GCM Series Specification and Test Methods
Continued from the preceding page.
Immerse the capacitor in a eutectic solder solution at 260±5°C for
10±1 seconds. Let sit at room temperature for 24±2 hours, then
measure.
• Initial measurement for high dielectric constant type
Perform a heat treatment at 150
W0
Y10
°C for one hour and then let
sit for 24±2 hours at room temperature.
Perform the initial measurement.
13
Resistance to
Soldering Heat The measured and observed characteristics should satisfy the
specifications in the following table.
Appearance
No marking defects
Capacitance
Change
Within the specified tolerance
Q/D.F. 30pFmin.: QU1000
30pFmax.: QU400+20C
C: Nominal Capacitance (pF)
*1
W.V.: 25Vmin.: 0.025 max.
W.V.: 16V: 0.035 max.
I.R. More than 10,000MΩ or 500Ω · F
(Whichever is smaller) *1
Solder the capacitor to the test jig (glass epoxy board) in the
same manner and under the same conditions as (19). The
capacitor should be subjected to a simple harmonic motion
having a total amplitude of 1.5mm, the frequency being varied
uniformly between the approximate limits of 10 and 2000Hz. The
frequency range, from 10 to 2000Hz and return to 10Hz, should
be traversed in approximately 20 minutes. This motion should be
applied for 12 items in each 3 mutually perpendicular directions
(total of 36 times).
12
Vibration
Appearance
No defects or abnormalities
Capacitance
Change
Within the specified tolerance
Q/D.F. 30pFmin.: QU1000
30pFmax.: QU400+20C
C: Nominal Capacitance (pF)
*1
W.V.: 25Vmin.: 0.025 max.
W.V.: 16V: 0.035 max.
I.R. More than 10,000MΩ or 500Ω · F
(Whichever is smaller) *1
Three shocks in each direction should be applied along 3
mutually perpendicular axes of the test specimen (18 shocks).
The specified test pulse should be Half-sine and should have a
duration: 0.5ms, peak value: 1500g and velocity change: 4.7m/s.
11
Mechanical
Shock
No marking defects
Appearance
Capacitance
Change
Within the specified tolerance
Q/D.F. 30pFmin.: QU1000
30pFmax.: QU400+20C
C: Nominal Capacitance (pF)
*1
W.V.: 25Vmin.: 0.025 max.
W.V.: 16V: 0.035 max.
I.R. More than 10,000MΩ or 500Ω · F
(Whichever is smaller) *1
Per MIL-STD-202 Method 215
Solvent 1: 1 part (by volume) of isopropyl alcohol
3 parts (by volume) of mineral spirits
Solvent 2: Terpene defluxer
Solvent 3: 42 parts (by volume) of water
1 part (by volume) of propylene glycol
monomethyl ether
1 part (by volume) of monoethanolamine
10
Resistance
to Solvents
No marking defects
Appearance
Capacitance
Change
Within the specified tolerance
Q/D.F. 30pFmin.: QU1000
30pFmax.: QU400+20C
C: Nominal Capacitance (pF)
*1
W.V.: 25Vmin.: 0.025 max.
W.V.: 16V: 0.035 max.
I.R. More than 10,000MΩ or 500Ω · F
(Whichever is smaller) *1
Using calipers9
Physical Dimension
Within the specified dimensions
Visual inspection8 External Visual No defects or abnormalities
Apply 200% of the rated voltage for 1000±12 hours at
125±3°C. Let sit for 24±2 hours at room temperature, then
measure. *2
The charge/discharge current is less than 50mA.
• Initial measurement for high dielectric constant type.
Apply 200% of the rated DC voltage for one hour at the maximum
operating temperature ±3°C. Remove and let sit for 24±2 hours
at room temperature. Perform initial measurement. *2
7
Operational Life The measured and observed characteristics should satisfy the
specifications in the following table.
Appearance
No marking defects
Capacitance
Change
Within ±3.0% or ±0.30pF
(Whichever is larger) Within ±12.5%
Q/D.F.
30pFmin.: QU350
10pF and over, 30pF and below:
QU275+
5
–
2
C
10pFmax.: QU200+10C
C: Nominal Capacitance (pF)
*1
W.V.: 25Vmin.: 0.035 max.
W.V.: 16V: 0.05 max.
I.R. More than 1,000MΩ or 50Ω · F
(Whichever is smaller) *1
No. AEC-Q200 Test Method
Specifications
Temperature Compensating Type
High Dielectric Type
AEC-Q200
Test Item
Continued on the following page.
*1: The figure indicates typical specification. Please refer to individual specifications.
*2: Some of the parts are applicable in rated voltage x 150%. Please refer to individual specifications.