©2002 Silicon Storage Technology, Inc.
S71117-04-000 2/02 360
1
The SST logo and SuperFlash are registered trademarks of Silicon Storage Technology, Inc.
Multi-Purpose Flash and MPF are trademarks of Silicon Storage Technology, Inc.
These specifications are subject to change without notice.
Data Sheet
FEATURES:
• Organized as 128K x16 / 256K x16 / 512K x16
• Single Voltage Read and Write Operations
– 3.0-3.6V for SST39LF200A/400A/800A
– 2.7-3.6V for SST39VF200A/400A/800A
• Superior Reliability
– Endurance: 100,000 Cycles (typical)
– Greater than 100 years Data Retention
• Low Power Consumption
– Active Current: 20 mA (typical)
– Standby Current: 3 µA (typical)
• Sector-Erase Capability
– Uniform 2 KWord sectors
• Block-Erase Capability
– Uniform 32 KWord blocks
• Fast Read Access Time
– 45 and 55 ns for SST39LF200A/400A
– 55 ns for SST39LF800A
– 70 and 90 ns for SST39VF200A/400A/800A
• Latched Address and Data
• Fast Erase and Word-Program
– Sector-Erase Time: 18 ms (typical)
– Block-Erase Time: 18 ms (typical)
– Chip-Erase Time: 70 ms (typical)
– Word-Program Time: 14 µs (typical)
– Chip Rewrite Time:
2 seconds (typical) for SST39LF/VF200A
4 seconds (typical) for SST39LF/VF400A
8 seconds (typical) for SST39LF/VF800A
• Automatic Write Timing
– Internal VPP Generation
• End-of-Write Detection
– Toggle Bit
– Data# Polling
• CMOS I/O Compatibility
• JEDEC Standard
– Flash EEPROM Pinouts and command sets
• Packages Available
– 48-lead TSOP (12mm x 20mm)
– 48-ball TFBGA (6mm x 8mm)
PRODUCT DESCRIPTION
The SST39LF200A/400A/800A and SST39VF200A/400A/
800A devices are 128K x16 / 256K x16 / 512K x16 CMOS
Multi-Purpose Flash (MPF) manufactured with SST’s pro-
prietary, high performance CMOS SuperFlash technology.
The split-gate cell design and thick oxide tunneling injector
attain better reliability and manufacturability compared with
alternate approaches. The SST39LF200A/400A/800A
write (Program or Erase) with a 3.0-3.6V power supply. The
SST39VF200A/400A/800A write (Program or Erase) with a
2.7-3.6V power supply. These devices conform to JEDEC
standard pinouts for x16 memories.
Featuring high performance Word-Program, the
SST39LF200A/400A/800A and SST39VF200A/400A/
800A devices provide a typical Word-Program time of 14
µsec. The devices use Toggle Bit or Data# Polling to detect
the completion of the Program or Erase operation. To pro-
tect against inadvertent write, they have on-chip hardware
and software data protection schemes. Designed, manu-
factured, and tested for a wide spectrum of applications,
these devices are offered with a guaranteed endurance of
10,000 cycles. Data retention is rated at greater than 100
years.
The SST39LF200A/400A/800A and SST39VF200A/400A/
800A devices are suited for applications that require conve-
nient and economical updating of program, configuration,
or data memory. For all system applications, they signifi-
cantly improve performance and reliability, while lowering
power consumption. They inherently use less energy dur-
ing Erase and Program than alternative flash technologies.
When programming a flash device, the total energy con-
sumed is a function of the applied voltage, current, and
time of application. Since for any given voltage range, the
SuperFlash technology uses less current to program and
has a shorter erase time, the total energy consumed during
any Erase or Program operation is less than alternative
flash technologies. These devices also improve flexibility
while lowering the cost for program, data, and configuration
storage applications.
The SuperFlash technology provides fixed Erase and Pro-
gram times, independent of the number of Erase/Program
cycles that have occurred. Therefore the system software
or hardware does not have to be modified or de-rated as is
necessary with alternative flash technologies, whose Erase
and Program times increase with accumulated Erase/Pro-
gram cycles.
To meet surface mount requirements, the SST39LF200A/
400A/800A and SST39VF200A/400A/800A are offered in
both 48-lead TSOP packages and 48-ball TFBGA pack-
ages. See Figures 1 and 2 for pinouts.
2 Mbit / 4 Mbit / 8 Mbit (x16) Multi-Purpose Flash
SST39LF200A / SST39LF400A / SST39LF800A
SST39VF200A / SST39VF400A / SST39VF800A
SST39LF/VF200A / 400A / 800A3.0 & 2.7V 2Mb / 4Mb / 8Mb (x16) MPF memories
2
Data Sheet
2 Mbit / 4 Mbit / 8 Mbit Multi-Purpose Flash
SST39LF200A / SST39LF400A / SST39LF800A
SST39VF200A / SST39VF400A / SST39VF800A
©2002 Silicon Storage Technology, Inc. S71117-04-000 2/02 360
Device Operation
Commands are used to initiate the memory operation func-
tions of the device. Commands are written to the device
using standard microprocessor write sequences. A com-
mand is written by asserting WE# low while keeping CE#
low. The address bus is latched on the falling edge of WE#
or CE#, whichever occurs last. The data bus is latched on
the rising edge of WE# or CE#, whichever occurs first.
Read
The Read operation of the SST39LF200A/400A/800A and
SST39VF200A/400A/800A is controlled by CE# and OE#,
both have to be low for the system to obtain data from the
outputs. CE# is used for device selection. When CE# is
high, the chip is deselected and only standby power is con-
sumed. OE# is the output control and is used to gate data
from the output pins. The data bus is in high impedance
state when either CE# or OE# is high. Refer to the Read
cycle timing diagram for further details (Figure 3).
Word-Program Operation
The SST39LF200A/400A/800A and SST39VF200A/400A/
800A are programmed on a word-by-word basis. Before
programming, the sector where the word exists must be
fully erased. The Program operation is accomplished in
three steps. The first step is the three-byte load sequence
for Software Data Protection. The second step is to load
word address and word data. During the Word-Program
operation, the addresses are latched on the falling edge of
either CE# or WE#, whichever occurs last. The data is
latched on the rising edge of either CE# or WE#, whichever
occurs first. The third step is the internal Program operation
which is initiated after the rising edge of the fourth WE# or
CE#, whichever occurs first. The Program operation, once
initiated, will be completed within 20 µs. See Figures 4 and
5 for WE# and CE# controlled Program operation timing
diagrams and Figure 16 for flowcharts. During the Program
operation, the only valid reads are Data# Polling and Tog-
gle Bit. During the internal Program operation, the host is
free to perform additional tasks. Any commands issued
during the internal Program operation are ignored.
Sector/Block-Erase Operation
The Sector- (or Block-) Erase operation allows the system
to erase the device on a sector-by-sector (or block-by-
block) basis. The SST39LF200A/400A/800A and
SST39VF200A/400A/800A offers both Sector-Erase and
Block-Erase mode. The sector architecture is based on
uniform sector size of 2 KWord. The Block-Erase mode is
based on uniform block size of 32 KWord. The Sector-
Erase operation is initiated by executing a six-byte com-
mand sequence with Sector-Erase command (30H) and
sector address (SA) in the last bus cycle. The Block-Erase
operation is initiated by executing a six-byte command
sequence with Block-Erase command (50H) and block
address (BA) in the last bus cycle. The sector or block
address is latched on the falling edge of the sixth WE#
pulse, while the command (30H or 50H) is latched on the
rising edge of the sixth WE# pulse. The internal Erase
operation begins after the sixth WE# pulse. The End-of-
Erase operation can be determined using either Data#
Polling or Toggle Bit methods. See Figures 9 and 10 for tim-
ing waveforms. Any commands issued during the Sector-
or Block-Erase operation are ignored.
Chip-Erase Operation
The SST39LF200A/400A/800A and SST39VF200A/400A/
800A provide a Chip-Erase operation, which allows the
user to erase the entire memory array to the “1” state. This
is useful when the entire device must be quickly erased.
The Chip-Erase operation is initiated by executing a six-
byte command sequence with Chip-Erase command (10H)
at address 5555H in the last byte sequence. The Erase
operation begins with the rising edge of the sixth WE# or
CE#, whichever occurs first. During the Erase operation,
the only valid read is Toggle Bit or Data# Polling. See Table
4 for the command sequence, Figure 8 for timing diagram,
and Figure 19 for the flowchart. Any commands issued dur-
ing the Chip-Erase operation are ignored.
Write Operation Status Detection
The SST39LF200A/400A/800A and SST39VF200A/400A/
800A provide two software means to detect the completion
of a write (Program or Erase) cycle, in order to optimize the
system write cycle time. The software detection includes
two status bits: Data# Polling (DQ7) and Toggle Bit (DQ6).
The End-of-Write detection mode is enabled after the rising
edge of WE#, which initiates the internal Program or Erase
operation.
The actual completion of the nonvolatile write is asynchro-
nous with the system; therefore, either a Data# Polling or
Toggle Bit read may be simultaneous with the completion
of the write cycle. If this occurs, the system may possibly
get an erroneous result, i.e., valid data may appear to con-
flict with either DQ7 or DQ6. In order to prevent spurious
rejection, if an erroneous result occurs, the software routine
should include a loop to read the accessed location an
additional two (2) times. If both reads are valid, then the
device has completed the write cycle, otherwise the rejec-
tion is valid.
Data Sheet
2 Mbit / 4 Mbit / 8 Mbit Multi-Purpose Flash
SST39LF200A / SST39LF400A / SST39LF800A
SST39VF200A / SST39VF400A / SST39VF800A
3
©2002 Silicon Storage Technology, Inc. S71117-04-000 2/02 360
Data# Polling (DQ7)
When the SST39LF200A/400A/800A and SST39VF200A/
400A/800A are in the internal Program operation, any
attempt to read DQ7 will produce the complement of the
true data. Once the Program operation is completed, DQ7
will produce true data. Note that even though DQ7 may
have valid data immediately following the completion of an
internal Write operation, the remaining data outputs may
still be invalid: valid data on the entire data bus will appear
in subsequent successive Read cycles after an interval of
1 µs. During internal Erase operation, any attempt to read
DQ7 will produce a ‘0’. Once the internal Erase operation
is completed, DQ7 will produce a ‘1’. The Data# Polling is
valid after the rising edge of fourth WE# (or CE#) pulse for
Program operation. For Sector-, Block- or Chip-Erase, the
Data# Polling is valid after the rising edge of sixth WE# (or
CE#) pulse. See Figure 6 for Data# Polling timing diagram
and Figure 17 for a flowchart.
Toggle Bit (DQ6)
During the internal Program or Erase operation, any con-
secutive attempts to read DQ6 will produce alternating 1s
and 0s, i.e., toggling between 1 and 0. When the internal
Program or Erase operation is completed, the DQ6 bit will
stop toggling. The device is then ready for the next opera-
tion. The Toggle Bit is valid after the rising edge of fourth
WE# (or CE#) pulse for Program operation. For Sector-,
Block- or Chip-Erase, the Toggle Bit is valid after the rising
edge of sixth WE# (or CE#) pulse. See Figure 7 for Toggle
Bit timing diagram and Figure 17 for a flowchart.
Data Protection
The SST39LF200A/400A/800A and SST39VF200A/400A/
800A provide both hardware and software features to pro-
tect nonvolatile data from inadvertent writes.
Hardware Data Protection
Noise/Glitch Protection: A WE# or CE# pulse of less than 5
ns will not initiate a write cycle.
VDD Power Up/Down Detection: The Write operation is
inhibited when VDD is less than 1.5V.
Write Inhibit Mode: Forcing OE# low, CE# high, or WE#
high will inhibit the Write operation. This prevents inadvert-
ent writes during power-up or power-down.
Software Data Protection (SDP)
The SST39LF200A/400A/800A and SST39VF200A/400A/
800A provide the JEDEC approved Software Data Protec-
tion scheme for all data alteration operations, i.e., Program
and Erase. Any Program operation requires the inclusion of
the three-byte sequence. The three-byte load sequence is
used to initiate the Program operation, providing optimal
protection from inadvertent Write operations, e.g., during
the system power-up or power-down. Any Erase operation
requires the inclusion of six-byte sequence. This group of
devices are shipped with the Software Data Protection per-
manently enabled. See Table 4 for the specific software
command codes. During SDP command sequence, invalid
commands will abort the device to Read mode within TRC.
The contents of DQ15-DQ8 can be VIL or VIH, but no other
value, during any SDP command sequence.
Common Flash Memory Interface (CFI)
The SST39LF200A/400A/800A and SST39VF200A/400A/
800A also contain the CFI information to describe the char-
acteristics of the device. In order to enter the CFI Query
mode, the system must write three-byte sequence, same
as Software ID Entry command with 98H (CFI Query com-
mand) to address 5555H in the last byte sequence. Once
the device enters the CFI Query mode, the system can
read CFI data at the addresses given in Tables 5 through 9.
The system must write the CFI Exit command to return to
Read mode from the CFI Query mode.
4
Data Sheet
2 Mbit / 4 Mbit / 8 Mbit Multi-Purpose Flash
SST39LF200A / SST39LF400A / SST39LF800A
SST39VF200A / SST39VF400A / SST39VF800A
©2002 Silicon Storage Technology, Inc. S71117-04-000 2/02 360
Product Identification
The Product Identification mode identifies the devices as
the SST39LF/VF200A, SST39LF/VF400A and SST39LF/
VF800A and manufacturer as SST. This mode may be
accessed by software operations. Users may use the
Software Product Identification operation to identify the part
(i.e., using the device ID) when using multiple
manufacturers in the same socket. For details, see Table 4
for software operation, Figure 11 for the Software ID Entry
and Read timing diagram, and Figure 18 for the Software
ID Entry command sequence flowchart.
Product Identification Mode Exit/
CFI Mode Exit
In order to return to the standard Read mode, the Software
Product Identification mode must be exited. Exit is accom-
plished by issuing the Software ID Exit command
sequence, which returns the device to the Read mode.
This command may also be used to reset the device to the
Read mode after any inadvertent transient condition that
apparently causes the device to behave abnormally, e.g.,
not read correctly. Please note that the Software ID Exit/
CFI Exit command is ignored during an internal Program or
Erase operation. See Table 4 for software command
codes, Figure 13 for timing waveform, and Figure 18 for a
flowchart.
TABLE 1: PRODUCT IDENTIFICATION TABLE
Address Data
Manufacturer’s ID 0000H 00BFH
Device ID
SST39LF/VF200A 0001H 2789H
SST39LF/VF400A 0001H 2780H
SST39LF/VF800A 0001H 2781H
T1.3 360
Data Sheet
2 Mbit / 4 Mbit / 8 Mbit Multi-Purpose Flash
SST39LF200A / SST39LF400A / SST39LF800A
SST39VF200A / SST39VF400A / SST39VF800A
5
©2002 Silicon Storage Technology, Inc. S71117-04-000 2/02 360
FIGURE 1: PIN ASSIGNMENTS FOR 48-LEAD TSOP
Y-Decoder
I/O Buffers and Data Latches
360 ILL B1.2
Address Buffer & Latches
X-Decoder
DQ15 - DQ0
Memory Address
OE#
CE#
WE#
SuperFlash
Memory
Control Logic
FUNCTIONAL BLOCK DIAGRAM
A15
A14
A13
A12
A11
A10
A9
A8
NC
NC
WE#
NC
NC
NC
NC
NC
NC
A7
A6
A5
A4
A3
A2
A1
1
2
3
4
5
6
7
8
9
10
11
12
13
14
15
16
17
18
19
20
21
22
23
24
A16
NC
VSS
DQ15
DQ7
DQ14
DQ6
DQ13
DQ5
DQ12
DQ4
VDD
DQ11
DQ3
DQ10
DQ2
DQ9
DQ1
DQ8
DQ0
OE#
VSS
CE#
A0
48
47
46
45
44
43
42
41
40
39
38
37
36
35
34
33
32
31
30
29
28
27
26
25
360 ILL F01.2
Standard Pinout
Top View
Die Up
SST39LF200A/400A/800A
SST39VF200A/400A/800A
SST39LF/VF200A
A15
A14
A13
A12
A11
A10
A9
A8
NC
NC
WE#
NC
NC
NC
NC
NC
A17
A7
A6
A5
A4
A3
A2
A1
SST39LF/VF400A
A15
A14
A13
A12
A11
A10
A9
A8
NC
NC
WE#
NC
NC
NC
NC
A18
A17
A7
A6
A5
A4
A3
A2
A1
SST39LF/VF800A SST39LF/VF200A
A16
NC
VSS
DQ15
DQ7
DQ14
DQ6
DQ13
DQ5
DQ12
DQ4
VDD
DQ11
DQ3
DQ10
DQ2
DQ9
DQ1
DQ8
DQ0
OE#
VSS
CE#
A0
SST39LF/VF400A
A16
NC
VSS
DQ15
DQ7
DQ14
DQ6
DQ13
DQ5
DQ12
DQ4
VDD
DQ11
DQ3
DQ10
DQ2
DQ9
DQ1
DQ8
DQ0
OE#
VSS
CE#
A0
SST39LF/VF800A
6
Data Sheet
2 Mbit / 4 Mbit / 8 Mbit Multi-Purpose Flash
SST39LF200A / SST39LF400A / SST39LF800A
SST39VF200A / SST39VF400A / SST39VF800A
©2002 Silicon Storage Technology, Inc. S71117-04-000 2/02 360
FIGURE 2: PIN ASSIGNMENTS FOR 48-BALL TFBGA
A13
A9
WE#
NC
A7
A3
A12
A8
NC
NC
NC
A4
A14
A10
NC
NC
A6
A2
A15
A11
NC
NC
A5
A1
A16
DQ7
DQ5
DQ2
DQ0
A0
NC
DQ14
DQ12
DQ10
DQ8
CE#
DQ15
DQ13
VDD
DQ11
DQ9
OE#
VSS
DQ6
DQ4
DQ3
DQ1
VSS
360 ILL F02_2.0
SST39LF/VF200A
TOP VIEW (balls facing down)
6
5
4
3
2
1
A B C D E F G H
A13
A9
WE#
NC
A7
A3
A12
A8
NC
NC
A17
A4
A14
A10
NC
NC
A6
A2
A15
A11
NC
NC
A5
A1
A16
DQ7
DQ5
DQ2
DQ0
A0
NC
DQ14
DQ12
DQ10
DQ8
CE#
DQ15
DQ13
VDD
DQ11
DQ9
OE#
VSS
DQ6
DQ4
DQ3
DQ1
VSS
360 ILL F02_4.0
SST39LF/VF400A
TOP VIEW (balls facing down)
6
5
4
3
2
1
A B C D E F G H
A13
A9
WE#
NC
A7
A3
A12
A8
NC
NC
A17
A4
A14
A10
NC
A18
A6
A2
A15
A11
NC
NC
A5
A1
A16
DQ7
DQ5
DQ2
DQ0
A0
NC
DQ14
DQ12
DQ10
DQ8
CE#
DQ15
DQ13
VDD
DQ11
DQ9
OE#
VSS
DQ6
DQ4
DQ3
DQ1
VSS
360 ILL F02_8.0
SST39LF/VF800A
TOP VIEW (balls facing down)
6
5
4
3
2
1
A B C D E F G H
Data Sheet
2 Mbit / 4 Mbit / 8 Mbit Multi-Purpose Flash
SST39LF200A / SST39LF400A / SST39LF800A
SST39VF200A / SST39VF400A / SST39VF800A
7
©2002 Silicon Storage Technology, Inc. S71117-04-000 2/02 360
TABLE 2: PIN DESCRIPTION
Symbol Pin Name Functions
AMS1-A0Address Inputs To provide memory addresses. During Sector-Erase AMS-A11 address lines will select the
sector. During Block-Erase AMS-A15 address lines will select the block.
DQ15-DQ0Data Input/output To output data during Read cycles and receive input data during Write cycles.
Data is internally latched during a Write cycle.
The outputs are in tri-state when OE# or CE# is high.
CE# Chip Enable To activate the device when CE# is low.
OE# Output Enable To gate the data output buffers.
WE# Write Enable To control the Write operations.
VDD Power Supply To provide power supply voltage: 3.0-3.6V for SST39LF200A/400A/800A
2.7-3.6V for SST39VF200A/400A/800A
VSS Ground
NC No Connection Unconnected pins.
T2.2 360
1. AMS = Most significant address
AMS = A16 for SST39LF/VF200A, A17 for SST39LF/VF400A, and A18 for SST39LF/VF800A
TABLE 3: OPERATION MODES SELECTION
Mode CE# OE# WE# DQ Address
Read VIL VIL VIH DOUT AIN
Program VIL VIH VIL DIN AIN
Erase VIL VIH VIL X1
1. X can be VIL or VIH, but no other value.
Sector or Block address,
XXH for Chip-Erase
Standby VIH XXHigh Z X
Write Inhibit X VIL XHigh Z/ D
OUT X
XXV
IH High Z/ DOUT X
Product Identification
Software Mode VIL VIL VIH See Table 4
T3.4 360
8
Data Sheet
2 Mbit / 4 Mbit / 8 Mbit Multi-Purpose Flash
SST39LF200A / SST39LF400A / SST39LF800A
SST39VF200A / SST39VF400A / SST39VF800A
©2002 Silicon Storage Technology, Inc. S71117-04-000 2/02 360
TABLE 4: SOFTWARE COMMAND SEQUENCE
Command
Sequence
1st Bus
Write Cycle
2nd Bus
Write Cycle
3rd Bus
Write Cycle
4th Bus
Write Cycle
5th Bus
Write Cycle
6th Bus
Write Cycle
Addr1Data2Addr1Data2Addr1Data2Addr1Data2Addr1Data2Addr1Data2
Word-Program 5555H AAH 2AAAH 55H 5555H A0H WA3Data
Sector-Erase 5555H AAH 2AAAH 55H 5555H 80H 5555H AAH 2AAAH 55H SAX430H
Block-Erase 5555H AAH 2AAAH 55H 5555H 80H 5555H AAH 2AAAH 55H BAX450H
Chip-Erase 5555H AAH 2AAAH 55H 5555H 80H 5555H AAH 2AAAH 55H 5555H 10H
Software ID Entry5,6 5555H AAH 2AAAH 55H 5555H 90H
CFI Query Entry55555H AAH 2AAAH 55H 5555H 98H
Software ID Exit7/
CFI Exit
XXH F0H
Software ID Exit7/
CFI Exit
5555H AAH 2AAAH 55H 5555H F0H
T4.3 360
1. Address format A14-A0 (Hex), Addresses AMS-A15 can be VIL or VIH, but no other value, for the Command sequence.
AMS = Most significant address
AMS = A16 for SST39LF/VF200A, A17 for SST39LF/VF400A, and A18 for SST39LF/VF800A
2. DQ15-DQ8 can be VIL or VIH, but no other value, for the Command sequence
3. WA = Program word address
4. SAX for Sector-Erase; uses AMS-A11 address lines
BAX for Block-Erase; uses AMS-A15 address lines
5. The device does not remain in Software Product ID mode if powered down.
6. With AMS-A1 = 0; SST Manufacturer’s ID = 00BFH, is read with A0 = 0,
SST39LF/VF200A Device ID = 2789H, is read with A0 = 1.
SST39LF/VF400A Device ID = 2780H, is read with A0 = 1.
SST39LF/VF800A Device ID = 2781H, is read with A0 = 1.
7. Both Software ID Exit operations are equivalent
TABLE 5: CFI QUERY IDENTIFICATION STRING1 FOR SST39LF200A/400A/800A AND SST39VF200A/400A/800A
1. Refer to CFI publication 100 for more details.
Address Data Data
10H 0051H Query Unique ASCII string “QRY”
11H 0052H
12H 0059H
13H 0001H Primary OEM command set
14H 0007H
15H 0000H Address for Primary Extended Table
16H 0000H
17H 0000H Alternate OEM command set (00H = none exists)
18H 0000H
19H 0000H Address for Alternate OEM extended Table (00H = none exits)
1AH 0000H
T5.0 360
Data Sheet
2 Mbit / 4 Mbit / 8 Mbit Multi-Purpose Flash
SST39LF200A / SST39LF400A / SST39LF800A
SST39VF200A / SST39VF400A / SST39VF800A
9
©2002 Silicon Storage Technology, Inc. S71117-04-000 2/02 360
TABLE 6: SYSTEM INTERFACE INFORMATION FOR SST39LF200A/400A/800A AND SST39VF200A/400A/800A
Address Data Data
1BH 0027H1VDD Min (Program/Erase)
0030H1DQ7-DQ4: Volts, DQ3-DQ0: 100 millivolts
1CH 0036H VDD Max (Program/Erase)
DQ7-DQ4: Volts, DQ3-DQ0: 100 millivolts
1DH 0000H VPP min (00H = no VPP pin)
1EH 0000H VPP max (00H = no VPP pin)
1FH 0004H Typical time out for Word-Program 2N µs (24 = 16 µs)
20H 0000H Typical time out for min size buffer program 2N µs (00H = not supported)
21H 0004H Typical time out for individual Sector/Block-Erase 2N ms (24 = 16 ms)
22H 0006H Typical time out for Chip-Erase 2N ms (26 = 64 ms)
23H 0001H Maximum time out for Word-Program 2N times typical (21 x 24 = 32 µs)
24H 0000H Maximum time out for buffer program 2N times typical
25H 0001H Maximum time out for individual Sector/Block-Erase 2N times typical (21 x 24 = 32 ms)
26H 0001H Maximum time out for Chip-Erase 2N times typical (21 x 26 = 128 ms)
T6.2 360
1. 0030H for SST39LF200A/400A/800A and 0027H for SST39VF200A/400A/800A
TABLE 7: DEVICE GEOMETRY INFORMATION FOR SST39LF/VF200A
Address Data Data
27H 0012H Device size = 2N Byte (12H = 18; 218 = 256 KByte)
28H 0001H Flash Device Interface description; 0001H = x16-only asynchronous interface
29H 0000H
2AH 0000H Maximum number of byte in multi-byte write = 2N (00H = not supported)
2BH
2CH 0002H Number of Erase Sector/Block sizes supported by device
2DH 003FH Sector Information (y + 1 = Number of sectors; z x 256B = sector size)
2EH 0000H y = 63 + 1 = 64 sectors (003FH = 63)
2FH 0010H
30H 0000H z = 16 x 256 Bytes = 4 KByte/sector (0010H = 16)
31H 0003H Block Information (y + 1 = Number of blocks; z x 256B = block size)
32H 0000H y = 3 + 1 = 4 blocks (0003H = 3)
33H 0000H
34H 0001H z = 256 x 256 Bytes = 64 KByte/block (0100H = 256)
T7.2 360
10
Data Sheet
2 Mbit / 4 Mbit / 8 Mbit Multi-Purpose Flash
SST39LF200A / SST39LF400A / SST39LF800A
SST39VF200A / SST39VF400A / SST39VF800A
©2002 Silicon Storage Technology, Inc. S71117-04-000 2/02 360
TABLE 8: DEVICE GEOMETRY INFORMATION FOR SST39LF/VF400A
Address Data Data
27H 0013H Device size = 2N Byte (13H = 19; 219 = 512 KByte)
28H 0001H Flash Device Interface description; 0001H = x16-only asynchronous interface
29H 0000H
2AH 0000H Maximum number of byte in multi-byte write = 2N (00H = not supported)
2BH 0000H
2CH 0002H Number of Erase Sector/Block sizes supported by device
2DH 007FH Sector Information (y + 1 = Number of sectors; z x 256B = sector size)
2EH 0000H y = 127 + 1 = 128 sectors (007FH = 127)
2FH 0010H
30H 0000H z = 16 x 256 Bytes = 4 KByte/sector (0010H = 16)
31H 0007H Block Information (y + 1 = Number of blocks; z x 256B = block size)
32H 0000H y = 7 + 1 = 8 blocks (0007H = 7)
33H 0000H
34H 0001H z = 256 x 256 Bytes = 64 KByte/block (0100H = 256)
T8.1 360
TABLE 9: DEVICE GEOMETRY INFORMATION FOR SST39LF/VF800A
Address Data Data
27H 0014H Device size = 2N Byte (14H = 20; 220 = 1 MByte)
28H 0001H Flash Device Interface description; 0001H = x16-only asynchronous interface
29H 0000H
2AH 0000H Maximum number of byte in multi-byte write = 2N (00H = not supported)
2BH 0000H
2CH 0002H Number of Erase Sector/Block sizes supported by device
2DH 00FFH Sector Information (y + 1 = Number of sectors; z x 256B = sector size)
2EH 0000H y = 255 + 1 = 256 sectors (00FFH = 255)
2FH 0010H
30H 0000H z = 16 x 256 Bytes = 4 KByte/sector (0010H = 16)
31H 000FH Block Information (y + 1 = Number of blocks; z x 256B = block size)
32H 0000H y = 15 + 1 = 16 blocks (000FH = 15)
33H 0000H
34H 0001H z = 256 x 256 Bytes = 64 KByte/block (0100H = 256)
T9.0 360
Data Sheet
2 Mbit / 4 Mbit / 8 Mbit Multi-Purpose Flash
SST39LF200A / SST39LF400A / SST39LF800A
SST39VF200A / SST39VF400A / SST39VF800A
11
©2002 Silicon Storage Technology, Inc. S71117-04-000 2/02 360
Absolute Maximum Stress Ratings (Applied conditions greater than those listed under “Absolute Maximum
Stress Ratings” may cause permanent damage to the device. This is a stress rating only and functional operation
of the device at these conditions or conditions greater than those defined in the operational sections of this data
sheet is not implied. Exposure to absolute maximum stress rating conditions may affect device reliability.)
Temperature Under Bias . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . -55°C to +125°C
Storage Temperature . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . -65°C to +150°C
D. C. Voltage on Any Pin to Ground Potential . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . -0.5V to VDD+0.5V
Transient Voltage (<20 ns) on Any Pin to Ground Potential . . . . . . . . . . . . . . . . . . . . . . . . . . . . . -2.0V to VDD+2.0V
Voltage on A9 Pin to Ground Potential . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . -0.5V to 13.2V
Package Power Dissipation Capability (Ta = 25°C) . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 1.0W
Surface Mount Lead Soldering Temperature (3 Seconds) . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 240°C
Output Short Circuit Current1 . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 50 mA
1. Outputs shorted for no more than one second. No more than one output shorted at a time.
OPERATING RANGE: SST39LF200A/400A/800A
Range Ambient Temp VDD
Commercial 0°C to +70°C 3.0-3.6V
OPERATING RANGE: SST39VF200A/400A/800A
Range Ambient Temp VDD
Commercial 0°C to +70°C 2.7-3.6V
Industrial -40°C to +85°C 2.7-3.6V
AC CONDITIONS OF TEST
Input Rise/Fall Time . . . . . . . . . . . . . . 5 ns
Output Load . . . . . . . . . . . . . . . . . . . . CL = 30 pF for SST39LF200A/400A/800A
Output Load . . . . . . . . . . . . . . . . . . . . CL = 100 pF for SST39VF200A/400A/800A
See Figures 14 and 15
12
Data Sheet
2 Mbit / 4 Mbit / 8 Mbit Multi-Purpose Flash
SST39LF200A / SST39LF400A / SST39LF800A
SST39VF200A / SST39VF400A / SST39VF800A
©2002 Silicon Storage Technology, Inc. S71117-04-000 2/02 360
TABLE 10: DC OPERATING CHARACTERISTICS
VDD = 3.0-3.6V FOR SST39LF200A/400A/800A AND 2.7-3.6V FOR SST39VF200A/400A/800A
Symbol Parameter
Limits
Test ConditionsMin Max Units
IDD Power Supply Current Address input=VIL/VIH, at f=1/TRC Min,
VDD=VDD Max
Read 30 mA CE#=OE#=VIL,WE#=VIH, all I/Os open
Program and Erase 30 mA CE#=WE#=VIL, OE#=VIH
ISB Standby VDD Current 20 µA CE#=VIHC, VDD=VDD Max
ILI Input Leakage Current 1 µA VIN=GND to VDD, VDD=VDD Max
ILO Output Leakage Current 10 µA VOUT=GND to VDD, VDD=VDD Max
VIL Input Low Voltage 0.8 VDD=VDD Min
VIH Input High Voltage 0.7VDD VV
DD=VDD Max
VIHC Input High Voltage (CMOS) VDD-0.3 V VDD=VDD Max
VOL Output Low Voltage 0.2 V IOL=100 µA, VDD=VDD Min
VOH Output High Voltage VDD-0.2 V IOH=-100 µA, VDD=VDD Min
T10.5 360
TABLE 11: RECOMMENDED SYSTEM POWER-UP TIMINGS
Symbol Parameter Minimum Units
TPU-READ1
1. This parameter is measured only for initial qualification and after a design or process change that could affect this parameter.
Power-up to Read Operation 100 µs
TPU-WRITE1Power-up to Program/Erase Operation 100 µs
T11.0 360
TABLE 12: CAPACITANCE (Ta = 25°C, f=1 Mhz, other pins open)
Parameter Description Test Condition Maximum
CI/O1
1. This parameter is measured only for initial qualification and after a design or process change that could affect this parameter.
I/O Pin Capacitance VI/O = 0V 12 pF
CIN1Input Capacitance VIN = 0V 6 pF
T12.0 360
TABLE 13: RELIABILITY CHARACTERISTICS
Symbol Parameter Minimum Specification Units Test Method
NEND1
1. This parameter is measured only for initial qualification and after a design or process change that could affect this parameter.
Endurance 10,000 Cycles JEDEC Standard A117
TDR1Data Retention 100 Years JEDEC Standard A103
ILTH 1Latch Up 100 + IDD mA JEDEC Standard 78
T13.1 360
Data Sheet
2 Mbit / 4 Mbit / 8 Mbit Multi-Purpose Flash
SST39LF200A / SST39LF400A / SST39LF800A
SST39VF200A / SST39VF400A / SST39VF800A
13
©2002 Silicon Storage Technology, Inc. S71117-04-000 2/02 360
AC CHARACTERISTICS
TABLE 14: READ CYCLE TIMING PARAMETERS VDD = 3.0-3.6V
Symbol Parameter
SST39LF200A/400A-45 SST39LF200A/400A/800A-55
UnitsMin Max Min Max
TRC Read Cycle Time 45 55 ns
TCE Chip Enable Access Time 45 55 ns
TAA Address Access Time 45 55 ns
TOE Output Enable Access Time 30 30 ns
TCLZ1
1. This parameter is measured only for initial qualification and after a design or process change that could affect this parameter.
CE# Low to Active Output 0 0 ns
TOLZ1OE# Low to Active Output 0 0 ns
TCHZ1CE# High to High-Z Output 15 15 ns
TOHZ1OE# High to High-Z Output 15 15 ns
TOH1Output Hold from Address Change 0 0 ns
T14.7 360
TABLE 15: READ CYCLE TIMING PARAMETERS VDD = 2.7-3.6V
Symbol Parameter
SST39VF200A/400A/800A-70 SST39VF200A/400A/800A-90
UnitsMin Max Min Max
TRC Read Cycle Time 70 90 ns
TCE Chip Enable Access Time 70 90 ns
TAA Address Access Time 70 90 ns
TOE Output Enable Access Time 35 45 ns
TCLZ1
1. This parameter is measured only for initial qualification and after a design or process change that could affect this parameter.
CE# Low to Active Output 0 0 ns
TOLZ1OE# Low to Active Output 0 0 ns
TCHZ1CE# High to High-Z Output 20 30 ns
TOHZ1OE# High to High-Z Output 20 30 ns
TOH1Output Hold from Address Change 0 0 ns
T15.6 360
14
Data Sheet
2 Mbit / 4 Mbit / 8 Mbit Multi-Purpose Flash
SST39LF200A / SST39LF400A / SST39LF800A
SST39VF200A / SST39VF400A / SST39VF800A
©2002 Silicon Storage Technology, Inc. S71117-04-000 2/02 360
TABLE 16: PROGRAM/ERASE CYCLE TIMING PARAMETERS
Symbol Parameter Min Max Units
TBP Word-Program Time 20 µs
TAS Address Setup Time 0 ns
TAH Address Hold Time 30 ns
TCS WE# and CE# Setup Time 0 ns
TCH WE# and CE# Hold Time 0 ns
TOES OE# High Setup Time 0 ns
TOEH OE# High Hold Time 10 ns
TCP CE# Pulse Width 40 ns
TWP WE# Pulse Width 40 ns
TWPH1WE# Pulse Width High 30 ns
TCPH1CE# Pulse Width High 30 ns
TDS Data Setup Time 30 ns
TDH1Data Hold Time 0 ns
TIDA1Software ID Access and Exit Time 150 ns
TSE Sector-Erase 25 ms
TBE Block-Erase 25 ms
TSCE Chip-Erase 100 ms
T16.0 360
1. This parameter is measured only for initial qualification and after a design or process change that could affect this parameter.
Data Sheet
2 Mbit / 4 Mbit / 8 Mbit Multi-Purpose Flash
SST39LF200A / SST39LF400A / SST39LF800A
SST39VF200A / SST39VF400A / SST39VF800A
15
©2002 Silicon Storage Technology, Inc. S71117-04-000 2/02 360
FIGURE 3: READ CYCLE TIMING DIAGRAM
FIGURE 4: WE# CONTROLLED PROGRAM CYCLE TIMING DIAGRAM
360 ILL F03.2
ADDRESS AMS-0
DQ15-0
WE#
OE#
CE# TCE
TRC TAA
TOE
TOLZVIH
HIGH-Z TCLZ TOH
TCHZ
HIGH-Z
DATA VALIDDATA VALID
TOHZ
Note: AMS = Most significant address
AMS = A16 for SST39LF/VF200A, A17 for SST39LF/VF400A and A18 for SST39LF/VF800A
360 ILL F04.4
ADDRESS AMS-0
DQ15-0
TDH
TWPH
TDS
TWP
TAH
TAS
TCH
TCS
CE#
SW0 SW1 SW2
5555 2AAA 5555 ADDR
XXAA XX55 XXA0 DATA
INTERNAL PROGRAM OPERATION STARTS
WORD
(ADDR/DATA)
OE#
WE#
TBP
Note: AMS = Most significant address
AMS = A16 for SST39LF/VF200A, A17 for SST39LF/VF400A and A18 for SST39LF/VF800A
X can be VIL or VIH, but no other value.
16
Data Sheet
2 Mbit / 4 Mbit / 8 Mbit Multi-Purpose Flash
SST39LF200A / SST39LF400A / SST39LF800A
SST39VF200A / SST39VF400A / SST39VF800A
©2002 Silicon Storage Technology, Inc. S71117-04-000 2/02 360
FIGURE 5: CE# CONTROLLED PROGRAM CYCLE TIMING DIAGRAM
FIGURE 6: DATA# POLLING TIMING DIAGRAM
360 ILL F05.4
ADDRESS AMS-0
DQ15-0
TDH
TCPH
TDS
TCP
TAH
TAS
TCH
TCS
WE#
SW0 SW1 SW2
5555 2AAA 5555 ADDR
XXAA XX55 XXA0 DATA
INTERNAL PROGRAM OPERATION STARTS
WORD
(ADDR/DATA)
OE#
CE#
TBP
Note: AMS = Most significant address
AMS = A16 for SST39LF/VF200A, A17 for SST39LF/VF400A and A18 for SST39LF/VF800A
X can be VIL or VIH, but no other value.
360 ILL F06.3
ADDRESS AMS-0
DQ7DATA DATA # DATA # DATA
WE#
OE#
CE#
TOEH
TOE
TCE
TOES
Note: AMS = Most significant address
AMS = A16 for SST39LF/VF200A, A17 for SST39LF/VF400A and A18 for SST39LF/VF800A
Data Sheet
2 Mbit / 4 Mbit / 8 Mbit Multi-Purpose Flash
SST39LF200A / SST39LF400A / SST39LF800A
SST39VF200A / SST39VF400A / SST39VF800A
17
©2002 Silicon Storage Technology, Inc. S71117-04-000 2/02 360
FIGURE 7: TOGGLE BIT TIMING DIAGRAM
FIGURE 8: WE# CONTROLLED CHIP-ERASE TIMING DIAGRAM
360 ILL F07.3
ADDRESS AMS-0
DQ6
WE#
OE#
CE#
TOETOEH
TCE
TOES
TWO READ CYCLES
WITH SAME OUTPUTS
Note: AMS = Most significant address
AMS = A16 for SST39LF/VF200A, A17 for SST39LF/VF400A and A18 for SST39LF/VF800A
360 ILL F08.7
ADDRESS AMS-0
DQ15-0
WE#
SW0 SW1 SW2 SW3 SW4 SW5
5555 2AAA 2AAA5555 5555
XX55 XX10XX55XXAA XX80 XXAA
5555
OE#
CE#
SIX-BYTE CODE FOR CHIP-ERASE
TSCE
TWP
Note: This device also supports CE# controlled Chip-Erase operation. The WE# and CE# signals are
interchageable as long as minimum timings are met. (See Table 16)
AMS = Most significant address
AMS = A16 for SST39LF/VF200A, A17 for SST39LF/VF400A and A18 for SST39LF/VF800A
X can be VIL or VIH, but no other value.
18
Data Sheet
2 Mbit / 4 Mbit / 8 Mbit Multi-Purpose Flash
SST39LF200A / SST39LF400A / SST39LF800A
SST39VF200A / SST39VF400A / SST39VF800A
©2002 Silicon Storage Technology, Inc. S71117-04-000 2/02 360
FIGURE 9: WE# CONTROLLED BLOCK-ERASE TIMING DIAGRAM
FIGURE 10: WE# CONTROLLED SECTOR-ERASE TIMING DIAGRAM
360 ILL F17.9
ADDRESS AMS-0
DQ15-0
WE#
SW0 SW1 SW2 SW3 SW4 SW5
5555 2AAA 2AAA5555 5555
XX55 XX50XX55XXAA XX80 XXAA
BAX
OE#
CE#
SIX-BYTE CODE FOR BLOCK-ERASE
TBE
TWP
Note: This device also supports CE# controlled Block-Erase operation. The WE# and CE# signals are
interchageable as long as minimum timings are met. (See Table 16)
BAX = Block Address
AMS = Most significant address
AMS = A16 for SST39LF/VF200A, A17 for SST39LF/VF400A and A18 for SST39LF/VF800A
X can be VIL or VIH, but no other value.
360 ILL F18.8
ADDRESS AMS-0
DQ15-0
WE#
SW0 SW1 SW2 SW3 SW4 SW5
5555 2AAA 2AAA5555 5555
XX55 XX30XX55XXAA XX80 XXAA
SAX
OE#
CE#
SIX-BYTE CODE FOR SECTOR-ERASE
TSE
TWP
Note: This device also supports CE# controlled Sector-Erase operation. The WE# and CE# signals are
interchageable as long as minimum timings are met. (See Table 16)
SAX = Sector Address
AMS = Most significant address
AMS = A16 for SST39LF/VF200A, A17 for SST39LF/VF400A and A18 for SST39LF/VF800A
X can be VIL or VIH, but no other value.
Data Sheet
2 Mbit / 4 Mbit / 8 Mbit Multi-Purpose Flash
SST39LF200A / SST39LF400A / SST39LF800A
SST39VF200A / SST39VF400A / SST39VF800A
19
©2002 Silicon Storage Technology, Inc. S71117-04-000 2/02 360
FIGURE 11: SOFTWARE ID ENTRY AND READ
FIGURE 12: CFI QUERY ENTRY AND READ
360 ILL F09.4
ADDRESS A14-0
TIDA
DQ15-0
WE#
SW0 SW1 SW2
5555 2AAA 5555 0000 0001
OE#
CE#
THREE-BYTE SEQUENCE FOR
SOFTWARE ID ENTRY
TWP
TWPH TAA
00BF
Device ID
XX55XXAA XX90
Device ID = 2789H for SST39LF/VF200A, 2780H for SST39LF/VF400A and 2781H for SST39LF/VF800A
Note: X can be VIL or VIH, but no other value.
360 ILL F20.1
ADDRESS A14-0
TIDA
DQ15-0
WE#
SW0 SW1 SW2
5555 2AAA 5555
OE#
CE#
THREE-BYTE SEQUENCE FOR
CFI QUERY ENTRY
TWP
TWPH TAA
XX55XXAA XX98
Note: X can be VIL or VIH, but no other value.
20
Data Sheet
2 Mbit / 4 Mbit / 8 Mbit Multi-Purpose Flash
SST39LF200A / SST39LF400A / SST39LF800A
SST39VF200A / SST39VF400A / SST39VF800A
©2002 Silicon Storage Technology, Inc. S71117-04-000 2/02 360
FIGURE 13: SOFTWARE ID EXIT/CFI EXIT
360 ILL F10.1
ADDRESS A14-0
DQ15-0
TIDA
TWP
T WHP
WE#
SW0 SW1 SW2
5555 2AAA 5555
THREE-BYTE SEQUENCE FOR
SOFTWARE ID EXIT AND RESET
OE#
CE#
XXAA XX55 XXF0
Note: X can be VIL or VIH, but no other value.
Data Sheet
2 Mbit / 4 Mbit / 8 Mbit Multi-Purpose Flash
SST39LF200A / SST39LF400A / SST39LF800A
SST39VF200A / SST39VF400A / SST39VF800A
21
©2002 Silicon Storage Technology, Inc. S71117-04-000 2/02 360
FIGURE 14: AC INPUT/OUTPUT REFERENCE WAVEFORMS
FIGURE 15: A TEST LOAD EXAMPLE
504 ILL F06.1
REFERENCE POINTS OUTPUTINPUT VIT
VIHT
VILT
VOT
AC test inputs are driven at VIHT (0.9 VDD) for a logic “1” and VILT (0.1 VDD) for a logic “0”. Measurement reference points
for inputs and outputs are VIT (0.5 VDD) and VOT (0.5 VDD). Input rise and fall times (10% ↔ 90%) are <5 ns.
Note: VIT - VINPUT Test
VOT - VOUTPUT Tes t
VIHT - VINPUT HIGH Test
VILT - VINPUT LOW Test
360 ILL F12.1
TO TESTER
TO DUT
CL
22
Data Sheet
2 Mbit / 4 Mbit / 8 Mbit Multi-Purpose Flash
SST39LF200A / SST39LF400A / SST39LF800A
SST39VF200A / SST39VF400A / SST39VF800A
©2002 Silicon Storage Technology, Inc. S71117-04-000 2/02 360
FIGURE 16: WORD-PROGRAM ALGORITHM
360 ILL F13.4
Start
Load data: XXAAH
Address: 5555H
Load data: XX55H
Address: 2AAAH
Load data: XXA0H
Address: 5555H
Load Word
Address/Word
Data
Wait for end of
Program (TBP,
Data# Polling
bit, or Toggle bit
operation)
Program
Completed
Note: X can be VIL or VIH, but no other value.
Data Sheet
2 Mbit / 4 Mbit / 8 Mbit Multi-Purpose Flash
SST39LF200A / SST39LF400A / SST39LF800A
SST39VF200A / SST39VF400A / SST39VF800A
23
©2002 Silicon Storage Technology, Inc. S71117-04-000 2/02 360
FIGURE 17: WAIT OPTIONS
360 ILL F14.0
Wait TBP,
TSCE, TSE
or TBE
Program/Erase
Initiated
Internal Timer Toggle Bit
Ye s
Ye s
No
No
Program/Erase
Completed
Does DQ6
match?
Read same
word
Data# Polling
Program/Erase
Completed
Program/Erase
Completed
Read word
Is DQ7 =
true data?
Read DQ7
Program/Erase
Initiated
Program/Erase
Initiated
24
Data Sheet
2 Mbit / 4 Mbit / 8 Mbit Multi-Purpose Flash
SST39LF200A / SST39LF400A / SST39LF800A
SST39VF200A / SST39VF400A / SST39VF800A
©2002 Silicon Storage Technology, Inc. S71117-04-000 2/02 360
FIGURE 18: SOFTWARE ID/CFI COMMAND FLOWCHARTS
360 ILL F15.4
Load data: XXAAH
Address: 5555H
Software ID Entry
Command Sequence
Load data: XX55H
Address: 2AAAH
Load data: XX90H
Address: 5555H
Wait TIDA
Read Software ID
Load data: XXAAH
Address: 5555H
CFI Query Entry
Command Sequence
Load data: XX55H
Address: 2AAAH
Load data: XX98H
Address: 5555H
Wait TIDA
Read CFI data
Load data: XXAAH
Address: 5555H
Software ID Exit/CFI Exit
Command Sequence
Load data: XX55H
Address: 2AAAH
Load data: XXF0H
Address: 5555H
Load data: XXF0H
Address: XXH
Return to normal
operation
Wait TIDA
Wait TIDA
Return to normal
operation
Note: X can be VIL or VIH, but no other value.
Data Sheet
2 Mbit / 4 Mbit / 8 Mbit Multi-Purpose Flash
SST39LF200A / SST39LF400A / SST39LF800A
SST39VF200A / SST39VF400A / SST39VF800A
25
©2002 Silicon Storage Technology, Inc. S71117-04-000 2/02 360
FIGURE 19: ERASE COMMAND SEQUENCE
360 ILL F16.5
Load data: XXAAH
Address: 5555H
Chip-Erase
Command Sequence
Load data: XX55H
Address: 2AAAH
Load data: XX80H
Address: 5555H
Load data: XX55H
Address: 2AAAH
Load data: XX10H
Address: 5555H
Load data: XXAAH
Address: 5555H
Wait TSCE
Chip erased
to FFFFH
Load data: XXAAH
Address: 5555H
Sector-Erase
Command Sequence
Load data: XX55H
Address: 2AAAH
Load data: XX80H
Address: 5555H
Load data: XX55H
Address: 2AAAH
Load data: XX30H
Address: SAX
Load data: XXAAH
Address: 5555H
Wait TSE
Sector erased
to FFFFH
Load data: XXAAH
Address: 5555H
Block-Erase
Command Sequence
Load data: XX55H
Address: 2AAAH
Load data: XX80H
Address: 5555H
Load data: XX55H
Address: 2AAAH
Load data: XX50H
Address: BAX
Load data: XXAAH
Address: 5555H
Wait TBE
Block erased
to FFFFH
Note: X can be VIL or VIH, but no other value.
26
Data Sheet
2 Mbit / 4 Mbit / 8 Mbit Multi-Purpose Flash
SST39LF200A / SST39LF400A / SST39LF800A
SST39VF200A / SST39VF400A / SST39VF800A
©2002 Silicon Storage Technology, Inc. S71117-04-000 2/02 360
PRODUCT ORDERING INFORMATION
Device Speed Suffix1 Suffix2
SST39xFxxxA -XX -XX-XX
Package Modifier
K = 48 leads or balls
Package Type
B3 = TFBGA (0.8mm pitch, 6mm x 8mm)
E = TSOP (type 1, die up, 12mm x 20mm)
Temperature Range
C = Commercial = 0°C to +70°C
I = Industrial = -40°C to +85°C
Minimum Endurance
4 = 10,000 cycles
Read Access Speed
45 = 45 ns
55 = 55 ns
70 = 70 ns
90 = 90 ns
Version
A = Special Feature Version
Device Density
800 = 8 Mbit
400 = 4 Mbit
200 = 2 Mbit
Voltage
L = 3.0-3.6V
V = 2.7-3.6V
Data Sheet
2 Mbit / 4 Mbit / 8 Mbit Multi-Purpose Flash
SST39LF200A / SST39LF400A / SST39LF800A
SST39VF200A / SST39VF400A / SST39VF800A
27
©2002 Silicon Storage Technology, Inc. S71117-04-000 2/02 360
Valid combinations for SST39LF200A
SST39LF200A-45-4C-EK SST39LF200A-45-4C-B3K
SST39LF200A-55-4C-EK SST39LF200A-55-4C-B3K
Valid combinations for SST39VF200A
SST39VF200A-70-4C-EK SST39VF200A-70-4C-B3K
SST39VF200A-90-4C-EK SST39VF200A-90-4C-B3K
SST39VF200A-70-4I-EK SST39VF200A-70-4I-B3K
SST39VF200A-90-4I-EK SST39VF200A-90-4I-B3K
Valid combinations for SST39LF400A
SST39LF400A-45-4C-EK SST39LF400A-45-4C-B3K
SST39LF400A-55-4C-EK SST39LF400A-55-4C-B3K
Valid combinations for SST39VF400A
SST39VF400A-70-4C-EK SST39VF400A-70-4C-B3K
SST39VF400A-90-4C-EK SST39VF400A-90-4C-B3K
SST39VF400A-70-4I-EK SST39VF400A-70-4I-B3K
SST39VF400A-90-4I-EK SST39VF400A-90-4I-B3K
Valid combinations for SST39LF800A
SST39LF800A-55-4C-EK SST39LF800A-55-4C-B3K
Valid combinations for SST39VF800A
SST39VF800A-70-4C-EK SST39VF800A-70-4C-B3K
SST39VF800A-90-4C-EK SST39VF800A-90-4C-B3K
SST39VF800A-70-4I-EK SST39VF800A-70-4I-B3K
SST39VF800A-90-4I-EK SST39VF800A-90-4I-B3K
Note: Valid combinations are those products in mass production or will be in mass production. Consult your SST sales
representative to confirm availability of valid combinations and to determine availability of new combinations.
28
Data Sheet
2 Mbit / 4 Mbit / 8 Mbit Multi-Purpose Flash
SST39LF200A / SST39LF400A / SST39LF800A
SST39VF200A / SST39VF400A / SST39VF800A
©2002 Silicon Storage Technology, Inc. S71117-04-000 2/02 360
PACKAGING DIAGRAMS
48-LEAD THIN SMALL OUTLINE PACKAGE (TSOP) 12MM X 20MM
SST PACKAGE CODE: EK
1.05
0.95
0.70
0.50
18.50
18.30
20.20
19.80
0.70
0.50
12.20
11.80
0.27
0.17
0.15
0.05
48-tsop-EK-8
Note: 1. Complies with JEDEC publication 95 MO-142 DD dimensions,
although some dimensions may be more stringent.
2. All linear dimensions are in millimeters (max/min).
3. Coplanarity: 0.1 mm
4. Maximum allowable mold flash is 0.15 mm at the package ends, and 0.25 mm between leads.
1.20
max.
1mm
0˚- 5˚
DETAIL
Pin # 1 Identifier
0.50
BSC
Data Sheet
2 Mbit / 4 Mbit / 8 Mbit Multi-Purpose Flash
SST39LF200A / SST39LF400A / SST39LF800A
SST39VF200A / SST39VF400A / SST39VF800A
29
©2002 Silicon Storage Technology, Inc. S71117-04-000 2/02 360
48-BALL THIN-PROFILE, FINE-PITCH BALL GRID ARRAY (TFBGA) 6MM X 8MM
SST PACKAGE CODE: B3K
A1 CORNER
H G F E D C B A
A B C D E F G H
BOTTOM VIEW
TOP VIEW
SIDE VIEW
6
5
4
3
2
1
6
5
4
3
2
1
SEATING PLANE
0.35 ± 0.05
1.10 ± 0.10
0.12
6.00 ± 0.20
0.45 ± 0.05
(48X)
A1 CORNER
8.00 ± 0.20
0.80
4.00
0.80
5.60
48-tfbga-B3K-6x8-450mic-2
Note: 1. Complies with JEDEC Publication 95, MO-210, variant 'AB-1',
although some dimensions may be more stringent.
2. All linear dimensions are in millimeters.
3. Coplanarity: 0.12 mm
4. The actual shape of the corners may be slightly different than as portrayed in the drawing.
1mm
30
Data Sheet
2 Mbit / 4 Mbit / 8 Mbit Multi-Purpose Flash
SST39LF200A / SST39LF400A / SST39LF800A
SST39VF200A / SST39VF400A / SST39VF800A
©2002 Silicon Storage Technology, Inc. S71117-04-000 2/02 360
Silicon Storage Technology, Inc. • 1171 Sonora Court • Sunnyvale, CA 94086 • Telephone 408-735-9110 • Fax 408-735-9036
www.SuperFlash.com or www.sst.com
