3
Freescale Semiconductor 16
Table 13 shows the pin functions by primary and alternate purpose, and illustrates which packages contain each pin.
Table 4. Pin Functions by Primary and Alternate Purpose
Pin
Group
Primary
Function
Secondary
Function
Tertiary
Function
Quaternary
Function
Drive
Strength /
Control1
Slew Rate /
Control1
Pull-up /
Pull-down2
Pin on
100 LQFP
Pin on 81
MAPBGA
Pin on 64
LQFP
ADC AN7 GPIO Low FAST 51 H9 33
AN6 GPIO Low FAST 52 G9 34
AN5 GPIO Low FAST 53 G8 35
AN4 GPIO Low FAST 54 F9 36
AN3 GPIO Low FAST 46 G7 28
AN2 GPIO Low FAST 45 G6 27
AN1 GPIO Low FAST 44 H6 26
AN0 GPIO Low FAST 43 J6 25
SYNCA3 N/AN/A———
SYNCB3 N/AN/A———
VDDA N/A N/A 50 H8 32
VSSA N/A N/A 47 H7, J9 29
VRH N/A N/A 49 J8 31
VRL N/A N/A 48 J7 30
Clock
Generation
EXTAL N/A N/A 73 B9 47
XTAL N/A N/A 72 C9 46
VDDPLL N/A N/A 74 B8 48
VSSPLL N/A N/A 71 C8 45
Debug Data ALLPST High FAST 86 A6 55
DDATA[3:0] GPIO High FAST 84,83,78,77
PST[3:0] GPIO High FAST 70,69,66,65
I2C SCL USB_DMI UTXD2 GPIO PDSR[0] PSRR[0] pull-up410 E1 8
SDA USB_DPI URXD2 GPIO PDSR[0] PSRR[0] pull-up411 E2 9
MCF52223 ColdFire Microcontroller, Rev. 3
Freescale Semiconductor17
Family Configurations
Interrupts IRQ7 GPIOLowFAST95C458
IRQ6 GPIO Low FAST 94 B4
IRQ5 GPIO Low FAST 91 A4
IRQ4 GPIOLowFAST90C557
IRQ3 GPIO Low FAST 89 A5
IRQ2 GPIO Low FAST 88 B5
IRQ1 SYNCA USB_ALT_CL
K
GPIO High FAST pull-up487 C6 56
JTAG/BDM JTAG_EN N/A N/A pull-down 26 J2 17
TCLK/
PSTCLK
CLKOUT High FAST pull-up564 C7 44
TDI/DSI N/A N/A pull-up579 B7 50
TDO/DSO HighFAST—80A751
TMS
/BKPT
N/A N/A pull-up576 A8 49
TRST
/DSCLK
N/A N/A pull-up585 B6 54
Mode
Selection6
CLKMOD0 N/A N/A pull-down640 G5 24
CLKMOD1 N/A N/A pull-down639 H5
RCON/
EZPCS
N/A N/A pull-up 21 G3 16
Table 4. Pin Functions by Primary and Alternate Purpose (continued)
Pin
Group
Primary
Function
Secondary
Function
Tertiary
Function
Quaternary
Function
Drive
Strength /
Control1
Slew Rate /
Control1
Pull-up /
Pull-down2
Pin on
100 LQFP
Pin on 81
MAPBGA
Pin on 64
LQFP
Family Configurations
MCF52223 ColdFire Microcontroller, Rev. 3
Freescale Semiconductor 18
QSPI QSPI_DIN/
EZPD
URXD1 GPIO PDSR[2] PSRR[2] 16 F3 12
QSPI_DOUT/
EZPQ
UTXD1 GPIO PDSR[1] PSRR[1] 17 G1 13
QSPI_CLK/
EZPCK
SCL URTS1 GPIO PDSR[3] PSRR[3] pull-up818 G2 14
QSPI_CS3 SYNCA GPIO PDSR[7] PSRR[7] pull-up/pull-
down7
12 F1
QSPI_CS2 GPIO PDSR[6] PSRR[6] pull-up/pull-
down7
13 F2
QSPI_CS1 GPIO PDSR[5] PSRR[5] 19 H2
QSPI_CS0 SDA UCTS1 GPIO PDSR[4] PSRR[4] pull-up820 H1 15
Reset9RSTI N/A N/A pull-up996 A3 59
RSTO highFAST—97B360
Test TEST N/A N/A pull-down 5 C2 3
Timers, 16-bit GPT3 PWM7 GPIO PDSR[23] PSRR[23] pull-up10 63
GPT2 PWM5 GPIO PDSR[22] PSRR[22] pull-up10 58 E8
GPT1 PWM3 GPIO PDSR[21] PSRR[21] pull-up10 33 J4
GPT0 PWM1 GPIO PDSR[20] PSRR[20] pull-up10 38 J5
Timers, 32-bit DTIN3 DTOUT3 PWM6 GPIO PDSR[19] PSRR[19] 32 H3 19
DTIN2 DTOUT2 PWM4 GPIO PDSR[18] PSRR[18] 31 J3 18
DTIN1 DTOUT1 PWM2 GPIO PDSR[17] PSRR[17] 37 G4 23
DTIN0 DTOUT0 PWM0 GPIO PDSR[16] PSRR[16] 36 H4 22
UART 0 UCTS0 GPIO PDSR[11] PSRR[11] 6 C1 4
URTS0 GPIO PDSR[10] PSRR[10] 9 D3 7
URXD0 GPIO PDSR[9] PSRR[9] 7 D1 5
UTXD0 GPIO PDSR[8] PSRR[8] 8 D2 6
Table 4. Pin Functions by Primary and Alternate Purpose (continued)
Pin
Group
Primary
Function
Secondary
Function
Tertiary
Function
Quaternary
Function
Drive
Strength /
Control1
Slew Rate /
Control1
Pull-up /
Pull-down2
Pin on
100 LQFP
Pin on 81
MAPBGA
Pin on 64
LQFP
MCF52223 ColdFire Microcontroller, Rev. 3
Freescale Semiconductor19
Family Configurations
UART 1 UCTS1 SYNCA URXD2 GPIO PDSR[15] PSRR[15] 98 C3 61
URTS1 SYNCB UTXD2 GPIO PDSR[14] PSRR[14] 4 B1 2
URXD1 GPIO PDSR[13] PSRR[13] 100 B2 63
UTXD1 GPIO PDSR[12] PSRR[12] 99 A2 62
UART 2 UCTS2 GPIO PDSR[27] PSRR[27] 27
URTS2 GPIO PDSR[26] PSRR[26] 30
URXD2 GPIO PDSR[25] PSRR[25] 28
UTXD2 GPIO PDSR[24] PSRR[24] 29
VSTBY VSTBY N/A N/A 55 F8 37
USB VDDUSB N/A N/A 62 D8 43
VSSUSB N/A N/A 59 F7 40
USB_DM N/A N/A 61 D9 42
USB_DP N/A N/A 60 E9 41
VDD VDD N/A N/A 1,2,14,22,
23,34,41,
57,68,81,93
D5,E3–E7,
F5
1,10,20,39,5
2
VSS VSS N/A N/A 3,15,24,25,3
5,42,56,
67,75,82,92
A1,A9,D4,D
6,F4,F6,J1
11,21,38,
53,64
1The PDSR and PSSR registers are described in the General Purpose I/O chapter. All programmable signals default to 2 mA drive and FAST slew rate in
normal (single-chip) mode.
2All signals have a pull-up in GPIO mode.
3These signals are multiplexed on other pins.
4For primary and GPIO functions only.
5Only when JTAG mode is enabled.
6CLKMOD0 and CLKMOD1 have internal pull-down resistors; however, the use of external resistors is very strongly recommended.
7When these pins are configured for USB signals, they should use the USB transceiver’s internal pull-up/pull-down resistors (see the description of the
OTG_CTRL register). If these pins are not configured for USB signals, each pin should be pulled down externally using a 10 k resistor.
8For secondary and GPIO functions only.
9RSTI has an internal pull-up resistor; however, the use of an external resistor is very strongly recommended.
10 For GPIO function. Primary Function has pull-up control within the GPT module.
Table 4. Pin Functions by Primary and Alternate Purpose (continued)
Pin
Group
Primary
Function
Secondary
Function
Tertiary
Function
Quaternary
Function
Drive
Strength /
Control1
Slew Rate /
Control1
Pull-up /
Pull-down2
Pin on
100 LQFP
Pin on 81
MAPBGA
Pin on 64
LQFP
MCF52223 ColdFire Microcontroller, Rev. 3
Freescale Semiconductor20
Family Configurations
Family Configurations
MCF52223 ColdFire Microcontroller, Rev. 3
Freescale Semiconductor 21
1.3 Reset Signals
Table 5 describes signals used to reset the chip or as a reset indication.
1.4 PLL and Clock Signals
Table 6 describes signals used to support the on-chip clock generation circuitry.
1.5 Mode Selection
Table 7 describes signals used in mode selection; Table 8 describes the particular clocking modes.
Table 5. Reset Signals
Signal Name Abbreviation Function I/O
Reset In RSTI Primary reset input to the device. Asserting RSTI for at least 8 CPU
clock cycles immediately resets the CPU and peripherals.
I
Reset Out RSTO Driven low for 1024 CPU clocks after the reset source has deasserted. O
Table 6. PLL and Clock Signals
Signal Name Abbreviation Function I/O
External Clock In EXTAL Crystal oscillator or external clock input except when the on-chip
relaxation oscillator is used.
I
Crystal XTAL Crystal oscillator output except when CLKMOD0=0, then sampled as
part of the clock mode selection mechanism.
O
Clock Out CLKOUT This output signal reflects the internal system clock. O
Table 7. Mode Selection Signals
Signal Name Abbreviation Function I/O
Clock Mode Selection CLKMOD[1:0] Selects the clock boot mode. I
Reset Configuration RCON The Serial Flash Programming mode is entered by asserting the
RCON pin (with the TEST pin negated) as the chip comes out of
reset. During this mode, the EzPort has access to the flash memory
which can be programmed from an external device.
Test TEST Reserved for factory testing only and in normal modes of operation
should be connected to VSS to prevent unintentional activation of
test functions.
I
Table 8. Clocking Modes
CLKMOD[1:0] XTAL Configure the clock mode.
00 0 PLL disabled, clock driven by external oscillator
00 1 PLL disabled, clock driven by on-chip oscillator
01 N/A PLL disabled, clock driven by crystal
10 0 PLL in normal mode, clock driven by external oscillator1
10 1 Reserved2
11 N/A PLL in normal mode, clock driven by crystal1
MCF52223 ColdFire Microcontroller, Rev. 3
Family Configurations
Freescale Semiconductor22
1.6 External Interrupt Signals
Table 9 describes the external interrupt signals.
1.7 Queued Serial Peripheral Interface (QSPI)
Table 10 describes the QSPI signals.
1.8 USB On-the-Go
This device is compliant with industry standard USB 2.0 specification.
1.9 I2C I/O Signals
Table 11 describes the I2C serial interface module signals.
1The PLL pre-divider (CCHR+1) reset value is 6 and the PLL input reference range is 2–10 MHz,
so in order to boot with the PLL enabled, the external clock or crystal frequency needs to be
greater than 12 MHz. MCF5222x devices cannot boot with PLL enabled from an external clock
or crystal oscillator with frequency less than 12 MHz. This constraint does not apply to booting
with PLL disabled.
2Cannot boot from the Internal 8 MHz Relaxation oscillator with the PLL enabled. Refer Note1.
Thus this mode has been removed from the table.
Table 9. External Interrupt Signals
Signal Name Abbreviation Function I/O
External Interrupts IRQ[7:1] External interrupt sources. I
Table 10. Queued Serial Peripheral Interface (QSPI) Signals
Signal Name Abbreviation Function I/O
QSPI Synchronous
Serial Output
QSPI_DOUT Provides the serial data from the QSPI and can be programmed to be
driven on the rising or falling edge of QSPI_CLK.
O
QSPI Synchronous
Serial Data Input
QSPI_DIN Provides the serial data to the QSPI and can be programmed to be
sampled on the rising or falling edge of QSPI_CLK.
I
QSPI Serial Clock QSPI_CLK Provides the serial clock from the QSPI. The polarity and phase of
QSPI_CLK are programmable.
O
Synchronous Peripheral
Chip Selects
QSPI_CS[3:0] QSPI peripheral chip select; can be programmed to be active high or
low.
O
Table 11. I2C I/O Signals
Signal Name Abbreviation Function I/O
Serial Clock SCLn Open-drain clock signal for the for the I2C interface. When the bus is
In master mode, this clock is driven by the I2C module; when the bus
is in slave mode, this clock becomes the clock input.
I/O
Serial Data SDAn Open-drain signal that serves as the data input/output for the I2C
interface.
I/O
Family Configurations
MCF52223 ColdFire Microcontroller, Rev. 3
Freescale Semiconductor 23
1.10 UART Module Signals
Table 12 describes the UART module signals.
1.11 DMA Timer Signals
Table 13 describes the signals of the four DMA timer modules.
1.12 ADC Signals
Table 14 describes the signals of the Analog-to-Digital Converter.
Table 12. UART Module Signals
Signal Name Abbreviation Function I/O
Transmit Serial Data
Output
UTXDnTransmitter serial data outputs for the UART modules. The output is
held high (mark condition) when the transmitter is disabled, idle, or in
the local loopback mode. Data is shifted out, LSB first, on this pin at
the falling edge of the serial clock source.
O
Receive Serial Data
Input
URXDnReceiver serial data inputs for the UART modules. Data is received on
this pin LSB first. When the UART clock is stopped for power-down
mode, any transition on this pin restarts the clock.
I
Clear-to-Send UCTSnIndication to the UART modules that they can begin data
transmission.
I
Request-to-Send URTSnAutomatic request-to-send outputs from the UART modules. This
signal can also be configured to be asserted and negated as a
function of the RxFIFO level.
O
Table 13. DMA Timer Signals
Signal Name Abbreviation Function I/O
DMA Timer Input DTIN Event input to the DMA timer modules. I
DMA Timer Output DTOUT Programmable output from the DMA timer modules. O
Table 14. ADC Signals
Signal Name Abbreviation Function I/O
Analog Inputs AN[7:0] Inputs to the analog-to-digital converter. I
Analog Reference VRH Reference voltage high and low inputs. I
VRL I
Analog Supply VDDA Isolate the ADC circuitry from power supply noise.
VSSA
ADC Sync Inputs SYNCA /
SYNCB
These signals can initiate an analog-to-digital conversion
process.
I
Family Configurations
MCF52223 ColdFire Microcontroller, Rev. 3
Freescale Semiconductor 24
1.13 General Purpose Timer Signals
Table 15 describes the general purpose timer signals.
1.14 Pulse Width Modulator Signals
Table 16 describes the PWM signals.
1.15 Debug Support Signals
These signals are used as the interface to the on-chip JTAG controller and the BDM logic.
Table 15. GPT Signals
Signal Name Abbreviation Function I/O
General Purpose Timer
Input/Output
GPT[3:0] Inputs to or outputs from the general purpose timer module. I/O
Table 16. PWM Signals
Signal Name Abbreviation Function I/O
PWM Output Channels PWM[7:0] Pulse width modulated output for PWM channels. O
Table 17. Debug Support Signals
Signal Name Abbreviation Function I/O
JTAG Enable JTAG_EN Select between debug module and JTAG signals at reset. I
Test Reset TRST This active-low signal is used to initialize the JTAG logic
asynchronously.
I
Test Clock TCLK Used to synchronize the JTAG logic. I
Test Mode Select TMS Used to sequence the JTAG state machine. TMS is sampled on the
rising edge of TCLK.
I
Test Data Input TDI Serial input for test instructions and data. TDI is sampled on the rising
edge of TCLK.
I
Test Data Output TDO Serial output for test instructions and data. TDO is tri-stateable and is
actively driven in the shift-IR and shift-DR controller states. TDO
changes on the falling edge of TCLK.
O
Development Serial
Clock
DSCLK Development Serial Clock - Internally synchronized input. (The logic
level on DSCLK is validated if it has the same value on two
consecutive rising bus clock edges.) Clocks the serial communication
port to the debug module during packet transfers. Maximum frequency
is PSTCLK/5. At the synchronized rising edge of DSCLK, the data
input on DSI is sampled and DSO changes state.
I
Breakpoint BKPT Breakpoint - Input used to request a manual breakpoint. Assertion of
BKPT puts the processor into a halted state after the current
instruction completes. Halt status is reflected on processor
status/debug data signals (PST[3:0] and PSTDDATA[7:0]) as the
value 0xF. If CSR[BKD] is set (disabling normal BKPT functionality),
asserting BKPT generates a debug interrupt exception in the
processor.
I
MCF52223 ColdFire Microcontroller, Rev. 3
Family Configurations
Freescale Semiconductor25
1.16 EzPort Signal Descriptions
Table 18 contains a list of EzPort external signals.
Development Serial
Input
DSI Development Serial Input - Internally synchronized input that provides
data input for the serial communication port to the debug module, after
the DSCLK has been seen as high (logic 1).
I
Development Serial
Output
DSO Development Serial Output - Provides serial output communication for
debug module responses. DSO is registered internally. The output is
delayed from the validation of DSCLK high.
O
Debug Data DDATA[3:0] Display captured processor data and breakpoint status. The CLKOUT
signal can be used by the development system to know when to
sample DDATA[3:0].
O
Processor Status Clock PSTCLK Processor Status Clock - Delayed version of the processor clock. Its
rising edge appears in the center of valid PST and DDATA output.
PSTCLK indicates when the development system should sample PST
and DDATA values.
If real-time trace is not used, setting CSR[PCD] keeps PSTCLK, and
PST and DDATA outputs from toggling without disabling triggers.
Non-quiescent operation can be reenabled by clearing CSR[PCD],
although the external development systems must resynchronize with
the PST and DDATA outputs.
PSTCLK starts clocking only when the first non-zero PST value (0xC,
0xD, or 0xF) occurs during system reset exception processing.
O
Processor Status
Outputs
PST[3:0] Indicate core status. Debug mode timing is synchronous with the
processor clock; status is unrelated to the current bus transfer. The
CLKOUT signal can be used by the development system to know
when to sample PST[3:0].
O
All Processor Status
Outputs
ALLPST Logical AND of PST[3:0]. The CLKOUT signal can be used by the
development system to know when to sample ALLPST.
O
Table 18. EzPort Signal Descriptions
Signal Name Abbreviation Function I/O
EzPort Clock EZPCK Shift clock for EzPort transfers. I
EzPort Chip Select EZPCS Chip select for signalling the start and end of
serial transfers.
I
EzPort Serial Data In EZPD EZPD is sampled on the rising edge of
EZPCK.
I
EzPort Serial Data Out EZPQ EZPQ transitions on the falling edge of
EZPCK.
O
Table 17. Debug Support Signals (continued)
Signal Name Abbreviation Function I/O
Family Configurations
MCF52223 ColdFire Microcontroller, Rev. 3
Freescale Semiconductor 26
1.17 Power and Ground Pins
The pins described in Table 19 provide system power and ground to the chip. Multiple pins are provided for adequate current
capability. All power supply pins must have adequate bypass capacitance for high-frequency noise suppression.
Table 19. Power and Ground Pins
Signal Name Abbreviation Function
PLL Analog Supply VDDPLL,
VSSPLL
Dedicated power supply signals to isolate the sensitive PLL analog
circuitry from the normal levels of noise present on the digital power
supply.
USB Power Supply VDDUSB This pin supplies power to the USB Module.
USB Ground Supply VSSUSB This pin is the negative (ground) supply pin for the USB Module.
Positive Supply VDD These pins supply positive power to the core logic.
Ground VSS This pin is the negative supply (ground) to the chip.
MCF52223 ColdFire Microcontroller, Rev. 3
Electrical Characteristics
Freescale Semiconductor27
2 Electrical Characteristics
This section contains electrical specification tables and reference timing diagrams for the microcontroller unit, including
detailed information on power considerations, DC/AC electrical characteristics, and AC timing specifications.
NOTE
The parameters specified in this data sheet supersede any values found in the module
specifications.
2.1 Maximum Ratings
Table 20. Absolute Maximum Ratings1, 2
1Functional operating conditions are given in DC Electrical Specifications. Absolute Maximum Ratings
are stress ratings only, and functional operation at the maxima is not guaranteed. Stress beyond
those listed may affect device reliability or cause permanent damage to the device.
2This device contains circuitry protecting against damage due to high static voltage or electrical fields;
however, it is advised that normal precautions be taken to avoid application of any voltages higher
than maximum-rated voltages to this high-impedance circuit. Reliability of operation is enhanced if
unused inputs are tied to an appropriate logic voltage level (VSS or VDD).
Rating Symbol Value Unit
Supply voltage VDD –0.3 to 4.0 V
Clock synthesizer supply voltage VDDPLL –0.3 to 4.0 V
RAM standby supply voltage VSTBY –0.3 to 4.0 V
USB standby supply voltage VDDUSB –0.3 to 4.0 V
Digital input voltage 3
3Input must be current limited to the IDD value specified. To determine the value of the required
current-limiting resistor, calculate resistance values for positive and negative clamp voltages, then
use the larger of the two values.
VIN –0.3 to 4.0 V
EXTAL pin voltage VEXTAL 0 to 3.3 V
XTAL pin voltage VXTAL 0 to 3.3 V
Instantaneous maximum current
Single pin limit (applies to all pins)4, 5
4All functional non-supply pins are internally clamped to VSS and VDD.
5The power supply must maintain regulation within operating VDD range during instantaneous and
operating maximum current conditions. If positive injection current (Vin > VDD) is greater than IDD, the
injection current may flow out of VDD and could result in the external power supply going out of
regulation. Ensure that the external VDD load shunts current greater than maximum injection current.
This is the greatest risk when the MCU is not consuming power (e.g., no clock).
IDD 25 mA
Operating temperature range (packaged) TA
(TL - TH)
–40 to 856
6Depending on the packaging; see the orderable part number summary.
C
Storage temperature range Tstg –65 to 150 C
Electrical Characteristics
MCF52223 ColdFire Microcontroller, Rev. 3
Freescale Semiconductor 28
2.2 Current Consumption
Table 21, Table 22, and Figure 5 show the typical current consumption in low-power modes.
Table 21. Current Consumption in Low-Power Mode, Code From Flash Memory1,2,3
1All values are measured with a 3.30V power supply. Tests performed at room temperature.
2Refer to the Power Management chapter in the MCF52223 Reference Manual for more information on
low-power modes.
3CLKOUT, PST/DDATA signals, and all peripheral clocks except UART0 and CFM off before entering
low-power mode. CLKOUT is disabled.
Mode 8 MHz (Typ) 16 MHz (Typ) 64 MHz (Typ) 80 MHz (Typ) Units
Stop mode 3 (Stop 11)4
4See the description of the Low-Power Control Register (LPCR) in the MCF52223 Reference Manual for
more information on stop modes 0–3.
0.070 mA
Stop mode 2 (Stop 10)42.9
Stop mode 1 (Stop 01)4,5
5Results are identical to STOP 00 for typical values because they only differ by CLKOUT power
consumption. CLKOUT is already disabled in this instance prior to entering low-power mode.
3.6 3.9 6 6.7
Stop mode 0 (Stop 00)53.6 3.9 6 6.7
Wait / Doze 13 23 38 44
Run TBD TBD TBD TBD
Table 22. Current Consumption in Low-Power Mode, Code From SRAM1,2,3
1All values are measured with a 3.30V power supply. Tests performed at room temperature.
2Refer to the Power Management chapter in the MCF52223 Reference Manual for more information on
low-power modes.
3CLKOUT, PST/DDATA signals, and all peripheral clocks except UART0 off before entering low-power
mode. CLKOUT is disabled. Code executed from SRAM with flash memory shut off by writing 0x0 to the
FLASHBAR register.
Mode 8 MHz (Typ) 16 MHz (Typ) 64 MHz (Typ) 80 MHz (Typ) Units
Stop mode 3 (Stop 11)4
4See the description of the Low-Power Control Register (LPCR) in the MCF52223 Reference Manual for
more information on stop modes 0–3.
0.010 mA
Stop mode 2 (Stop 10)42.7
Stop mode 1 (Stop 01)4,5
5Results are identical to STOP 00 for typical values because they only differ by CLKOUT power
consumption. CLKOUT is already disabled in this instance prior to entering low-power mode.
3.43.75.86.5
Stop mode 0 (Stop 00)53.43.75.86.5
Wait / Doze 6 8 22 27
Run 7 11 33 41
MCF52223 ColdFire Microcontroller, Rev. 3
Electrical Characteristics
Freescale Semiconductor29
Figure 5. Plot of Current Consumption in Low-Power Modes
Table 23. Typical Active Current Consumption Specifications
Characteristic Symbol
Typical1
Active
(SRAM)
1Tested at room temperature with CPU polling a status register. All clocks were off except the UART and CFM (when
running from flash memory).
Typical1
Active
(Flash)
Peak2
Active
(Flash)
2Peak current measured with all modules active, CPU polling a status register, and default drive strength with matching
load.
Unit
8 MHz core & I/O IDD 81118mA
16 MHz core & I/O 11 19 33
64 MHz core & I/O 35 44 82
80 MHz core & I/O 43 52 98
RAM standby supply current
Normal operation: VDD > VSTBY - 0.3 V
Transient condition: VSTBY - 0.3 V > VDD > VSS + 0.5 V
Standby operation: VDD < VSS + 0.5 V
ISTBY
0.4
TBD
16
A
Analog supply current
Normal operation
Standby mode
Powered down
IDDA
2(see note 3)
3Tested using Auto Power Down (APD), which powers down the ADC between conversions; ADC running at 4 MHz in
Once Parallel mode with a sample rate of 3 kHz.
13
TBD
0
mA
USB supply current IDDUSB 2mA
PLL supply current IDDPLL 6(see note 4)
4Tested with the PLL MFD set to 7 (max value). Setting the MFD to a lower value results in lower current consumption.
mA
Electrical Characteristics
MCF52223 ColdFire Microcontroller, Rev. 3
Freescale Semiconductor 30
2.3 Thermal Characteristics
Table 24 lists thermal resistance values.
Table 24. Thermal Characteristics
Characteristic Symbol Value Unit
100 LQFP Junction to ambient, natural convection Single layer board (1s) JA 531,2
1JA and jt parameters are simulated in conformance with EIA/JESD Standard 51-2 for natural convection. Freescale
recommends the use of JA and power dissipation specifications in the system design to prevent device junction
temperatures from exceeding the rated specification. System designers should be aware that device junction temperatures
can be significantly influenced by board layout and surrounding devices. Conformance to the device junction temperature
specification can be verified by physical measurement in the customer’s system using the jt parameter, the device power
dissipation, and the method described in EIA/JESD Standard 51-2.
2Per JEDEC JESD51-2 with the single-layer board (JESD51-3) horizontal.
C / W
Junction to ambient, natural convection Four layer board (2s2p) JA 391,3
3Per JEDEC JESD51-6 with the board JESD51-7) horizontal.
C / W
Junction to ambient, (@200 ft/min) Single layer board (1s) JMA 421,3 C / W
Junction to ambient, (@200 ft/min) Four layer board (2s2p) JMA 331,3 C / W
Junction to board JB 254
4Thermal resistance between the die and the printed circuit board in conformance with JEDEC JESD51-8. Board
temperature is measured on the top surface of the board near the package.
C / W
Junction to case JC 95
5Thermal resistance between the die and the case top surface as measured by the cold plate method (MIL SPEC-883
Method 1012.1).
C / W
Junction to top of package Natural convection jt 26C / W
Maximum operating junction temperature Tj105 oC
81 MAPBGA Junction to ambient, natural convection Single layer board (1s) JA 611,2 C / W
Junction to ambient, natural convection Four layer board (2s2p) JA 352,3 C / W
Junction to ambient, (@200 ft/min) Single layer board (1s) JMA 502,3 C / W
Junction to ambient, (@200 ft/min) Four layer board (2s2p) JMA 312,3 C / W
Junction to board JB 204C / W
Junction to case JC 125C / W
Junction to top of package Natural convection jt 26C / W
Maximum operating junction temperature Tj105 oC
64 LQFP Junction to ambient, natural convection Single layer board (1s) JA 621,2 C / W
Junction to ambient, natural convection Four layer board (2s2p) JA 431,3 C / W
Junction to ambient (@200 ft/min) Single layer board (1s) JMA 501,3 C / W
Junction to ambient (@200 ft/min) Four layer board (2s2p) JMA 361,3 C / W
Junction to board JB 264C / W
Junction to case JC 95C / W
Junction to top of package Natural convection jt 26C / W
Maximum operating junction temperature Tj105 oC
MCF52223 ColdFire Microcontroller, Rev. 3
Electrical Characteristics
Freescale Semiconductor31
2.4 Flash Memory Characteristics
The flash memory characteristics are shown in Table 25 and Table 26.
6Thermal characterization parameter indicating the temperature difference between package top and the junction
temperature per JEDEC JESD51-2. When Greek letters are not available, the thermal characterization parameter is written
in conformance with Psi-JT.
The average chip-junction temperature (TJ) in C can be obtained from:
(1)
Where:
TA= ambient temperature, C
JA = package thermal resistance, junction-to-ambient, C/W
PD= PINT PI/O
PINT = chip internal power, IDD VDD, watts
PI/O = power dissipation on input and output pins — user determined, watts
For most applications PI/O PINT and can be ignored. An approximate relationship between PD and TJ (if PI/O is neglected) is:
(2)
Solving equations 1 and 2 for K gives:
K = PD (TA + 273 C) + JMA PD 2 (3)
where K is a constant pertaining to the particular part. K can be determined from equation (3) by measuring PD (at equilibrium)
for a known TA. Using this value of K, the values of PD and TJ can be obtained by solving equations (1) and (2) iteratively for
any value of TA.
Table 25. SGFM Flash Program and Erase Characteristics
(VDD = 3.0 to 3.6 V)
Parameter Symbol Min Typ Max Unit
System clock (read only) fsys(R) 0—66.67 or 801
1Depending on packaging; see the orderable part number summary.
MHz
System clock (program/erase)2
2Refer to the flash memory section for more information
fsys(P/E) 0.15 66.67 or 801MHz
Table 26. SGFM Flash Module Life Characteristics
(VDD = 3.0 to 3.6 V)
Parameter Symbol Value Unit
Maximum number of guaranteed program/erase cycles1 before failure
1A program/erase cycle is defined as switching the bits from 1 0 1.
P/E 10,0002
2Reprogramming of a flash memory array block prior to erase is not required.
Cycles
Data retention at average operating temperature of 85C Retention 10 Years
TJTAPDJMA
+=
PDKT
J273C+=
Electrical Characteristics
MCF52223 ColdFire Microcontroller, Rev. 3
Freescale Semiconductor 32
2.5 EzPort Electrical Specifications
2.6 ESD Protection
Table 27. EzPort Electrical Specifications
Name Characteristic Min Max Unit
EP1 EPCK frequency of operation (all commands except READ) fsys / 2 MHz
EP1a EPCK frequency of operation (READ command) fsys / 8 MHz
EP2 EPCS_b negation to next EPCS_b assertion 2 × Tcyc —ns
EP3 EPCS_B input valid to EPCK high (setup) 5 ns
EP4 EPCK high to EPCS_B input invalid (hold) 5 ns
EP5 EPD input valid to EPCK high (setup) 2 ns
EP6 EPCK high to EPD input invalid (hold) 5 ns
EP7 EPCK low to EPQ output valid (out setup) 12 ns
EP8 EPCK low to EPQ output invalid (out hold) 0 ns
EP9 EPCS_B negation to EPQ tri-state 12 ns
Table 28. ESD Protection Characteristics1, 2
1All ESD testing is in conformity with CDF-AEC-Q100 Stress Test Qualification for
Automotive Grade Integrated Circuits.
2A device is defined as a failure if after exposure to ESD pulses the device no longer
meets the device specification requirements. Complete DC parametric and functional
testing is performed per applicable device specification at room temperature followed by
hot temperature, unless specified otherwise in the device specification.
Characteristics Symbol Value Units
ESD target for Human Body Model HBM 2000 V
ESD target for Machine Model MM 200 V
HBM circuit description Rseries 1500
C 100 pF
MM circuit description Rseries 0
C 200 pF
Number of pulses per pin (HBM)
Positive pulses
Negative pulses
1
1
Number of pulses per pin (MM)
Positive pulses
Negative pulses
3
3
Interval of pulses 1 sec
MCF52223 ColdFire Microcontroller, Rev. 3
Electrical Characteristics
Freescale Semiconductor33
2.7 DC Electrical Specifications
Table 29. DC Electrical Specifications 1
1Refer to Ta bl e 3 0 for additional PLL specifications.
Characteristic Symbol Min Max Unit
Supply voltage VDD 3.0 3.6 V
Standby voltage VSTBY 1.8 3.6 V
Input high voltage VIH 0.7 VDD 4.0 V
Input low voltage VIL VSS – 0.3 0.35 VDD V
Input hysteresis2
2Only for pins: IRQ1, IRQ2. IRQ3, IRQ4, IRQ5, IRQ6. IRQ7, RSTIN_B, RCON_B, PCS0, SCK, I2C_SDA, I2C_SCL,
TCLK, TRST_B
VHYS 0.06 VDD —mV
Low-voltage detect trip voltage (VDD falling) VLVD 2.15 2.3 V
Low-voltage detect hysteresis (VDD rising) VLV D HY S 60 120 mV
Input leakage current
Vin = VDD or VSS, digital pins
Iin –1.0 1.0 A
Output high voltage (all input/output and all output pins)
IOH = –2.0 mA
VOH VDD – 0.5 V
Output low voltage (all input/output and all output pins)
IOL = 2.0mA
VOL —0.5V
Output high voltage (high drive)
IOH = -5 mA
VOH VDD – 0.5 V
Output low voltage (high drive)
IOL = 5 mA
VOL —0.5V
Output high voltage (low drive)
IOH = -2 mA
VOH VDD - 0.5 V
Output low voltage (low drive)
IOL = 2 mA
VOL —0.5V
Weak internal pull Up device current, tested at VIL Max.3
3Refer to Ta bl e 1 3 for pins having internal pull-up devices.
IAPU –10 –130 A
Input Capacitance 4
All input-only pins
All input/output (three-state) pins
4This parameter is characterized before qualification rather than 100% tested.
Cin
7
7
pF
Electrical Characteristics
MCF52223 ColdFire Microcontroller, Rev. 3
Freescale Semiconductor 34
2.8 Clock Source Electrical Specifications
Table 30. Oscillator and PLL Electrical Specifications
(VDD and VDDPLL = 2.7 to 3.6 V, VSS = VSSPLL = 0 V)
Characteristic Symbol Min Max Unit
Clock Source Frequency Range of EXTAL Frequency Range
Crystal
External1
1In external clock mode, it is possible to run the chip directly from an external clock source without enabling the PLL.
fcrystal
fext
1
0
25.02
66.67 or 80
2This value has been updated.
MHz
PLL reference frequency range fref_pll 210.0MHz
System frequency 3
External clock mode
On-chip PLL frequency
3All internal registers retain data at 0 Hz.
fsys
0
fref / 32
66.67 or 804
66.67 or 804
4Depending on packaging; see the orderable part number summary.
MHz
Loss of reference frequency 5, 7
5Loss of Reference Frequency is the reference frequency detected internally, which transitions the PLL into self clocked mode.
fLOR 100 1000 kHz
Self clocked mode frequency 6
6Self clocked mode frequency is the frequency at which the PLL operates when the reference frequency falls below fLOR with
default MFD/RFD settings.
fSCM 15MHz
Crystal start-up time 7, 8
7This parameter is characterized before qualification rather than 100% tested.
8Proper PC board layout procedures must be followed to achieve specifications.
tcst —10ms
EXTAL input high voltage
External reference
VIHEXT
2.0 3.02
V
EXTAL input low voltage
External reference
VILEXT
VSS 0.8
V
PLL lock time4,9
9This specification applies to the period required for the PLL to relock after changing the MFD frequency control bits in the
synthesizer control register (SYNCR).
tlpll —500s
Duty cycle of reference 4 tdc 40 60 % fref
Frequency un-LOCK range fUL –1.5 1.5 % fref
Frequency LOCK range fLCK –0.75 0.75 % fref
CLKOUT period jitter 4, 5, 10 ,11, measured at fSYS Max
Peak-to-peak (clock edge to clock edge)
Long term (averaged over 2 ms interval)
10 Jitter is the average deviation from the programmed frequency measured over the specified interval at maximum fsys.
Measurements are made with the device powered by filtered supplies and clocked by a stable external clock signal. Noise
injected into the PLL circuitry via VDDPLL and VSSPLL and variation in crystal oscillator frequency increase the Cjitter percentage
for a given interval.
11 Based on slow system clock of 40 MHz measured at fsys max.
Cjitter
10
.01
% fsys
On-chip oscillator frequency foco 7.84 8.16 MHz
MCF52223 ColdFire Microcontroller, Rev. 3
Electrical Characteristics
Freescale Semiconductor35
2.9 General Purpose I/O Timing
GPIO can be configured for certain pins of the QSPI, DDR Control, timer, UART, Interrupt and USB interfaces. When in GPIO
mode, the timing specification for these pins is given in Table 31 and Figure 6.
The GPIO timing is met under the following load test conditions:
•50pF/50 for high drive
•25pF/25 for low drive
Figure 6. GPIO Timing
2.10 Reset Timing
Table 31. GPIO Timing
NUM Characteristic Symbol Min Max Unit
G1 CLKOUT High to GPIO Output Valid tCHPOV —10ns
G2 CLKOUT High to GPIO Output Invalid tCHPOI 1.5 ns
G3 GPIO Input Valid to CLKOUT High tPVCH 9—ns
G4 CLKOUT High to GPIO Input Invalid tCHPI 1.5 ns
Table 32. Reset and Configuration Override Timing
(VDD = 3.0 to 3.6 V, VSS = 0 V, TA = TL to TH)1
1All AC timing is shown with respect to 50% VDD levels unless otherwise noted.
NUM Characteristic Symbol Min Max Unit
R1 RSTI input valid to CLKOUT High tRVCH 9—ns
R2 CLKOUT High to RSTI Input invalid tCHRI 1.5 ns
R3 RSTI input valid time 2
2During low power STOP, the synchronizers for the RSTI input are bypassed and RSTI is asserted asynchronously to the
system. Thus, RSTI must be held a minimum of 100 ns.
tRIVT 5—t
CYC
R4 CLKOUT High to RSTO Valid tCHROV —10ns
G1
CLKOUT
GPIO Outputs
G2
G3 G4
GPIO Inputs
Electrical Characteristics
MCF52223 ColdFire Microcontroller, Rev. 3
Freescale Semiconductor 36
Figure 7. RSTI and Configuration Override Timing
2.11 I2C Input/Output Timing Specifications
Table 33 lists specifications for the I2C input timing parameters shown in Figure 8.
Table 34 lists specifications for the I2C output timing parameters shown in Figure 8.
Table 33. I2C Input Timing Specifications between I2C_SCL and I2C_SDA
Num Characteristic Min Max Units
11 Start condition hold time 2 tCYC —ns
I2 Clock low period 8 tCYC —ns
I3 SCL/SDA rise time (VIL = 0.5 V to VIH = 2.4 V) 1 ms
I4 Data hold time 0 ns
I5 SCL/SDA fall time (VIH = 2.4 V to VIL = 0.5 V) 1 ms
I6 Clock high time 4 tCYC —ns
I7 Data setup time 0 ns
I8 Start condition setup time (for repeated start condition only) 2 tCYC —ns
I9 Stop condition setup time 2 tCYC —ns
Table 34. I2C Output Timing Specifications between I2C_SCL and I2C_SDA
Num Characteristic Min Max Units
111Start condition hold time 6 tCYC —ns
I21Clock low period 10 tCYC —ns
I32I2C_SCL/I2C_SDA rise time
(VIL = 0.5 V to VIH = 2.4 V)
——s
I41Data hold time 7 tCYC —ns
I53I2C_SCL/I2C_SDA fall time
(VIH = 2.4 V to VIL = 0.5 V)
—3ns
I61Clock high time 10 tCYC —ns
I71Data setup time 2 tCYC —ns
I81Start condition setup time (for repeated start
condition only)
20 tCYC —ns
I91Stop condition setup time 10 tCYC —ns
MCF52223 ColdFire Microcontroller, Rev. 3
Electrical Characteristics
Freescale Semiconductor37
Figure 8 shows timing for the values in Table 33 and Table 34.
Figure 8. I2C Input/Output Timings
2.12 Analog-to-Digital Converter (ADC) Parameters
Table 35 lists specifications for the analog-to-digital converter.
1Output numbers depend on the value programmed into the IFDR; an IFDR programmed with the
maximum frequency (IFDR = 0x20) results in minimum output timings as shown in Tab l e 34. The I2C
interface is designed to scale the actual data transition time to move it to the middle of the SCL low
period. The actual position is affected by the prescale and division values programmed into the IFDR;
however, the numbers given in Ta b l e 3 4 are minimum values.
2Because SCL and SDA are open-collector-type outputs, which the processor can only actively drive
low, the time SCL or SDA take to reach a high level depends on external signal capacitance and pull-up
resistor values.
3Specified at a nominal 50-pF load.
Table 35. ADC Parameters1
Name Characteristic Min Typical Max Unit
VREFL Low reference voltage VSS —V
REFH V
VREFH High reference voltage VREFL —V
DDA V
VDDA ADC analog supply voltage 3.0 3.3 3.6 V
VADIN Input voltages VREFL —V
REFH V
RES Resolution 12 12 Bits
INL Integral non-linearity (full input signal range)22.5 3LSB
3
INL Integral non-linearity (10% to 90% input signal range)42.5 3LSB
DNL Differential non-linearity –1 < DNL < 1<1LSB
Monotonicity GUARANTEED
fADIC ADC internal clock 0.1 5.0 MHz
RAD Conversion range VREFL —V
REFH V
tADPU ADC power-up time5—613t
AIC cycles6
tREC Recovery from auto standby 0 1 tAIC cycles
tADC Conversion time 6 tAIC cycles
tADS Sample time 1 tAIC cycles
CADI Input capacitance See Figure 9 —pF
I2 I6
I1 I4
I7
I8 I9
I5
I3
SCL
SDA
Electrical Characteristics
MCF52223 ColdFire Microcontroller, Rev. 3
Freescale Semiconductor 38
2.13 Equivalent Circuit for ADC Inputs
Figure 9 shows the ADC input circuit during sample and hold. S1 and S2 are always open/closed at the same time that S3 is
closed/open. When S1/S2 are closed & S3 is open, one input of the sample and hold circuit moves to (VREFH-VREFL)/2, while
the other charges to the analog input voltage. When the switches are flipped, the charge on C1 and C2 are averaged via S3, with
the result that a single-ended analog input is switched to a differential voltage centered about (VREFH-VREFL)/2. The switches
switch on every cycle of the ADC clock (open one-half ADC clock, closed one-half ADC clock). There are additional
capacitances associated with the analog input pad, routing, etc., but these do not filter into the S/H output voltage, as S1 provides
isolation during the charge-sharing phase. One aspect of this circuit is that there is an on-going input current, which is a function
of the analog input voltage, VREF and the ADC clock frequency.
1. Parasitic capacitance due to package, pin-to-pin and pin-to-package base coupling; 1.8pF
2. Parasitic capacitance due to the chip bond pad, ESD protection devices and signal routing; 2.04pF
XIN Input impedance See Figure 9 —W
IADI Input injection current7, per pin 3 mA
IVREFH VREFH current 0 mA
VOFFSET Offset voltage internal reference 815 mV
EGAIN Gain error (transfer path) .99 1 1.01
VOFFSET Offset voltage external reference 39mV
SNR Signal-to-noise ratio 62 to 66 dB
THD Total harmonic distortion 75 dB
SFDR Spurious free dynamic range 67 to 70.3 dB
SINAD Signal-to-noise plus distortion 61 to 63.9 dB
ENOB Effective number of bits 9.1 10.6 Bits
1All measurements are made at VDD = 3.3V, VREFH = 3.3V, and VREFL = ground
2INL measured from VIN = VREFL to VIN = VREFH
3LSB = Least Significant Bit
4INL measured from VIN = 0.1VREFH to VIN = 0.9VREFH
5Includes power-up of ADC and VREF
6ADC clock cycles
7Current that can be injected or sourced from an unselected ADC signal input without impacting the performance of the ADC
Table 35. ADC Parameters1 (continued)
Name Characteristic Min Typical Max Unit
12
3
Analog Input 4
S1
S2
S3
C1
C2
S/H
C1 = C2 = 1pF
(VREFH- VREFL)/ 2
125W ESD Resistor
8pF noise damping capacitor
MCF52223 ColdFire Microcontroller, Rev. 3
Electrical Characteristics
Freescale Semiconductor39
3. Equivalent resistance for the channel select mux; 100 s
4. Sampling capacitor at the sample and hold circuit. Capacitor C1 is normally disconnected from the input and is only
connected to it at sampling time; 1.4pF
5. Equivalent input impedance, when the input is selected =
Figure 9. Equivalent Circuit for A/D Loading
2.14 DMA Timers Timing Specifications
Table 36 lists timer module AC timings.
2.15 QSPI Electrical Specifications
Table 37 lists QSPI timings.
The values in Table 37 correspond to Figure 10.
Table 36. Timer Module AC Timing Specifications
Name Characteristic1
1All timing references to CLKOUT are given to its rising edge.
Min Max Unit
T1 DTIN0 / DTIN1 / DTIN2 / DTIN3 cycle time 3 tCYC —ns
T2 DTIN0 / DTIN1 / DTIN2 / DTIN3 pulse width 1 tCYC —ns
Table 37. QSPI Modules AC Timing Specifications
Name Characteristic Min Max Unit
QS1 QSPI_CS[3:0] to QSPI_CLK 1 510 tCYC
QS2 QSPI_CLK high to QSPI_DOUT valid 10 ns
QS3 QSPI_CLK high to QSPI_DOUT invalid (Output hold) 2 ns
QS4 QSPI_DIN to QSPI_CLK (Input setup) 9 ns
QS5 QSPI_DIN to QSPI_CLK (Input hold) 9 ns
1
(ADC Clock Rate) (1.410-12)
Electrical Characteristics
MCF52223 ColdFire Microcontroller, Rev. 3
Freescale Semiconductor 40
Figure 10. QSPI Timing
2.16 JTAG and Boundary Scan Timing
Table 38. JTAG and Boundary Scan Timing
Num Characteristics1
1JTAG_EN is expected to be a static signal. Hence, it is not associated with any timing.
Symbol Min Max Unit
J1 TCLK frequency of operation fJCYC DC 1/4 fsys/2
J2 TCLK cycle period tJCYC 4 tCYC —ns
J3 TCLK clock pulse width tJCW 26 ns
J4 TCLK rise and fall times tJCRF 03ns
J5 Boundary scan input data setup time to TCLK rise tBSDST 4—ns
J6 Boundary scan input data hold time after TCLK rise tBSDHT 26 ns
J7 TCLK low to boundary scan output data valid tBSDV 033ns
J8 TCLK low to boundary scan output high Z tBSDZ 033ns
J9 TMS, TDI input data setup time to TCLK rise tTAPBST 4—ns
J10 TMS, TDI Input data hold time after TCLK rise tTAPBHT 10 ns
J11 TCLK low to TDO data valid tTDODV 026ns
J12 TCLK low to TDO high Z tTDODZ 08ns
J13 TRST assert time tTRSTAT 100 ns
J14 TRST setup time (negation) to TCLK high tTRSTST 10 ns
QSPI_CS[3:0]
QSPI_CLK
QSPI_DOUT
QS5
QS1
QSPI_DIN
QS3 QS4
QS2
MCF52223 ColdFire Microcontroller, Rev. 3
Electrical Characteristics
Freescale Semiconductor41
Figure 11. Test Clock Input Timing
Figure 12. Boundary Scan (JTAG) Timing
Figure 13. Test Access Port Timing
Figure 14. TRST Timing
TCLK
VIL
VIH
J3 J3
J4 J4
J2
(input)
Input Data Valid
Output Data Valid
Output Data Valid
TCLK
Data Inputs
Data Outputs
Data Outputs
Data Outputs
VIL VIH
J5 J6
J7
J8
J7
Input Data Valid
Output Data Valid
Output Data Valid
TCLK
TDI
TDO
TDO
TDO
TMS
VIL VIH
J9 J10
J11
J12
J11
TCLK
TRST
14
13
Electrical Characteristics
MCF52223 ColdFire Microcontroller, Rev. 3
Freescale Semiconductor 42
2.17 Debug AC Timing Specifications
Table 39 lists specifications for the debug AC timing parameters shown in Figure 16.
Figure 15 shows real-time trace timing for the values in Table 39.
Figure 15. Real-Time Trace AC Timing
Table 39. Debug AC Timing Specification
Num Characteristic
66/80 MHz
Units
Min Max
D1 PST, DDATA to CLKOUT setup 4 ns
D2 CLKOUT to PST, DDATA hold 1.5 ns
D3 DSI-to-DSCLK setup 1 tCYC —ns
D41
1DSCLK and DSI are synchronized internally. D4 is measured from the synchronized DSCLK input relative to
the rising edge of CLKOUT.
DSCLK-to-DSO hold 4 tCYC —ns
D5 DSCLK cycle time 5 tCYC —ns
D6 BKPT input data setup time to CLKOUT rise 4 ns
D7 BKPT input data hold time to CLKOUT rise 1.5 ns
D8 CLKOUT high to BKPT high Z 0.0 10.0 ns
CLKOUT
PST[3:0]
D2D1
DDATA[3:0]
MCF52223 ColdFire Microcontroller, Rev. 3
Mechanical Outline Drawings
Freescale Semiconductor43
Figure 16 shows BDM serial port AC timing for the values in Table 39.
Figure 16. BDM Serial Port AC Timing
3 Mechanical Outline Drawings
This section describes the physical properties of the device and its derivatives.
DSI
DSO
Current Next
CLKOUT
Past Current
DSCLK
D3
D4
D5
Mechanical Outline Drawings
MCF52223 ColdFire Microcontroller, Rev. 3
Freescale Semiconductor 44
3.1 64-pin LQFP Package
MCF52223 ColdFire Microcontroller, Rev. 3
Mechanical Outline Drawings
Freescale Semiconductor45
Mechanical Outline Drawings
MCF52223 ColdFire Microcontroller, Rev. 3
Freescale Semiconductor 46
MCF52223 ColdFire Microcontroller, Rev. 3
Mechanical Outline Drawings
Freescale Semiconductor47
Mechanical Outline Drawings
MCF52223 ColdFire Microcontroller, Rev. 3
Freescale Semiconductor 48
MCF52223 ColdFire Microcontroller, Rev. 3
Mechanical Outline Drawings
Freescale Semiconductor49
Mechanical Outline Drawings
MCF52223 ColdFire Microcontroller, Rev. 3
Freescale Semiconductor 50
3.2 81 MAPBGA Package
MCF52223 ColdFire Microcontroller, Rev. 3
Mechanical Outline Drawings
Freescale Semiconductor51
Mechanical Outline Drawings
MCF52223 ColdFire Microcontroller, Rev. 3
Freescale Semiconductor 52
3.3 100-pin LQFP Package
MCF52223 ColdFire Microcontroller, Rev. 3
Mechanical Outline Drawings
Freescale Semiconductor53
Revision History
MCF52223 ColdFire Microcontroller, Rev. 3
Freescale Semiconductor 54
4 Revision History
Table 40. Revision History
Revision Description
2 Formatting, layout, spelling, and grammar corrections.
Removed the “Preliminary” label.
Added missing current consumption data (Section 2.2).
Added revision history.
Corrected signal names in block diagram to match those in the signal description table.
Added an entry for standby voltage (VSTBY) to the “DC electrical specifications” table.
Deleted the PSTCLK cycle time row in the “Debug AC timing specifications” table.
Changed the frequency above the “Min” and “Max” column headings in the “Debug AC timing
specifications” table (was 166 MHz, is 66/80 MHz).
Added the following signals to the “Pin functions by primary and alternate purpose” table (alternates to
IRQ1-6, respectively): USB_ALT_CLK, USB_SESSVLD, USB_SESSEND, USB_PULLUP,
USB_VBUSVLD, and USB_ID.
Changed the minimum value for SNR, THD, SFDR, and SINAD in the “ADC parameters” table (was
TBD, is “—”).
Added values for IOH and IOL to the “DC electrical specifications” table.
Added load test condition information to the “General Purpose I/O Timing” section.
Synchronized the “Pin Functions by Primary and Alternate Purpose” table in this document and the
reference manual.
Added a specification for VDDUSB to the “Absolute maximum ratings” table.
Added specifications for VLVD and VLV D HY S to the “DC electrical specifications” table.
Deleted entries for the nonexistent 64 QFN package from the “Thermal Resistances” table.
3 Updated Ta bl e 7 to reflect orderable part numbers.
4
Updated Clock generation features
Updated Table: Clocking Modes and added appropriate footnote
In Table: CLock Source Electrical Specifications, updated the following values:
fcrystal, fext, fref_pll, EXTAL input high voltage (External reference)
Document Number: MCF52223
Rev. 3
3/2011
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