V F @ I F
TYPES VdC mA
MIN MAX (PULSED)
1N6639US 1.20 500
0.54 0.62 1
1N6640US 0.76 0.86 50
0.82 0.92 100
0.87 1.00 200
1N6641US 1.10 200
159
6 LAKE STREET, LAWRENCE, MASSACHUSETTS 01841
PHONE (978) 620-2600 FAX (781) 689-0803
WEBSITE: http://www.microsemi.com
V BRR V RWM I R1 I R2 T FR T RR CT
TYPES @ 10 µA @ TA= +25°C @ TA= +150°C IFI R = 10 mA VR= 0
VR=V
R== 200 mA I F = 10 mA
V RWM V RWM RL= 100 
V(pk) V(pk) nA dc µA dc ns ns pF
1N6639US 100 75 100 100 10 4.0 2.5
1N6640US 75 50 100 100 10 4.0 2.5
1N6641US 75 50 100 100 10 5.0 3.0
MAXIMUM RATINGS
Operating Temperature: -65°C to +175°C
Storage Temperature: -65°C to +175°C
Operating Current: 300 mA
Derating: 4.6 mA/°C Above TEC = + 110°C
Surge Current: I
FSM
= 2.5A, Pw= 8.3ms
ELECTRICAL CHARACTERISTICS @ 25°C, unless otherwise speci½ed.
FORWARD VOLTAGE:
• 1N6639US THRU 1N6641US AVAILABLE IN JAN, JANTX, JANTXV AND JANS
PER MIL-PRF-19500/609
• SWITCHING DIODES
• NON-CAVITY GLASS PACKAGE
• METALLURGICALLY BONDED
1N6639US
1N6640US
1N6641US
DESIGN DATA
CASE: D-5D, Hermetically sealed glass
case, per MIL-PRF- 19500/609
LEAD FINISH: Tin / Lead
THERMAL RESISTANCE: (ROJEC):
50 °C/W maximum at L = 0
THERMAL IMPEDANCE: (ZOJX): 25
°C/W maximum
POLARITY: Cathode end is banded
MOUNTING SURFACE SELECTION:
The Axial Coefficient of Expansion
(COE) of this device is approximately
+ 4PPM / °C. The COE of the Mounting
Surface System should be selected to
provide a suitable match with this
device.
MILLIMETERS INCHES
DIM MIN MAX MIN MAX
D1.78 2.16 0.070 0.085
F0.48 0.71 0.019 0.028
G4.19 4.95 0.165 0.195
S0.08MIN. 0.003MIN.
FIGURE 1
160
IN6639US thru IN6641US
.2 .3 .4 .5 .6 .7 .8 .9 1.0 1.1 1.2
VF - Forward Voltage (V)
FIGURE 2
Typical Forward Current
vs Forward Voltage
IF- Forward Current - (mA)
1000
100
10
1
0.1
150ºC
100ºC
25ºC
-65ºC
20 40 60 80 100 120 140
Percent of Reverse Working Voltage (%)
FIGURE 3
Typical Reverse Current
vs Reverse Voltage
IR- Reverse Current - (µA)
1000
100
10
1
0.1
.01
.001
150ºC
100ºC
25ºC
-65ºC
NOTE : All temperatures shown on graphs are
junction temperatures